鉺離子注入氮化鎵的光學(xué)活性與缺陷摻雜變化
發(fā)布時(shí)間:2018-05-11 13:18
本文選題:材料改性 + 氮化鎵; 參考:《北京師范大學(xué)學(xué)報(bào)(自然科學(xué)版)》2017年05期
【摘要】:對(duì)100keV、1×1015cm-2的Er離子注入的GaN退火樣品的各項(xiàng)性質(zhì)進(jìn)行研究,采取光致發(fā)光(室溫)、拉曼光譜和盧瑟福背散射對(duì)不同的退火樣品的微觀(guān)結(jié)構(gòu)和光學(xué)性質(zhì)進(jìn)行研究.在退火樣品中,均觀(guān)測(cè)到了在1 539nm附近的PL峰.隨著退火溫度的升高,PL峰強(qiáng)在900℃時(shí)達(dá)到最大值.RBS結(jié)果顯示隨著溫度的升高,Er離子不斷擴(kuò)散,且有部分在表面析出,導(dǎo)致在光學(xué)活性位置上的Er離子減少,使PL強(qiáng)度在更高溫度下減弱.
[Abstract]:The properties of GaN annealed samples implanted with er ions of 100 Kev 1 脳 1015cm-2 were studied. The microstructure and optical properties of different annealed samples were studied by photoluminescence (room temperature, Raman and Rutherford backscattering). The PL peaks near 1 539nm were observed in the annealed samples. With the increase of annealing temperature, the peak intensity of PL reached the maximum value at 900 鈩,
本文編號(hào):1874114
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