基于J750的DisplayPort接收芯片的測試系統(tǒng)設(shè)計(jì)及實(shí)現(xiàn)
發(fā)布時間:2018-05-11 07:58
本文選題:集成電路芯片 + 測試; 參考:《中國科學(xué)院大學(xué)(工程管理與信息技術(shù)學(xué)院)》2015年碩士論文
【摘要】:DisplayPort是一種高速差分?jǐn)?shù)據(jù)信號傳輸標(biāo)準(zhǔn),主要用于高清視頻信號的傳輸,由視頻電子標(biāo)準(zhǔn)協(xié)會制訂于2006年5月。在短短幾年的時間里,DisplayPort發(fā)展非常迅速,贏得了眾多業(yè)界巨頭的支持,尤其是DisplayPort接收芯片的出貨量與日劇增,其量產(chǎn)測試方案也逐漸成為一個主要的研究課題。本文正是針對這一課題,提出一種將板級系統(tǒng)跟測試機(jī)相結(jié)合的思想,選用量產(chǎn)測試中通用的低成本J750測試機(jī)臺,通過對其承載板的重新設(shè)計(jì),使之成為一種特殊的板級功能測試系統(tǒng),從而既能滿足高覆蓋率的要求,又能符合低成本的考量。本論文完成的主要工作包括以下幾個方面:(1)充分考慮了量產(chǎn)測試的一般要求跟DisplayPort接收信號測試的特殊需求,并從經(jīng)濟(jì)角度出發(fā)提出一種將SLT跟ATE測試結(jié)合在一起的測試方法,規(guī)劃出了基于J750測試機(jī)的測試系統(tǒng)整體設(shè)計(jì)思路。(2)設(shè)計(jì)并實(shí)現(xiàn)了搭載SLT測試系統(tǒng)的承載板,既符合J750測試機(jī)的尺寸要求,也滿足DisplayPort信號的布局布線要求,并搭配了合適的元器件從而可以很好的兼容SLT跟ATE兩種測試方式。(3)基于IG-XL軟件開發(fā)出了本系統(tǒng)適用的測試向量跟測試程序,可以控制ATE實(shí)現(xiàn)兼容SLT的測試方法。(4)設(shè)計(jì)并實(shí)施了針對本系統(tǒng)的驗(yàn)證試驗(yàn),試驗(yàn)結(jié)果顯示測試數(shù)據(jù)跟測試時間都滿足預(yù)期的要求,證明本系統(tǒng)可以充分實(shí)現(xiàn)量產(chǎn)測試中高覆蓋率跟低成本的要求。本系統(tǒng)是業(yè)界第一次將DisplayPort接收功能的測試應(yīng)用在低成本的J750測試機(jī)臺上,并可以在量產(chǎn)測試行業(yè)中推廣。對于各種具有DisplayPort接收功能芯片,本系統(tǒng)都可以為其提供一種更可靠、更有效、更經(jīng)濟(jì)的測試解決方案,具有更高的生產(chǎn)價(jià)值跟實(shí)用性。
[Abstract]:DisplayPort is a high-speed differential data signal transmission standard, mainly used for high-definition video signal transmission, developed by the Video Electronic Standards Association in May, 2006. In a few short years, DisplayPort has developed very quickly, and won the support of many industry giants, especially the quantity and daily increase of DisplayPort receiving chip, and its mass production test scheme has gradually become a major research topic. In order to solve this problem, this paper presents an idea of combining board level system with test machine, and selects a low cost J750 test machine, which is used in mass production testing, and redesigns its bearing board. It becomes a special board level function test system, which can not only meet the requirements of high coverage but also meet the requirements of low cost. The main work of this thesis includes the following aspects: 1) considering the general requirements of mass production testing and the special requirements of DisplayPort receiving signal testing, and from the economic point of view, a test method combining SLT and ATE testing is proposed. The overall design idea of the test system based on J750 test machine is designed and the load board carrying SLT test system is designed and implemented. It not only meets the size requirement of J750 tester, but also meets the layout and wiring requirements of DisplayPort signal. And with the appropriate components so that it can be very good compatibility between SLT and ATE test methods. 3) based on the IG-XL software developed the system applicable test vector and test program, The test method that can control ATE to realize compatible SLT is designed and implemented. The test results show that both the test data and the test time meet the expected requirements. It is proved that this system can fully meet the requirements of high coverage and low cost in mass production testing. This system is the first time that the DisplayPort receiving function test is applied to the J750 test machine platform with low cost, and can be popularized in the mass production testing industry. This system can provide a more reliable, more effective and more economical test solution for various chips with DisplayPort receiving function, and has higher production value and practicability.
【學(xué)位授予單位】:中國科學(xué)院大學(xué)(工程管理與信息技術(shù)學(xué)院)
【學(xué)位級別】:碩士
【學(xué)位授予年份】:2015
【分類號】:TN407
【參考文獻(xiàn)】
相關(guān)碩士學(xué)位論文 前1條
1 甘甜;基于Teradyne J750測試平臺的射頻芯片低成本測試方案開發(fā)及實(shí)現(xiàn)[D];復(fù)旦大學(xué);2010年
,本文編號:1873101
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