天堂国产午夜亚洲专区-少妇人妻综合久久蜜臀-国产成人户外露出视频在线-国产91传媒一区二区三区

當(dāng)前位置:主頁(yè) > 科技論文 > 電子信息論文 >

塵土中可溶性鹽對(duì)電路板絕緣失效的影響

發(fā)布時(shí)間:2018-04-28 23:40

  本文選題:絕緣失效 + 塵土污染 ; 參考:《電工技術(shù)學(xué)報(bào)》2016年11期


【摘要】:隨著電子設(shè)備的小型化,印制電路板的導(dǎo)線間距變小,使得導(dǎo)線間電化學(xué)遷移失效問(wèn)題更加突出。同時(shí),大氣污染嚴(yán)重,塵土顆粒沉積吸附在電路板上,其中的可溶性鹽會(huì)改變電路板表面吸附水膜的離子濃度,從而改變線間絕緣失效機(jī)理和失效時(shí)間。使用浸銀Y形電路板,采用不同濃度氯化鈉溶液和塵土溶液水滴實(shí)驗(yàn)的方法來(lái)研究電路板表面存在可溶性鹽溶液的情況下導(dǎo)線間絕緣失效特征與失效時(shí)間的變化規(guī)律。發(fā)現(xiàn)隨著溶液離子濃度的升高,電路板絕緣失效機(jī)理由電化學(xué)遷移轉(zhuǎn)變?yōu)殡x子性導(dǎo)電,失效時(shí)間呈現(xiàn)先減小后增大再陡降的趨勢(shì)。存在促進(jìn)陽(yáng)極金屬快速形成電化學(xué)遷移的可溶性鹽溶液濃度Ca、由電路板陽(yáng)極金屬離子遷移形成晶枝導(dǎo)電向離子導(dǎo)電為主導(dǎo)轉(zhuǎn)換的鹽溶液濃度Cb及直至完全抑制電化學(xué)遷移的鹽濃度Cc。
[Abstract]:With the miniaturization of electronic equipment, the wire spacing of printed circuit board becomes smaller, which makes the problem of electrochemical migration failure more prominent. At the same time, the air pollution is serious, the dust particles are deposited on the circuit board, the soluble salt will change the ion concentration of the adsorbed water film on the surface of the circuit board, thus changing the failure mechanism and the failure time of the insulation between the lines. In this paper, the characteristics of insulation failure and the variation of failure time between conductors in the presence of soluble salt solution on the surface of the circuit board were studied by using the water drop test method of different concentrations of sodium chloride solution and dust solution in the Y-shaped circuit board. It is found that with the increase of ion concentration in the solution, the electrochemical migration of the insulation failure mechanism of the circuit board changes into ionic conductivity, and the failure time decreases first and then increases sharply. The concentration of soluble salt solution can promote the rapid electrochemical migration of anodic metal, and the concentration of salt solution cb can be transformed from dendritic conduction to ionic conduction from anodic metal ion migration of circuit board to complete inhibition of electricity. The concentration of chemically migrated salt, Cc.
【作者單位】: 北京郵電大學(xué)自動(dòng)化學(xué)院;
【分類號(hào)】:TN41

【相似文獻(xiàn)】

相關(guān)期刊論文 前2條

1 華麗;戴月;;先進(jìn)制造封裝中Sb摻雜64Sn-35Bi-1Ag釬焊腐蝕和電化學(xué)遷移[J];湖北第二師范學(xué)院學(xué)報(bào);2013年08期

2 ;[J];;年期

相關(guān)會(huì)議論文 前1條

1 吳其反;方迎堯;盧建忠;李新弟;;不容忽視的另一種“地球化學(xué)遷移”——人類活動(dòng)造成有害元素的快速擴(kuò)散[A];中國(guó)礦物巖石地球化學(xué)學(xué)會(huì)第十屆學(xué)術(shù)年會(huì)論文集[C];2005年

相關(guān)碩士學(xué)位論文 前4條

1 霍雨佳;鍍層工藝和塵土介電特性對(duì)電化學(xué)遷移的影響[D];北京郵電大學(xué);2015年

2 姚博峗;塵土污染對(duì)電化學(xué)遷移溫度特性的影響[D];北京郵電大學(xué);2015年

3 盧名遠(yuǎn);高中生化學(xué)遷移能力培養(yǎng)的實(shí)驗(yàn)研究[D];湖南師范大學(xué);2004年

4 苑成銘;塵土對(duì)高密度電路的影響研究[D];北京郵電大學(xué);2014年

,

本文編號(hào):1817452

資料下載
論文發(fā)表

本文鏈接:http://sikaile.net/kejilunwen/dianzigongchenglunwen/1817452.html


Copyright(c)文論論文網(wǎng)All Rights Reserved | 網(wǎng)站地圖 |

版權(quán)申明:資料由用戶3f0e3***提供,本站僅收錄摘要或目錄,作者需要?jiǎng)h除請(qǐng)E-mail郵箱bigeng88@qq.com