發(fā)布時(shí)間：2018-03-02 03:27

  本文關(guān)鍵詞： 模數(shù)轉(zhuǎn)換器 頻域特性 非相干采樣 頻譜泄漏 平均頻譜法 三譜線插值快速傅立葉變換算法　出處：《江南大學(xué)》2015年碩士論文　論文類型：學(xué)位論文

【摘要】：隨著電子信息技術(shù)的迅猛發(fā)展,作為數(shù)字和模擬接口電路的模數(shù)轉(zhuǎn)換器(ADC)在數(shù)據(jù)采集、精密工業(yè)測(cè)量和音視頻應(yīng)用等不同領(lǐng)域獲得了廣泛應(yīng)用,對(duì)ADC頻域特性的研究也獲得了越來越多的關(guān)注�？焖俑道锶~變換(FFT)法是頻域測(cè)試中應(yīng)用最普遍的一種方法,但利用FFT法測(cè)試ADC的頻域參數(shù)時(shí),很難做到相干采樣和整周期截?cái)?即非相干采樣存在必然性,由此造成的頻譜泄漏和柵欄效應(yīng)將影響頻域參數(shù)測(cè)量的結(jié)果。本論文主要研究利用FFT法測(cè)試高速高精度ADC的重要頻域特性參數(shù),包括信噪比(SNR)、信噪失真比(SINAD)、有效位數(shù)(ENOB)、無雜散動(dòng)態(tài)范圍(SFDR)和總諧波失真(THD)等,并提出了采用平均頻譜法和三譜線插值FFT法來抑制頻譜泄漏和柵欄效應(yīng)。論文的主要研究工作如下。首先介紹了ADC的基本結(jié)構(gòu)和工作原理,強(qiáng)調(diào)流水線型是目前高速高精度ADC中應(yīng)用最廣泛的結(jié)構(gòu);給出了高速高精度ADC重要頻域特性參數(shù)的定義及計(jì)算方法;詳細(xì)描述了高速高精度ADC頻域參數(shù)的測(cè)試方法,包括傳統(tǒng)的數(shù)模轉(zhuǎn)換器(DAC)測(cè)試法、碼密度直方圖法、正弦波擬合法及FFT法,并比較和歸納了它們的優(yōu)缺點(diǎn)及適用范圍。其次,利用Simulink對(duì)12 bits 200 MSPS和14 bits 160 MSPS兩種高速高精度流水線ADC架構(gòu)進(jìn)行了系統(tǒng)建模;采用美國模擬器件公司(ADI)三款典型高速ADC產(chǎn)品AD9230、AD9246和AD9461的行為級(jí)動(dòng)態(tài)模型構(gòu)建了驗(yàn)證平臺(tái);并基于現(xiàn)場(chǎng)可編程門陣列(FPGA)、高性能信號(hào)源、濾波器等設(shè)計(jì)搭建了一套硬件測(cè)試系統(tǒng),為提出的頻域特性測(cè)試方法提供了仿真及實(shí)驗(yàn)平臺(tái)。再次,對(duì)平均頻譜法開展了較深入的研究。為了提高頻譜的分析精度,降低信號(hào)中隨機(jī)信號(hào)的影響,對(duì)ADC輸出端的數(shù)字信號(hào)采樣兩次或兩次以上,對(duì)這些數(shù)據(jù)分別進(jìn)行加窗FFT運(yùn)算,將得到的頻譜圖疊加求得平均頻譜,然后基于平均頻譜計(jì)算出頻域參數(shù)。仿真及實(shí)測(cè)結(jié)果均表明,即使在非相干程度最大的情況下,與加窗FFT法相比,平均頻譜法得到的頻域參數(shù)誤差明顯減小,接近相干采樣的結(jié)果,達(dá)到了ADI的測(cè)試標(biāo)準(zhǔn)。最后,為了降低頻譜泄漏,構(gòu)建了最大旁瓣衰減窗對(duì)信號(hào)進(jìn)行處理;為了減小柵欄效應(yīng)引起的誤差,提出了三譜線插值FFT算法對(duì)加窗的結(jié)果進(jìn)行修正。利用函數(shù)擬合得到了基于常用組合余弦窗及最大旁瓣衰減窗三譜線插值的幅值修正公式,并與平均頻譜法的測(cè)試結(jié)果進(jìn)行了對(duì)比。仿真及實(shí)測(cè)結(jié)果均表明,平均頻譜法能準(zhǔn)確測(cè)試SNR、ENOB等參數(shù),而三譜線插值FFT法非常適合測(cè)試高速高精度ADC的SFDR參數(shù)。為了驗(yàn)證本論文所提方法的有效性和準(zhǔn)確性,采用由兩個(gè)仿真驗(yàn)證平臺(tái)和一個(gè)實(shí)際測(cè)試系統(tǒng)所得的數(shù)據(jù)對(duì)算法進(jìn)行了驗(yàn)證。結(jié)果表明,本論文所提方法通用性強(qiáng),能有效測(cè)試高速高精度ADC的頻域參數(shù);將其應(yīng)用到實(shí)際測(cè)試系統(tǒng)中時(shí),不僅能降低系統(tǒng)構(gòu)建難度,而且能顯著減少測(cè)試成本。
[Abstract]:With the rapid development of electronic information technology, A / D converter (ADC), as a digital and analog interface circuit, has been widely used in different fields, such as data acquisition, precision industrial measurement, audio and video applications, etc. More and more attention has been paid to the study of frequency domain characteristics of ADC. Fast Fourier transform (FFT) method is the most popular method in frequency domain testing, but it is difficult to achieve coherent sampling and integer period truncation when using FFT method to test the frequency domain parameters of ADC. That is, incoherent sampling is inevitable, and the frequency leakage and fence effect will affect the results of frequency domain parameter measurement. In this paper, the important frequency domain characteristic parameters of high speed and high precision ADC are measured by FFT method. These include signal-to-noise ratio (SNR), signal-noise-distortion ratio (SNR), effective bit number (ENOB), no stray dynamic range (SFDR) and total harmonic distortion (THD), etc. The average spectrum method and three-line interpolation FFT method are proposed to suppress spectrum leakage and fence effect. The main work of this paper is as follows. Firstly, the basic structure and working principle of ADC are introduced. It is emphasized that pipeline type is the most widely used structure in high speed and high precision ADC at present, the definition and calculation method of important frequency domain characteristic parameters of high speed and high precision ADC are given, and the testing methods of high speed and high precision ADC frequency domain parameters are described in detail. Including the traditional DAC testing method, code density histogram method, sinusoidal wave fitting method and FFT method, and compared and summarized their advantages and disadvantages and applicable scope. Two kinds of high-speed and high-precision pipeline ADC architecture, 12 bits 200 MSPS and 14 bits 160 MSPS, are modeled by Simulink, and the behavioral level dynamic models of AD9230 AD9246 and AD9461 are used to build a verification platform. A hardware testing system based on FPGA FPGA, high performance signal source and filter is designed and built, which provides a simulation and experimental platform for the proposed testing method in frequency domain. In order to improve the accuracy of spectrum analysis and reduce the influence of random signal in the signal, the digital signal of ADC output is sampled twice or more times, and the data are windowed by FFT operation, respectively, in order to improve the accuracy of spectrum analysis and reduce the influence of random signal in the signal. The average spectrum is obtained by superposition of the obtained spectrum, and then the frequency domain parameters are calculated based on the average spectrum. The simulation and the measured results show that, even when the incoherence degree is the greatest, it is compared with the windowed FFT method. The error of frequency domain parameters obtained by the average spectrum method is obviously reduced, which is close to the result of coherent sampling and meets the test standard of ADI. Finally, in order to reduce the spectrum leakage, the maximum sidelobe attenuation window is constructed to process the signal. In order to reduce the error caused by the fence effect, the three-spectral line interpolation (FFT) algorithm is proposed to modify the result of window adding, and the amplitude correction formula based on the commonly used combination cosine window and the maximum sidelobe attenuation window is obtained by function fitting. The results of simulation and measurement show that the average spectrum method can accurately measure the parameters of SNRX ENOB. In order to verify the validity and accuracy of the proposed method, the three-spectral line interpolation FFT method is very suitable for measuring the SFDR parameters of high speed and high precision ADC. The algorithm is verified by the data obtained from two simulation verification platforms and an actual test system. The results show that the proposed method is universal and can effectively test the frequency domain parameters of ADC with high speed and high precision. When it is applied to the actual test system, it can not only reduce the difficulty of system construction, but also significantly reduce the test cost.
【學(xué)位授予單位】：江南大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TN792

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