本文關(guān)鍵詞： 片上系統(tǒng) MIPS PCB SOC測試　出處：《合肥工業(yè)大學(xué)》2015年碩士論文　論文類型：學(xué)位論文

【摘要】：片上系統(tǒng)(System On Chip,SOC),是將整個(gè)系統(tǒng)集成在一個(gè)芯片上。一個(gè)完整的SOC系統(tǒng)包括微處理器模塊、存儲(chǔ)器模塊、通信接口模塊、ADC/DAC模塊、電源模塊等。本課題是研究一款支持MIPS 32指令集的SOC芯片,此款芯片主要用于工業(yè)控制和數(shù)據(jù)采集,它作為NCU(數(shù)字控制中心)的核心芯片,實(shí)現(xiàn)了數(shù)據(jù)采集、存儲(chǔ)、轉(zhuǎn)換、I/O和對(duì)機(jī)床的位置控制等功能。為了得到性能穩(wěn)定的SOC芯片,首先要對(duì)SOC芯片的內(nèi)部功能進(jìn)行透徹分析,然后進(jìn)行芯片的功能測試,提高最終的良品率。本文是對(duì)一個(gè)封裝成品芯片進(jìn)行功能測試,主要思想是根據(jù)芯片的具體功能,自主設(shè)計(jì)一個(gè)測試電路板,通過示波器、邏輯分析儀測試其內(nèi)部功能。本論文首先詳細(xì)分析此款SOC芯片內(nèi)部模塊的體系結(jié)構(gòu)、性能指標(biāo)和接口設(shè)計(jì),包括CPU處理器、Nand Flash控制器、PWM控制器、DDR2控制器、12C接口、中斷控制、SPI接口、RTC控制器、Watchdog、GPIO寄存器等模塊的結(jié)構(gòu)圖、時(shí)序圖、寄存器定義和引腳功能說明,在此基礎(chǔ)上,根據(jù)此款芯片自身特點(diǎn),利用Altium Designer winter 10設(shè)計(jì)外圍測試電路和芯片選型,包括測試板的電源電路、SDRAM電路、復(fù)位電路、時(shí)鐘電路和Flash存儲(chǔ)器電路、LED電路設(shè)計(jì),進(jìn)而完成原理圖設(shè)計(jì)和PCB設(shè)計(jì),制版和焊接電路板。最后完成測試電路板實(shí)物的軟硬件調(diào)試,借助示波器觀察測試板部分模塊的波形。先對(duì)SOC芯片內(nèi)部DAC模塊和4路PWM模塊的波形測試,然后用軟件測試了SOC芯片內(nèi)部Flash的讀寫功能、DDR2存儲(chǔ)器的拷貝、數(shù)學(xué)運(yùn)算的速度和USB訪問速度。通過對(duì)測試結(jié)果比對(duì)分析,驗(yàn)證芯片內(nèi)部這五個(gè)模塊功能基本符合要求,可以流片生產(chǎn)。
[Abstract]:The system on chip system on chip is to integrate the whole system on a chip. A complete SOC system includes microprocessor module, memory module, communication interface module and ADC / DAC module. This topic is to study a SOC chip which supports MIPS 32 instruction set. This chip is mainly used for industrial control and data acquisition. As the core chip of MIPS, it realizes data acquisition and storage. In order to get a stable SOC chip, the internal function of the SOC chip should be thoroughly analyzed, and then the functional test of the chip should be carried out. The main idea of this paper is to design a test circuit board according to the specific function of the chip, and design a test circuit board by oscilloscope. In this paper, the architecture, performance index and interface design of the internal module of the SOC chip are analyzed in detail, including the CPU processor and Flash controller / Flash controller / DDR2 controller / 12C interface. The structure diagram, sequence diagram, register definition and pin function of the Altium Designer winter 10 are used to design the peripheral test circuit and chip type selection according to the characteristics of the chip. It includes power supply circuit of test board, reset circuit, clock circuit and Flash memory circuit, and then completes schematic design and PCB design, plate making and welding circuit board. Finally, hardware and software debugging of test circuit board is completed. With the help of oscilloscope to observe the waveform of some modules of the test board, the waveform of the DAC module and four PWM modules inside the SOC chip are tested first, and then the copy of DDR2 memory is tested by software, which is the reading and writing function of the Flash inside the SOC chip. Through the comparison and analysis of the test results, it is verified that the functions of the five modules in the chip basically meet the requirements, and the flow sheet can be produced.
【學(xué)位授予單位】：合肥工業(yè)大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TN407

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