本文關鍵詞： 功能覆蓋率 OVM System Verilog 驗證平臺 自動化　出處：《西安電子科技大學》2015年碩士論文　論文類型：學位論文

【摘要】：本論文的研究重點是數(shù)字集成電路設計中的驗證技術。隨著集成電路技術的高速發(fā)展,芯片設計的規(guī)模越來越大,功能越來越復雜,導致在電路設計階段設計缺陷出現(xiàn)的可能性越來越高,于是對驗證的要求越來越高。并且現(xiàn)在芯片的應用領域越來越廣泛,對設計安全性的要求也越來越高,設計漏洞的出現(xiàn)可能會造成非常嚴重的后果,驗證的充分性也顯得尤為重要。市場對芯片產(chǎn)品更新?lián)Q代的要求也越來越快,而在大規(guī)模集成電路開發(fā)的前端設計流程中,驗證工作已經(jīng)占到了總工作量的百分之七十左右。如何在保證驗證充分性的前提下,提高驗證效率成為集成電路設計開發(fā)中的瓶頸。找到高效、可行的驗證方法非常重要。本文在詳細對比分析了傳統(tǒng)的定向驗證方法、帶約束的隨機化激勵驗證方法以及基于覆蓋率驅動的驗證方法的基礎上,針對當前驗證工作面臨的完備性、可重用性、可靠性和效率等方面的挑戰(zhàn),結合基于功能覆蓋率驅動的驗證方法和OVM驗證方法學,設計實現(xiàn)了功能覆蓋率驅動器組件。論文所設計的功能覆蓋率驅動組件實現(xiàn)了功能覆蓋率的動態(tài)自動化分析,可根據(jù)分析結果指導驗證平臺中的序列產(chǎn)生器產(chǎn)生有針對性的測試激勵,并易于集成到OVM架構的驗證環(huán)境中。該模塊基于功能覆蓋率驅動的驗證方法,實現(xiàn)了驗證的完備性;基于OVM驗證方法學和System Verilog語言,模塊化實現(xiàn)了設計內容及高度的可重用性;設計了自動化的實現(xiàn)手段,減少了人為參與過程,提高了驗證的可靠性;以反饋方式調控驗證環(huán)境中隨機測試激勵的生成,減少了重復性驗證行為,加速了功能覆蓋率收斂,提高了驗證效率。同時,該功能覆蓋率模塊封裝成一個獨立功能模塊,易于集成到不同的驗證環(huán)境,提升了可移植性。論文最后以SOC芯片上DebugTrace系統(tǒng)中一個典型模塊的驗證過程為例,將功能覆蓋率驅動模塊集成到了該模塊的OVM驗證平臺中并進行仿真,通過對比不同時刻功能覆蓋率的覆蓋情況得到了功能覆蓋率的收斂曲線。對比結果表明采用本文所設計的功能覆蓋率驅動模塊使功能覆蓋率的收斂速度提高了50%以上。
[Abstract]:With the rapid development of integrated circuit technology, the scale of chip design is becoming larger and larger, and the function is becoming more and more complex. As a result, the possibility of design defects in the circuit design phase is becoming higher and higher, so the requirement of verification is becoming higher and higher. And now the application field of chip is more and more extensive, and the requirement of design security is also more and more high. The emergence of design loopholes may cause very serious consequences, the adequacy of verification is also particularly important. The market for chip products upgrading requirements are also getting faster and faster. In the front-end design process of large-scale integrated circuit development, verification work has accounted for about 70% of the total workload. How to ensure the adequacy of verification under the premise. Improving the efficiency of verification has become the bottleneck in IC design and development. It is very important to find efficient and feasible verification methods. In this paper, the traditional directional verification methods are compared and analyzed in detail. Based on the randomized incentive verification method with constraints and the coverage driven verification method, this paper aims at the challenges of completeness, reusability, reliability and efficiency faced by the current verification work. Combining the functional coverage driven verification method with the OVM verification methodology. The functional coverage driver component is designed and implemented. The functional coverage driver component designed in this paper realizes the dynamic automatic analysis of the function coverage. According to the analysis results, the sequence generator in the verification platform can generate targeted test incentives, and can be easily integrated into the verification environment of OVM architecture. This module is based on the functional coverage driven verification method. The completeness of verification is realized. Based on OVM verification methodology and System Verilog language, the design content and high reusability are realized by modularization. The realization method of automation is designed to reduce the process of artificial participation and improve the reliability of verification. The generation of random test incentives in the verification environment is regulated by feedback, which reduces the repetitive verification behavior, accelerates the convergence of function coverage, and improves the efficiency of verification. The functional coverage module is encapsulated into a separate functional module, which is easy to integrate into different verification environments. Finally, the verification process of a typical module in DebugTrace system on SOC chip is taken as an example. The function coverage driver module is integrated into the OVM verification platform of the module and simulated. The convergent curve of function coverage is obtained by comparing the coverage of function coverage at different times. The comparison results show that the convergent speed of function coverage is improved by using the function coverage driver module designed in this paper. More than 0%.
【學位授予單位】：西安電子科技大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN402

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相關期刊論文 前1條

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本文編號：1442117