本文關(guān)鍵詞：功率集成器件熱載流子退化測試系統(tǒng)設(shè)計及實現(xiàn)　出處：《東南大學(xué)》2016年碩士論文　論文類型：學(xué)位論文

  更多相關(guān)文章： 熱載流子退化測試 直接數(shù)字頻率合成技術(shù) 動態(tài)應(yīng)力 參數(shù)監(jiān)測

【摘要】：功率集成器件作為功率集成電路的主要組成部分,通常工作在高壓、大電流等惡劣情況下,因而面臨嚴(yán)重的熱載流子退化問題,使得器件工作壽命縮短,進(jìn)而影響整個電路系統(tǒng)的性能。因此,功率集成器件的熱載流子退化問題亟需解決,而為了方便、快速的測試并研究其內(nèi)在退化機(jī)理,專用的熱載流子退化測試系統(tǒng)的研究開發(fā)意義重大。目前,利用各種通用儀器搭建的測試系統(tǒng),操作繁瑣,連線產(chǎn)生的寄生參數(shù)干擾嚴(yán)重,不能滿足更高層次的測試研究需求。本文根據(jù)器件熱載流子退化所需的應(yīng)力設(shè)計了動態(tài)應(yīng)力發(fā)生模塊,可以產(chǎn)生頻率、脈寬、幅值和上升下降沿可調(diào)的脈沖信號,作為退化的動態(tài)應(yīng)力。同時,為了檢測施加應(yīng)力過程中器件電學(xué)參數(shù)的退化情況,本文設(shè)計了器件電學(xué)參數(shù)監(jiān)測模塊,實現(xiàn)了應(yīng)力模式和電學(xué)參數(shù)測試模式間的自動切換,實時監(jiān)測并記錄器件的電學(xué)參數(shù)。另外,該測試系統(tǒng)還包含電源模塊、基準(zhǔn)模塊、過壓保護(hù)模塊等,確保測試系統(tǒng)安全穩(wěn)定工作。測試結(jié)果表明：本文設(shè)計的測試系統(tǒng)可以產(chǎn)生頻率在5kHz-2MHz間可調(diào)、脈寬在50ns-1550ns間可調(diào)、幅值三檔可調(diào)的動態(tài)脈沖應(yīng)力,并實現(xiàn)了施加應(yīng)力過程中監(jiān)測器件的電學(xué)參數(shù),滿足了功率集成器件熱載流子退化的測試應(yīng)用需求。
[Abstract]:As the main component of power integrated circuits, power integrated devices usually work in high voltage, high current and other bad conditions, so they face the serious hot carrier degradation problem, which shorten the working life of the devices. Therefore, the hot carrier degradation of power integrated devices needs to be solved, and in order to facilitate the rapid test and study of its inherent degradation mechanism. The research and development of the dedicated hot-carrier degradation test system is of great significance. At present, the test system built with various kinds of universal instruments is cumbersome to operate, and the parasitic parameter interference caused by the connection is serious. The dynamic stress generation module is designed according to the stress of hot carrier degradation, which can generate frequency and pulse width. The pulse signal with adjustable amplitude and rising and descending edge is regarded as the dynamic stress of degradation. In order to detect the degradation of electrical parameters in the process of applying the stress, a monitoring module of electrical parameters of the device is designed in this paper. The automatic switching between stress mode and electrical parameter testing mode is realized, and the electrical parameters of the device are monitored and recorded in real time. In addition, the test system also includes power supply module, reference module, overvoltage protection module and so on. The test results show that the test system designed in this paper can produce adjustable frequency between 5kHz-2MHz and pulse width of 50ns-1550ns. The dynamic pulse stress with three adjustable amplitudes is realized and the electrical parameters of the device are monitored in the process of applying the stress, which meets the requirements of the hot carrier degradation test of the power integrated devices.
【學(xué)位授予單位】：東南大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2016
【分類號】：TN307

【參考文獻(xiàn)】

相關(guān)期刊論文 前4條

1 楊峰;文枰;;基于FPGA的正交信號發(fā)生器設(shè)計[J];四川文理學(xué)院學(xué)報;2015年05期

2 韋曉璐;任青蓮;;基于DDS的多路任意波形發(fā)生器的設(shè)計與實現(xiàn)[J];電子設(shè)計工程;2015年14期

3 張金保;宋凝芳;馬東營;金靖;;光纖陀螺本征頻率和半波電壓測量方法研究[J];電光與控制;2009年07期

4 姜建發(fā);李正堅;薛承典;卞德森;;PDP與LCD大屏幕顯示器性能評價方法和技術(shù)探討[J];現(xiàn)代電視技術(shù);2009年05期

，

本文編號：1426321