【摘要】：電壓暫降對敏感過程的影響與導(dǎo)致暫降的故障電流、清除故障的保護(hù)定值以及過程暫降免疫力有關(guān)。引入過程免疫時(shí)間和用戶可接受后果狀態(tài)的概念,確定用戶可接受的暫降持續(xù)時(shí)間,將過程免疫力分為3個(gè)等級。研究過程免疫時(shí)間與三段式電流保護(hù)定值之間的關(guān)系,提出通過利用過程免疫時(shí)間優(yōu)化保護(hù)緩減電壓暫降影響的方案。對IEEE 14節(jié)點(diǎn)配電系統(tǒng)、某實(shí)際含短線路配電系統(tǒng)和2種典型敏感過程進(jìn)行仿真,驗(yàn)證了所提方法的正確性和有效性。結(jié)果證明,對于過程免疫時(shí)間較長的敏感過程,所提方法可有效緩減由Ⅱ段和Ⅲ段電流保護(hù)以及含短線路系統(tǒng)中由帶延時(shí)的電流保護(hù)清除的故障所引起的電壓暫降的影響。
[Abstract]:The effect of voltage sag on the sensitive process is related to the fault current which leads to the sag, the protection setting for clearing the fault and the immunity of the process sag. The concept of process immunity time and user acceptable consequence state is introduced to determine the duration of downtime acceptable to users and to divide process immunity into three levels. The relationship between the immune time of the process and the fixed value of the three-segment current protection is studied, and a scheme to optimize the protection against voltage sag by using the immune time of the process is put forward. This paper simulates the IEEE 14-bus distribution system, an actual power distribution system with short lines and two typical sensitive processes, and verifies the correctness and effectiveness of the proposed method. The results show that the proposed method can effectively mitigate the effect of voltage sag caused by current protection in stage 鈪，

本文編號：2399873