本文選題：微波材料 + 變溫測(cè)試��； 參考：《電子科技大學(xué)》2014年碩士論文

【摘要】：在航天航空、軍事、醫(yī)療等眾多領(lǐng)域中,微波材料的應(yīng)用隨處可見。一般來說,大部分的微波材料只要求在常溫環(huán)境下完成工作即可。然而,當(dāng)處于幾百度甚至上千度的工作環(huán)境中時(shí),微波材料的復(fù)介電常數(shù)會(huì)隨著溫度變化呈現(xiàn)非線性變化,如果不能準(zhǔn)確了解這些材料的性能,正確地使用微波材料,這將會(huì)對(duì)微波材料設(shè)備產(chǎn)生不可估量的影響。因此,建立一套材料介電性能變溫測(cè)試系統(tǒng),準(zhǔn)確測(cè)試不同微波材料在不同溫度及不同頻率下的介電性能變化,為微波材料設(shè)備的生產(chǎn)提供數(shù)據(jù)參考,具有非常重要的價(jià)值。本文以經(jīng)典的終端短路法測(cè)試?yán)碚摓榛A(chǔ),對(duì)傳統(tǒng)的終端短路法測(cè)試結(jié)構(gòu)進(jìn)行了改進(jìn)創(chuàng)新。其中主要體現(xiàn)在兩個(gè)方面：第一,高方向性定向耦合器的加入,簡化了方向性誤差校準(zhǔn),同時(shí)保證了測(cè)試精度。第二,在結(jié)構(gòu)中加入波導(dǎo)開關(guān),利用響應(yīng)校準(zhǔn),可以起到實(shí)時(shí)校準(zhǔn)的作用,特別是在本測(cè)試系統(tǒng)中,可大大提高測(cè)試實(shí)驗(yàn)的重復(fù)性。本文設(shè)計(jì)制作了本測(cè)試結(jié)構(gòu)中所需的同軸-矩形波導(dǎo)模式轉(zhuǎn)換器、定向耦合器、高溫波導(dǎo)等微波器件,完成測(cè)試系統(tǒng)組建。以測(cè)試系統(tǒng)為核心,對(duì)真空裝置、感應(yīng)加熱裝置、水冷機(jī)、溫控設(shè)備等各子系統(tǒng)進(jìn)行聯(lián)調(diào)工作,完成材料介電性能變溫測(cè)試系統(tǒng)的搭建。在頻率15 GHz附近利用自動(dòng)化測(cè)試軟件實(shí)現(xiàn)了室溫～1200℃微波材料介電常數(shù)的變溫測(cè)試。根據(jù)測(cè)試結(jié)果分析,本變溫測(cè)試系統(tǒng)達(dá)到了如下技術(shù)指標(biāo)：測(cè)試頻率：15 GHz及附近頻點(diǎn)(Ku Band)測(cè)試溫度：常溫～1200℃測(cè)試范圍：室溫：εr'=1.0～12 tanδε=0.001～0.11200℃:εr=1.0～12 tanδε=0.005～0.1誤差范圍：室溫：|Δεr'/εr'|≤5% |Δtan δε/tanδε|≤14% tan δε+0.001 1200℃:|Δεr'/εr'|≤10% |Δtan δε/tanδε|≤28% tanδε+0.002
[Abstract]:In aerospace, military, medical and many other fields, microwave materials can be seen everywhere. Generally speaking, most microwave materials only require that work be done under normal temperature. However, the complex permittivity of microwave materials varies nonlinear with temperature when they are in a working environment of several degrees or even thousands of degrees. If the properties of these materials cannot be accurately understood, the microwave materials can be used correctly. This will have an incalculable effect on microwave material equipment. Therefore, it is of great value to establish a system for measuring the dielectric properties of different microwave materials at different temperature and frequency, and to provide data reference for the production of microwave materials. Based on the classical theory of terminal short circuit test, the traditional test structure of terminal short circuit method is improved and innovated in this paper. First, the addition of high directional coupler simplifies the calibration of directional errors and ensures the accuracy of the measurement. Secondly, the waveguide switch is added to the structure and the response calibration is used, which can play the role of real-time calibration, especially in this testing system, which can greatly improve the repeatability of the test experiment. In this paper, the coaxial rectangular waveguide mode converter, directional coupler, high temperature waveguide and other microwave devices are designed and fabricated, and the test system is constructed. Taking the test system as the core, the subsystems such as vacuum device, induction heating device, water cooler, temperature control equipment and so on are combined to complete the construction of the material dielectric property temperature change test system. The dielectric constant of microwave materials at room temperature of 1200 鈩，

本文編號(hào)：2102730