投切10kV并聯(lián)電容器的暫態(tài)過(guò)程研究
本文選題:并聯(lián)電容 + 過(guò)電壓 ; 參考:《重慶大學(xué)》2014年碩士論文
【摘要】:近年來(lái),投切10kV并聯(lián)電容器的操作事故頻發(fā),隨著電網(wǎng)結(jié)構(gòu)及負(fù)荷變化的日益復(fù)雜,故障操作不簡(jiǎn)單地表現(xiàn)為合閘、分閘操作,而出現(xiàn)了合閘后快速分閘等新故障操作方式,使得過(guò)電壓的研究更為復(fù)雜。本文從實(shí)際故障操作特征出發(fā),以理論研究、ATP-EMTP仿真計(jì)算和現(xiàn)場(chǎng)試驗(yàn)相結(jié)合方式,分別對(duì)10kV并聯(lián)電容器的合閘、分閘、母線側(cè)對(duì)地電容變化時(shí)分閘、合閘后快速分閘等不同操作暫態(tài)過(guò)程進(jìn)行研究,獲得了暫態(tài)電壓、電流的變化規(guī)律,推斷出各類操作下最為可能故障原因。本論文主要開(kāi)展了以下工作: ①理論研究了投切10kV并聯(lián)電容器的暫態(tài)過(guò)程,分析了各操作暫態(tài)過(guò)程中電壓、電流變化規(guī)律,推斷出各類操作下最為可能故障原因,研究合閘涌流、高頻電流對(duì)電弧重燃的激發(fā)機(jī)制。 ②建立了不同單相、三相仿真模型,對(duì)不同操作暫態(tài)過(guò)程進(jìn)行仿真研究,獲得不同操作暫態(tài)特征的仿真性結(jié)論:對(duì)合閘涌流、高頻電流對(duì)電弧重燃的激發(fā)機(jī)制進(jìn)行仿真性驗(yàn)證。 ③研制了10kV并聯(lián)電容器操作試驗(yàn)系統(tǒng),設(shè)計(jì)多種斷路器聯(lián)動(dòng)控制方式及控制平臺(tái),實(shí)現(xiàn)斷路器合閘后快速分閘操作、母線側(cè)對(duì)地電容變化的實(shí)際模擬。 ④對(duì)10kV并聯(lián)電容器進(jìn)行了合閘、分閘、合閘后快速分閘和母線側(cè)對(duì)地電容變化時(shí)分閘的現(xiàn)場(chǎng)試驗(yàn),獲得涌流、電弧重燃等不同操作暫態(tài)特征的試驗(yàn)性結(jié)論,證明母線對(duì)地電容變化產(chǎn)生高頻電流的可能,對(duì)合閘涌流、高頻電流對(duì)電弧重燃的激發(fā)機(jī)制進(jìn)行了試驗(yàn)性驗(yàn)證。 綜合上述研究得出:合閘涌流、重燃過(guò)電壓是引發(fā)合閘、分閘操作時(shí)斷路器、電容器故障的最可能原因,合閘涌流、母線對(duì)地電容變化產(chǎn)生的高頻電流會(huì)大大增加重燃概率。研究結(jié)論完善了過(guò)電壓的產(chǎn)生機(jī)制,,解釋了重大操作事故多發(fā)于母線出線少、負(fù)荷情況復(fù)雜變電站的現(xiàn)狀,也為操作過(guò)電壓的研究提供了一條新的思路,對(duì)過(guò)電壓防護(hù)及電氣設(shè)備絕緣設(shè)計(jì)等實(shí)際生產(chǎn)具有深遠(yuǎn)的意義。
[Abstract]:In recent years, the operation accidents of switching 10 kV shunt capacitors occur frequently. With the increasing complexity of the power network structure and load change, the fault operation is not simply shown as closing and opening operation, and new fault operation modes such as fast opening after closing have appeared. This makes the study of overvoltage more complicated. Based on the characteristics of practical fault operation and the combination of ATP-EMTP simulation calculation and field test, this paper opens the 10 kV shunt capacitor when the switch, the switch and the busbar side to ground capacitance change, respectively. The transient process of different operation such as fast switching after closing is studied. The variation of transient voltage and current is obtained and the most likely cause of failure is inferred under various operation conditions. The main work of this paper is as follows: 1 the transient process of switched 10 kV shunt capacitor is studied theoretically, and the variation of voltage and current during the transient operation is analyzed, and the most probable fault causes under various operation conditions are inferred. The excitation mechanism of arc reburning caused by closing inrush current and high frequency current is studied. (2) different single-phase and three-phase simulation models are established and the transient processes of different operation are simulated. The simulation results of different operating transient characteristics are as follows: the excitation mechanism of arc reburning caused by closing inrush current and high frequency current is verified by simulation. 3 A 10 kV shunt capacitor operating test system is developed. A variety of circuit breaker linkage control methods and control platform are designed to realize the fast switching operation after the circuit breaker is closed, and the actual simulation of the change of the generatrix side to ground capacitance. 4. The 10 kV shunt capacitor is closed and switched off. In the field test of fast opening after closing and changing of busbar side to ground capacitance, the experimental conclusions of different operating transient characteristics such as inrush current, arc reburning and so on are obtained. It is proved that the change of busbar capacitance to the ground may produce high frequency current, and the inrush current of closing gate can be obtained. The excitation mechanism of arc reburning is experimentally verified by high frequency current. From the above research, it is concluded that the inrush current and reburning overvoltage are the most likely causes of the fault of the circuit breaker and capacitor, the high frequency current caused by the change of the closing inrush current and the change of the busbar capacitance to the ground will greatly increase the probability of reburning. The conclusion of the study consummates the generation mechanism of overvoltage, explains the present situation that the major operation accidents are mostly in the substation with less bus outage and complex load situation, and also provides a new way of thinking for the study of operation overvoltage. It is of great significance for practical production such as protection of overvoltage and insulation design of electrical equipment.
【學(xué)位授予單位】:重慶大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2014
【分類號(hào)】:TM53
【參考文獻(xiàn)】
相關(guān)期刊論文 前10條
1 張偉強(qiáng),楊小平,李建英,李盛濤;浪涌保護(hù)器的發(fā)展動(dòng)向[J];電瓷避雷器;2001年04期
2 方春恩;王佳穎;鄒積巖;;并聯(lián)電容器組同步關(guān)合最佳目標(biāo)相位的確定[J];電工技術(shù)學(xué)報(bào);2006年01期
3 段雄英;廖敏夫;丁富華;劉斌;鄒積巖;;基于真空斷路器的并聯(lián)電容器組相控投切裝置[J];電工技術(shù)學(xué)報(bào);2007年10期
4 杜林;戴斌;陸國(guó)俊;孫才新;王有元;;基于S變換局部奇異值分解的過(guò)電壓特征提取[J];電工技術(shù)學(xué)報(bào);2010年12期
5 王季梅;我國(guó)真空開(kāi)關(guān)的技術(shù)發(fā)展和應(yīng)用前景[J];電工技術(shù)雜志;1988年12期
6 陳洋;李蘭;陳紅光;凌兆偉;李新;席世友;;諧波對(duì)10kV電容器補(bǔ)償回路合閘影響的分析[J];電力電容器與無(wú)功補(bǔ)償;2011年06期
7 周凱;張濤;董秀成;張彼德;王軍;席世友;;基于電容分壓的配電網(wǎng)過(guò)電壓在線監(jiān)測(cè)[J];電力系統(tǒng)自動(dòng)化;2007年21期
8 劉艷峰;尚秋峰;周文昌;;Rogowski線圈典型外積分電路暫態(tài)性能比較與仿真[J];電力自動(dòng)化設(shè)備;2006年07期
9 嚴(yán)志強(qiáng);王雨;任開(kāi)春;劉瀏;王永民;;基于DSP、CPLD和單片機(jī)的高速數(shù)據(jù)采集裝置設(shè)計(jì)[J];電力自動(dòng)化設(shè)備;2007年05期
10 楊書(shū)杰;郭宗蓮;;基于FPGA的高速數(shù)據(jù)采集系統(tǒng)研制[J];電力自動(dòng)化設(shè)備;2008年06期
本文編號(hào):2018121
本文鏈接:http://sikaile.net/kejilunwen/dianlilw/2018121.html