本文選題：超高壓電纜接頭　切入點：有限體積法　出處：《高電壓技術(shù)》2014年12期

【摘要】：超高壓(EHV)電纜接頭內(nèi)部存在的缺陷將造成電場集中,局部溫度升高,達到一定程度即發(fā)生閃絡(luò)或擊穿,影響其安全可靠運行。為研究影響電纜接頭內(nèi)部電場和溫度場分布的主要因素,利用有限體積法對電纜接頭進行了電場-溫度場耦合仿真,研究了電纜接頭在正常工作狀態(tài)、絕緣材料存在雜質(zhì)顆粒、應(yīng)力錐表面存在毛刺突起、硅橡膠絕緣材料老化等情況下的電場-溫度場分布特性。研究結(jié)果表明:接頭與絕緣界面、導(dǎo)體屏蔽管兩端等位置是絕緣的薄弱環(huán)節(jié),容易發(fā)生沿面閃絡(luò)或絕緣擊穿;接頭絕緣中微小的雜質(zhì)顆粒可能導(dǎo)致局部溫度超過絕緣材料的耐受溫度,加速絕緣老化;老化到一定程度時,溫度和電場強度又將大幅度升高,對接頭安全運行造成嚴重隱患。該研究結(jié)果對電纜接頭的結(jié)構(gòu)優(yōu)化設(shè)計和絕緣材料的選擇具有一定的參考意義。
[Abstract]:The defects inside the EHVV cable connector will lead to the concentration of electric field and the increase of local temperature. To a certain extent, flashover or breakdown will occur, which will affect its safe and reliable operation.In order to study the main factors that affect the distribution of electric field and temperature field in cable joint, the coupling simulation of electric field and temperature field of cable joint is carried out by using finite volume method. It is studied that the cable joint is in normal working state and impurity particles exist in insulation material.The distribution of electric field and temperature field on the surface of stress cone is characterized by burr protruding and aging of silicone rubber insulating material.The results show that the interface between the joint and the insulation, the two ends of the conductor shield tube are the weak links of the insulation, and it is easy to flashover or break down along the surface.The tiny impurity particles in joint insulation may cause local temperature to exceed the withstand temperature of insulation material, and accelerate insulation aging. When aging to a certain extent, temperature and electric field strength will increase by a large margin, which will cause serious hidden danger to safety operation of joint.The results can be used as a reference for the optimum design of cable joints and the selection of insulating materials.
【作者單位】： 武漢大學(xué)電氣工程學(xué)院;中國電力科學(xué)研究院;三峽大學(xué)電氣與新能源學(xué)院;
【基金】：國家自然科學(xué)基金(51207081)~~
【分類號】：TM75

【參考文獻】

相關(guān)期刊論文 前10條

1 吳畏;汪l，

本文編號：1702006