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真差分特性阻抗分析儀系統(tǒng)軟件設(shè)計(jì)與實(shí)現(xiàn)

發(fā)布時(shí)間:2018-03-23 08:21

  本文選題:時(shí)域反射計(jì) 切入點(diǎn):特性阻抗 出處:《電子科技大學(xué)》2014年碩士論文 論文類型:學(xué)位論文


【摘要】:隨著SATA、PCI Express、USB3.0等高速串行通信技術(shù)的快速發(fā)展,差分傳輸線在現(xiàn)代電子行業(yè)得到非常廣泛使用,高速、高頻、高密度化已成為電子行業(yè)技術(shù)發(fā)展重要趨勢(shì),電子科技大學(xué)過(guò)去幾年自主研制的特性阻抗測(cè)試儀TDR ZK-2010,取樣帶寬只有5GHz,TDR帶寬只有1.75GHz,不能滿足柔性板、板內(nèi)阻抗等需要測(cè)量2、3cm長(zhǎng)度的要求,而且采用的算法偽差分技術(shù)在一些情況測(cè)量不準(zhǔn),并且會(huì)降低TDR性能。本課題研究目的是將過(guò)去多年的軟件設(shè)計(jì)技術(shù)與經(jīng)驗(yàn)和泰克真差分TDR儀器相結(jié)合,研發(fā)12GHz帶寬(20GHz取樣帶寬)的高性能TDR真差分特性阻抗分析儀,其目的是以泰克儀器為平臺(tái)研究真差分技術(shù),完成真差分技術(shù)研究和相關(guān)軟件開(kāi)發(fā),為后繼自主研發(fā)10~20GHz取樣帶寬的TDR儀器奠定基礎(chǔ)。本文首先分析了單端特性阻抗測(cè)試技術(shù)和真差分、偽差分、算法偽差分三種差分技術(shù)的差異,然后提出本課題的儀器總體設(shè)計(jì)方案以及基于標(biāo)準(zhǔn)I/O接口軟件VISA的儀器控制技術(shù),并從功能和性能兩方面分析軟件設(shè)計(jì)需求。然后根據(jù)面向?qū)ο蟪绦蛟O(shè)計(jì)思想設(shè)計(jì)了軟件的總體方案和總體結(jié)構(gòu),對(duì)軟件進(jìn)行了模塊劃分。接下來(lái)本文對(duì)真差分特性阻抗校準(zhǔn)與測(cè)試技術(shù)做了重點(diǎn)分析和相關(guān)研究,總結(jié)出詳細(xì)的校準(zhǔn)流程與設(shè)計(jì)方案,最后分模塊對(duì)軟件進(jìn)行了詳細(xì)設(shè)計(jì)與實(shí)現(xiàn),重點(diǎn)在于主控程序中對(duì)于取樣示波器的設(shè)置與同步,參數(shù)配置模塊的實(shí)現(xiàn),多線程的調(diào)配,數(shù)據(jù)傳輸模塊設(shè)計(jì),數(shù)據(jù)分析處理模塊實(shí)現(xiàn),以及校準(zhǔn)流程與算法的具體實(shí)現(xiàn)。最后從功能、性能和測(cè)試結(jié)果三個(gè)方面對(duì)所設(shè)計(jì)的軟件進(jìn)行了詳細(xì)的測(cè)試,驗(yàn)證了此系統(tǒng)滿足了真差分特性阻抗測(cè)試的需求;同時(shí)也對(duì)行業(yè)的發(fā)展前景和后續(xù)的研究工作進(jìn)行了展望。
[Abstract]:With the rapid development of high speed serial communication technology such as PCI Express USB 3.0, differential transmission line has been widely used in modern electronic industry. High speed, high frequency and high density have become an important trend in the development of electronic technology. The characteristic impedance tester TDR ZK-2010, developed by the University of Electronic Science and Technology in the past few years, has a sampling bandwidth of only 5 GHz and a TDR bandwidth of only 1.75 GHz, which cannot meet the requirements of the flexible plate, the in-board impedance, and so on. Moreover, the algorithm pseudo difference technique used in this paper is not accurate in some cases and will reduce the performance of TDR. The purpose of this study is to combine the software design technology and experience of the past years with the true differential TDR instrument. A high performance TDR true differential characteristic impedance analyzer with 12GHz bandwidth of 20 GHz is developed. The purpose of this instrument is to study true differential technology based on Teke instrument, and to complete the research of true differential technology and related software development. In this paper, we first analyze the difference of the single terminal characteristic impedance measurement technology and the true difference, pseudo difference, algorithm pseudo difference, and the difference of the three kinds of difference technology, such as true difference, pseudo difference, algorithm pseudo difference, etc. Then put forward the overall design of the instrument and the instrument control technology based on the standard I / O interface software VISA. The software design requirements are analyzed from the aspects of function and performance. Then, the overall scheme and structure of the software are designed according to the object-oriented programming idea. The software is divided into modules. Secondly, this paper analyzes and studies the impedance calibration and testing technology of true differential characteristic, and summarizes the detailed calibration flow and design scheme. Finally, the software is designed and implemented in detail, which focuses on the setting and synchronization of sampling oscilloscope, the realization of parameter configuration module, the deployment of multi-thread and the design of data transmission module in the main control program. The realization of data analysis and processing module, and the realization of calibration flow and algorithm. Finally, the designed software is tested in detail from three aspects: function, performance and test results. It is verified that the system meets the requirements of true differential impedance testing, and the future development of the industry and the future research work are also prospected.
【學(xué)位授予單位】:電子科技大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2014
【分類號(hào)】:TM934.7

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