本文選題：密封式繼電器　切入點(diǎn)：貯存壽命　出處：《河北工業(yè)大學(xué)》2015年碩士論文　論文類型：學(xué)位論文

【摘要】：密封式繼電器是一種常用的低壓電器元件,密封性良好,能夠承受高溫、低溫、輻射、振動(dòng)等各種惡劣環(huán)境,廣泛用于飛機(jī)、衛(wèi)星、火箭、導(dǎo)彈等及其相關(guān)配套設(shè)備中,更是航天繼電器的首選。隨著我國(guó)航天事業(yè)的迅速發(fā)展,對(duì)繼電器的可靠性有了更高的要求,應(yīng)運(yùn)而生的是壽命試驗(yàn)和壽命評(píng)估的新技術(shù)和新理論。密封式繼電器作為航天繼電器使用時(shí)長(zhǎng)期處于貯存狀態(tài),貯存可靠性和工作可靠性同等重要,為保證其壽命剖面各階段始終保持在備用激活狀態(tài),對(duì)繼電器貯存壽命進(jìn)行準(zhǔn)確預(yù)測(cè)有非常實(shí)際的意義。論文首先介紹了課題的研究背景及國(guó)內(nèi)外發(fā)展現(xiàn)狀,闡述了可靠性壽命加速試驗(yàn)原理及分類,并對(duì)密封式繼電器貯存退化參數(shù)進(jìn)行了小波閾值去噪處理。圍繞著密封式繼電器貯存壽命預(yù)測(cè)這一核心,本課題研究綜合環(huán)境應(yīng)力對(duì)密封式繼電器貯存壽命的影響,建立了兩種繼電器貯存退化參數(shù)預(yù)測(cè)模型。模型一為基于遺傳算法優(yōu)化BP神經(jīng)網(wǎng)絡(luò)的密封式繼電器貯存退化參數(shù)預(yù)測(cè)模型,模型二基于主元分析和RBF神經(jīng)網(wǎng)絡(luò)建立了繼電器的貯存退化參數(shù)預(yù)測(cè)模型。文中對(duì)多種算法進(jìn)行了介紹,并比較了算法的優(yōu)劣,對(duì)其存在的一些缺點(diǎn)進(jìn)行了改進(jìn)�；贛ATLAB進(jìn)行模型的搭建及仿真,分析預(yù)測(cè)結(jié)果,對(duì)各模型方法進(jìn)行誤差評(píng)價(jià),通過(guò)繼電器的退化模型預(yù)測(cè)常溫下繼電器的貯存壽命。
[Abstract]:Sealing relay is a kind of commonly used low-voltage electrical components, it has good sealing ability, and can withstand various bad environments such as high temperature, low temperature, radiation, vibration and so on. It is widely used in aircraft, satellite, rocket, missile and other related equipments. It is the first choice of space relay. With the rapid development of China's aerospace industry, the reliability of the relay has higher requirements. The new technology and theory of life test and life evaluation have emerged as the times require. The sealed relay is in the storage state for a long time when it is used as a spaceflight relay, so the storage reliability and the working reliability are equally important. In order to keep its life profile in the state of standby activation, it is very practical to predict the storage life of relay accurately. Firstly, this paper introduces the research background of the subject and the present situation of development at home and abroad. This paper describes the principle and classification of accelerated reliability life test, and carries out wavelet threshold de-noising for storage degradation parameters of sealed relays, which is centered on the prediction of storage life of sealed relays. In this paper, the effect of comprehensive environmental stress on the storage life of sealed relays is studied. Two kinds of relay storage degradation parameter prediction models are established. The first model is a sealed relay storage degradation parameter prediction model based on genetic algorithm optimization BP neural network. In the second model, based on principal component analysis and RBF neural network, the prediction model of relay storage degradation parameters is established. In this paper, several algorithms are introduced, and the advantages and disadvantages of the algorithms are compared. Based on MATLAB, the model is built and simulated, the prediction results are analyzed, the error of each model method is evaluated, and the storage life of relay at room temperature is predicted by the degradation model of relay.
【學(xué)位授予單位】：河北工業(yè)大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TM58

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相關(guān)期刊論文 前1條

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本文編號(hào)：1621632