發(fā)布時(shí)間：2018-03-07 06:40

  本文選題：真空滅弧室　切入點(diǎn)：電容器　出處：《電子科技大學(xué)》2015年碩士論文　論文類型：學(xué)位論文

【摘要】：隨著真空開關(guān)的廣泛應(yīng)用,真空開關(guān)投切電容器重燃問(wèn)題進(jìn)一步突顯,針對(duì)這個(gè)問(wèn)題,從90年代就提上日程開始研究,但是經(jīng)過(guò)了十多年的努力,至今投切電容器重燃也還是真空開關(guān)顯著的缺陷,與投切電容器組的低重燃率(零重燃)要求差距仍較大,可靠性較差。真空開關(guān)投切電容器組重燃問(wèn)題是當(dāng)前國(guó)內(nèi)真空開關(guān)行業(yè)亟待解決的主要問(wèn)題之一。本文通過(guò)對(duì)投切電容器用真空滅弧室重燃現(xiàn)象的特點(diǎn)進(jìn)行分析研究發(fā)現(xiàn),真空滅弧室的內(nèi)部電場(chǎng)分布不均,以及斷口的真空間隙擊穿是導(dǎo)致真空開關(guān)投切電容器組重燃的直接原因。本文首先簡(jiǎn)要回顧了國(guó)內(nèi)外真空滅弧室的發(fā)展歷史與現(xiàn)狀,綜述了真空滅弧室的基本設(shè)計(jì)理論和工藝方法,根據(jù)目前的發(fā)展水平與研究現(xiàn)狀、存在的幾個(gè)主要問(wèn)題,引出本文的研究?jī)?nèi)容與目標(biāo)。本研究按照正規(guī)產(chǎn)品設(shè)計(jì)的思路,給出40.5kV真空滅弧室設(shè)計(jì)的基本參數(shù),以此為基礎(chǔ)進(jìn)行模擬仿真分析,系統(tǒng)、全面地對(duì)40.5kV真空滅弧室內(nèi)部的各個(gè)關(guān)鍵零件進(jìn)行整體優(yōu)化設(shè)計(jì),運(yùn)用電磁場(chǎng)理論、有限元計(jì)算方法和最優(yōu)化理論,實(shí)現(xiàn)真空滅弧室電場(chǎng)結(jié)構(gòu)的優(yōu)化,減少擊穿弱點(diǎn),提高總體重燃臨界電場(chǎng)。電場(chǎng)結(jié)構(gòu)設(shè)計(jì)方面改變主屏蔽筒、端屏蔽罩、觸頭等內(nèi)部元件的幾何參數(shù),使滅弧室內(nèi)部電場(chǎng)分布更均勻。電容器組具有頻繁投切的特點(diǎn),真空開關(guān)在投切電容器組時(shí)由于質(zhì)量不穩(wěn)定,發(fā)生多次重燃產(chǎn)生高幅值重燃過(guò)電壓,導(dǎo)致電容器組大批損壞,產(chǎn)生電容器爆炸事故。本課題針對(duì)投切電容器組的特殊要求,40.5kV等級(jí)真空滅弧室切電容器問(wèn)題已成為當(dāng)今真空開關(guān)市場(chǎng)應(yīng)用的瓶頸。本課題重點(diǎn)研究如何改善40.5kV等級(jí)真空滅弧室的設(shè)計(jì)結(jié)構(gòu)和優(yōu)化制造工藝,目標(biāo)通過(guò)從真空滅弧室的結(jié)構(gòu)仿真與電場(chǎng)分析、關(guān)鍵零件材料選用、制造工藝以及后工序老煉處理等各方面分析和實(shí)驗(yàn),找出對(duì)滅弧室投切電容器的影響因素并采取措施,最后給出40.5kV高壓真空滅弧室的設(shè)計(jì)參數(shù)和后處理工藝,進(jìn)一步增強(qiáng)滅弧室的耐壓水平,提高滅弧室投切電容器的能力,降低滅弧室的重?fù)舸⿴茁?杜絕事故發(fā)生,保證電容器組的安全運(yùn)行。
[Abstract]:With the wide application of vacuum switch, the problem of capacitor reburning in vacuum switch is becoming more and more prominent. In view of this problem, it has been on the agenda since 90s, but after more than a decade of efforts, Up to now, switching capacitor reburning is still a significant defect of vacuum switch, which is still far from the requirement of low reburning rate (zero reburning) of switched capacitor banks. The reliability is poor. The reburning problem of vacuum switch switch capacitor banks is one of the main problems to be solved urgently in the vacuum switch industry at present. In this paper, the characteristics of the reburning phenomenon of vacuum interrupter for switching capacitors are analyzed and found. The uneven distribution of electric field in vacuum interrupter and the breakdown of vacuum gap on the fracture surface are the direct causes leading to the reburning of vacuum switch switched capacitor banks. Firstly, the development history and present situation of vacuum interrupter at home and abroad are briefly reviewed in this paper. The basic design theory and process method of vacuum interrupter are summarized. According to the present development level and research status, several main problems exist, the research contents and objectives of this paper are elicited. The basic parameters of the design of 40.5 kV vacuum interrupter are given, based on which the simulation and analysis are carried out. The key parts inside the 40.5 kV vacuum interrupter are comprehensively optimized and the electromagnetic field theory is used. Finite element method and optimization theory are used to optimize the electric field structure of vacuum interrupter, to reduce breakdown weakness, to improve the critical electric field of the whole reburning, to change the main shield tube and the end shield in the design of electric field structure. The geometric parameters of the contact and other internal components make the electric field distribution in the interrupter more uniform. The capacitor bank has the characteristics of frequent switching, and the vacuum switch is unstable in mass when switching on the capacitor bank. Multiple reburning results in high amplitude reburning overvoltage, which results in a large number of damage to capacitor banks. This subject has become a bottleneck in the application of vacuum switch in today's vacuum switch market. This subject focuses on how to improve 40.5 kV vacuum interrupter capacitor. The design structure and optimized manufacturing process of the vacuum interrupter, By analyzing and experimenting from the structural simulation and electric field analysis of vacuum interrupter, the material selection of key parts, the manufacturing process and the aging treatment of post-working procedure, the paper finds out the factors affecting the capacitor switching in the arc-extinguishing chamber and measures are taken. At last, the design parameters and post-treatment technology of 40.5 kV high voltage vacuum interrupter are given, which can further enhance the voltage level of the interrupter, improve the ability of switching capacitor, reduce the probability of rebreakdown and prevent accidents. Ensure safe operation of capacitor banks.
【學(xué)位授予單位】：電子科技大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TM561.5

【共引文獻(xiàn)】

相關(guān)期刊論文 前10條

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4 楊f，

本文編號(hào)：1578371