電觸點(diǎn)材料接觸電阻高精密測量技術(shù)
發(fā)布時間:2018-03-05 22:16
本文選題:電接觸 切入點(diǎn):觸點(diǎn)材料 出處:《電工技術(shù)學(xué)報(bào)》2014年01期 論文類型:期刊論文
【摘要】:電觸點(diǎn)材料是影響電氣與電子工程中電接觸可靠性的關(guān)鍵。本文綜合應(yīng)用了激勵電流斷續(xù)斬波技術(shù)、低噪低漂移弱信號調(diào)理技術(shù)和滑動窗口平均濾波技術(shù),設(shè)計(jì)并實(shí)現(xiàn)了接觸電阻的高精密測量,進(jìn)而應(yīng)用0.01級標(biāo)準(zhǔn)電阻和M22等級標(biāo)準(zhǔn)砝碼完成了測量系統(tǒng)的誤差分析。最后以典型平面AgCdO復(fù)合觸點(diǎn)材料完成了不同激勵電流條件下接觸電阻與接觸壓力間滯回特性的測試與分析,實(shí)驗(yàn)結(jié)果確定了接觸壓力和激勵電流對接觸電阻的影響規(guī)律。
[Abstract]:The electrical contact material is the key to affect the reliability of electrical contact in electrical and electronic engineering. In this paper, the technology of intermittent chopping of exciting current, low noise and low drift, weak signal conditioning and sliding window average filtering are used in this paper. The high precision measurement of contact resistance is designed and realized. The error analysis of the measurement system is completed by using the standard resistor of class 0.01 and the standard weight of grade M22. Finally, the hysteretic characteristic between contact resistance and contact pressure under different excitation current conditions is accomplished by using typical planar AgCdO composite contact material. Sex testing and analysis, The effect of contact pressure and excitation current on contact resistance is determined.
【作者單位】: 哈爾濱工業(yè)大學(xué)軍用電器研究所;北京時代之峰科技有限公司硬件開發(fā)部;桂林航天電子有限公司;
【基金】:國家自然科學(xué)基金(51007010,51377029)資助項(xiàng)目
【分類號】:TM934.1
【參考文獻(xiàn)】
相關(guān)期刊論文 前3條
1 劉幗巾,李文華,蔣棟;電器觸點(diǎn)接觸電阻測量裝置的研究[J];電測與儀表;2001年02期
2 李奎,李志剛,陸儉國;接觸電阻新型測量方法的研究[J];電氣開關(guān);1997年06期
3 熊經(jīng)先;朱p蓽,
本文編號:1572130
本文鏈接:http://sikaile.net/kejilunwen/dianlilw/1572130.html
最近更新
教材專著