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The Effects of Electrical Contacts Degradation on High Frequ

發(fā)布時(shí)間:2024-05-13 19:24
  射頻同軸連接器是射頻微波系統(tǒng)中必不可少的元件,它們是器件與器件、電路與電路、器件與電路之間信息交換的橋梁。連接器電接觸表面退化會(huì)影響其信號(hào)完整性。本文選取SMA射頻連接器作為研究對(duì)象,深入而全面地探討了電接觸表面退化對(duì)信號(hào)傳輸?shù)挠绊;诟g加速實(shí)驗(yàn),得到不同退化程度的同軸連接器樣本,通過分析連接器插針的退化表面形貌,建立接觸面的等效阻抗模型。根據(jù)連接器的結(jié)構(gòu)尺寸和材料參數(shù),在電磁場(chǎng)數(shù)值仿真軟件CST中建立帶有退化接觸表面的連接器3D電磁場(chǎng)模型,分析其S參數(shù)以及電流分布。基于傳輸線理論,建立同軸連接器分布參數(shù)等效電路,并在模型中加入退化接觸面等效阻抗模型,建立帶有退化接觸表面的連接器電路模型,通過ADS仿真電路模型,分析S參數(shù)。最后,通過矢量網(wǎng)絡(luò)分析儀測(cè)試退化連接器的S參數(shù),對(duì)所建立的電磁場(chǎng)模型、電路模型進(jìn)行驗(yàn)證,實(shí)驗(yàn)表明:實(shí)驗(yàn)數(shù)據(jù)與電磁場(chǎng)模型、電路模型得到的數(shù)據(jù)具有較好的一致性。本文的研究結(jié)果對(duì)深入理解電接觸退化對(duì)信號(hào)完整性的影響和故障診斷有著重要意義。

【文章頁數(shù)】:72 頁

【學(xué)位級(jí)別】:碩士

【文章目錄】:
Acknowledgements
Dedication
Abstract
摘要
List of Abbreviations
Chapter 1: Introduction and Literature Review
    1.1 Introduction
    1.2 Background Study
    1.3 Literature Review
    1.4 Research Study Contribution
    1.5 Thesis Report Organization
Chapter 2: Basic Research Foundation and Electrical Contacts Theory
    2.1 Introduction
    2.2 Basic Electrical Contact Principle
    2.3 Corrosion Mechanism and Types
        2.3.1 Gold Pore Corrosion Mechanism
    2.4 Metallographic Analysis of Pin
    2.5 Skin Effect and Skin Depth
    2.6 Summary
Chapter 3: Electromagnetic Field Simulation Model of SMA Connector
    3.1 Introduction
    3.2 Computer Simulation Technology (CST)
    3.3 Scattering Parameters
    3.4 3D Electromagnetic Model of Connector
    3.5 CST Simulation Model Results
        3.5.1 S Parameters Simulation Model Results
        3.5.2 3D Surface Current Simulation Model Results
    3.6 Voltage Standing Wave Ratio (VSWR)
    3.7 Summary
Chapter 4: Equivalent Circuit Impedance Model of Degraded Electrical Contact Surface
    4.1 Introduction
    4.2 Transmission Line Theory
    4.3 Equivalent Circuit Model Development
    4.4 ADS Circuit Model Simulation Results
    4.5 Summary
Chapter 5: Experimental Verification and Vector Network Analyzer Measurements
    5.1 Introduction
    5.2 Degraded SMA Connector Samples
    5.3 Vector Network Analyzer (VNA)
    5.4 Experimental VNA Results
    5.5 Comparison of Simulated and Measured Results
    5.6 Summary
Chapter 6: Conclusion and Future Recommendation Work
    6.1 Conclusion
    6.2 Future Recommendation Work
List of Publications
References



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