應(yīng)用于數(shù)字DC-DC中的ADC的研究與設(shè)計(jì)
[Abstract]:With the development of microelectronics technology, the demand of integrated circuits for power supply in electronic equipment is becoming higher and higher. Digital power management chip has become a hot spot of researchers. As a key circuit module, analog-to-digital converter (Analog to Digital Convert,ADC) determines the output voltage performance of digital DC-DC. It is of great significance to study the ADC that meets the performance requirements of digital DC-DC. Based on the analysis of the performance index of digital DC-DC, a window type Flash ADC. is realized according to the characteristics of narrow input range and high absolute precision of analog quantity which needs to be quantified. Firstly, the structure of traditional Flash ADC is analyzed. According to the requirements of BUCK type digital DC-DC, the design index and system structure of this paper ADC are determined. In order to reduce the scale of the circuit, the preamplifier structure is adopted. Using SMIC180nm process and Spectre matlab simulator, the circuit design and process angle simulation of window type FlashADC including preamplifier circuit, feedback operational amplifier, comparator and coding module are completed. By setting reasonable parameters and common-mode input voltage, when the amplitude of input voltage is 25.6mV, the high absolute precision of 1.6mV with the lowest effective bit (LSB) is realized by 4-bit ADC. Aiming at the problem that the misadjustment in preamplifier circuit will have a great influence on the circuit, the method of eliminating the misadjustment of preamplifier circuit is studied in detail. Through the simulation analysis of the relationship between substrate bias voltage and threshold voltage of MOS transistor, it is found that the threshold voltage of MOS transistor can be changed by adjusting the substrate bias voltage reasonably, and the misalignment can be eliminated. In the design, the operational amplifier input pair of the preamplifier circuit is designed in two separate wells to adjust their substrate bias voltage independently, and the digital signal controls the substrate voltage at the output end of the resistive partial voltage network. When the preamplifier circuit is misaligned, the relative substrate bias of the input to the tube is adjusted by successive approximation under the control of the digital signal, until the equivalent threshold of the input to the tube is equal, the offset is eliminated, and the calibration is completed. The misalignment of the circuit can be effectively eliminated by applying the preamplifier with offset voltage elimination to the window type FlashADC. On the basis of the overall system design and simulation, the layout design and post-simulation of FlashADC are completed. The results show that when the operating voltage is 3.3 V and the sampling frequency is 15MHz, the offset voltage is introduced into the input and then corrected by using the offset voltage elimination method proposed in this paper. The simulation results show that the effective bit number can reach 3.208-bit without the offset elimination technique, and the effective bit number can reach 3.793-bit and SNDR is 24.592dB, which is less than the ideal 25.84dB loss and meets the design requirements.
【學(xué)位授予單位】:西安理工大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2017
【分類號(hào)】:TN792;TM46
【參考文獻(xiàn)】
相關(guān)期刊論文 前4條
1 劉東海;韋忠善;鄧云;;一種10 bit雙通道流水線SAR ADC設(shè)計(jì)[J];電子器件;2016年04期
2 田德永;黃維超;;一種基于FLASH的混合式11位ADC設(shè)計(jì)[J];電子器件;2015年03期
3 張敏;張有濤;李曉鵬;陳新宇;楊磊;;4 bit相位量化ADC設(shè)計(jì)與實(shí)現(xiàn)[J];固體電子學(xué)研究與進(jìn)展;2014年03期
4 朱文舉;陳杉;楊銀堂;朱樟明;楊凌;;一種6位超高速CMOS FLASH A/D轉(zhuǎn)換器[J];微計(jì)算機(jī)信息;2008年26期
相關(guān)碩士學(xué)位論文 前5條
1 路祥;基于插值和均值技術(shù)的高速ADC的設(shè)計(jì)[D];電子科技大學(xué);2015年
2 龔劍;采用時(shí)域失調(diào)消除技術(shù)的FLASH ADC的研究與設(shè)計(jì)[D];電子科技大學(xué);2013年
3 楊波;一種高效率低功耗DC-DC降壓轉(zhuǎn)換芯片設(shè)計(jì)[D];電子科技大學(xué);2010年
4 牛祺;用于數(shù)字電源的并行模數(shù)轉(zhuǎn)換器的研究與設(shè)計(jì)[D];復(fù)旦大學(xué);2010年
5 朱文舉;基于0.18μm CMOS工藝的6位GS/s并行模數(shù)轉(zhuǎn)換器設(shè)計(jì)[D];西安電子科技大學(xué);2008年
,本文編號(hào):2250810
本文鏈接:http://sikaile.net/kejilunwen/dianlidianqilunwen/2250810.html