本文選題：太陽能電池板 + 表面形貌　； 參考：《鄭州大學(xué)》2017年碩士論文

【摘要】：太陽能電池板表面紋理是影響光電轉(zhuǎn)換效率的關(guān)鍵因素之一,通過對太陽能電池板表面微觀形貌的測量,對比不同的表面紋理參數(shù)與太陽能電池板光電轉(zhuǎn)換效率之間的關(guān)系,可以確定與光電轉(zhuǎn)換效率相關(guān)性較高的參數(shù),用于指導(dǎo)太陽能電池的生產(chǎn),有助于提高太陽能電池板光電效率。本文介紹了所設(shè)計的一套基于垂直掃描白光干涉技術(shù)的表面形貌測量儀,適用于太陽能電池板表面紋理測量。該形貌測量儀結(jié)構(gòu)原理是通過壓電陶瓷驅(qū)動柔性鉸鏈機構(gòu)帶動Mirau干涉顯微鏡垂直移動,改變Mirau干涉顯微鏡中參考光束和被測光束的光程差,實現(xiàn)對被測表面紋理的白光干涉掃描,CCD相機對每次垂直進給時的白光干涉條紋進行采集,圖像采集卡將采集信息傳送給PC機并進行處理。垂直位移通過雙衍射光柵計量裝置實現(xiàn)計量,動光柵與Mirau干涉鏡同步運動,相對靜光柵位移而引起激光干涉條紋光強變化,四象限光電陣列檢測激光干涉條紋光強信號轉(zhuǎn)換成電信號,經(jīng)調(diào)理電路調(diào)理,輸入STM32單片機進行辨向、細分與計數(shù),實現(xiàn)對Mirau干涉顯微鏡的垂直位移精確計量并將計量結(jié)果送入PC機。上位PC機將采集圖樣進行疊加得零級白光干涉條紋在垂直方向上的干涉位置分布,采用一定的干涉條紋提取算法對白光干涉條紋的最佳干涉位置進行提取,并對提取數(shù)據(jù)進行處理得到被測表面各被測點零光程差時的相對高度,進而獲取被測表面的微觀形貌,進一步進行微觀形貌參數(shù)評定。最后使用該測量儀對標準樣板進行了多組實驗,驗證了測量儀垂直進給位移計量的精度。該儀器可應(yīng)用于太陽能電池的實際生產(chǎn),指導(dǎo)光伏生產(chǎn)商對生產(chǎn)工藝和方法進行改進,提高光電轉(zhuǎn)換效率,對光伏產(chǎn)業(yè)的發(fā)展、資源節(jié)約和環(huán)境保護有著重要的意義。
[Abstract]:The surface texture of solar panels is one of the key factors affecting the photovoltaic conversion efficiency. By measuring the surface morphology of solar panels, the relationship between different surface texture parameters and photovoltaic conversion efficiency of solar panels is compared. The parameters which have a high correlation with the photoelectric conversion efficiency can be used to guide the production of solar cells and help to improve the photovoltaic efficiency of solar panels. This paper introduces a set of surface topography measuring instrument based on vertical scanning white light interferometry, which is suitable for surface texture measurement of solar panels. The structure principle of this instrument is that the flexure hinge mechanism is used to drive the vertical movement of the Mirau interference microscope, and the optical path difference between the reference beam and the measured beam in the Mirau interferometer is changed. The white light interference scanning CCD camera with measured surface texture is realized to collect the white light interference fringes at each vertical feed. The image acquisition card transmits the collected information to the PC and processes it. The vertical displacement is measured by double diffraction grating metering device. The moving grating and the Mirau interferometer move synchronously, which causes the laser interference fringe light intensity to change relative to the static grating displacement. The four quadrant photoelectric array detects the laser interference fringe light intensity signal to convert into the electric signal, after the conditioning circuit adjusts, inputs the STM32 single chip computer to distinguish the direction, subdivides and counts, The vertical displacement of Mirau interference microscope is accurately measured and the measurement results are sent to PC. The superposition of zero order white light interference fringes in vertical direction is carried out by PC, and the optimum interference position of white light interference fringes is extracted by certain interference fringes extraction algorithm. The relative height of the measured surface with zero optical path difference was obtained by processing the extracted data, and then the micro-topography of the measured surface was obtained, and the parameters of the micro-topography were evaluated. Finally, the instrument is used to carry out many experiments on the standard template, which verifies the accuracy of measuring the vertical feed displacement of the measuring instrument. The instrument can be applied to the actual production of solar cells, and guide photovoltaic manufacturers to improve the production process and methods, improve the efficiency of photovoltaic conversion, and have an important significance for the development of photovoltaic industry, resource conservation and environmental protection.
【學(xué)位授予單位】：鄭州大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2017
【分類號】：TM914.4

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