本文選題：LED燈具　切入點(diǎn)：加速壽命試驗(yàn)　出處：《中國(guó)科學(xué)院長(zhǎng)春光學(xué)精密機(jī)械與物理研究所》2017年博士論文

【摘要】：發(fā)光二極管(LED)是新一代照明光源,已被廣泛應(yīng)用于各照明領(lǐng)域。目前的LED壽命測(cè)試主要基于IES推薦標(biāo)準(zhǔn)進(jìn)行,LED照明產(chǎn)品的測(cè)試時(shí)間不少于6000小時(shí),這樣的測(cè)試時(shí)長(zhǎng)無(wú)法適應(yīng)市場(chǎng)需求。對(duì)LED產(chǎn)品加載高于使用條件的環(huán)境應(yīng)力是縮短壽命試驗(yàn)時(shí)間的有效手段。LED燈具在不同的應(yīng)用環(huán)境中所受到的環(huán)境應(yīng)力不同,但是溫度應(yīng)力和電應(yīng)力是始終存在的共性應(yīng)力,因此研究LED燈具在溫度應(yīng)力和電應(yīng)力條件下的加速壽命試驗(yàn)方法對(duì)實(shí)現(xiàn)LED燈具的快速壽命評(píng)估和可靠性分析具有重要意義。本文研究了基于Bayes估計(jì)的LED燈具電應(yīng)力加速壽命測(cè)試方法。首先搭建電應(yīng)力加速老化測(cè)試系統(tǒng),分別采用Bayes估計(jì)法和中位秩法計(jì)算累積失效概率,對(duì)比威布爾分布的參數(shù)最小二乘估計(jì)精度,選用精度更高的Bayes估計(jì)法結(jié)合逆冪律模型對(duì)LED燈具在正常使用條件下的壽命和可靠性進(jìn)行評(píng)估,在失效概率為1%,5%,10%和63.2%時(shí),樣品燈具的壽命分別為5677小時(shí),8612小時(shí),10353小時(shí)和18407小時(shí)。分析了在電應(yīng)力老化過(guò)程中輸出電流變化,結(jié)果表明輸出電流的變化對(duì)光通量變化的影響小于0.35%,可以忽略驅(qū)動(dòng)電路老化的因素。研究了LED燈具電-熱雙應(yīng)力加速壽命測(cè)試方法。首先采用短周期的雙應(yīng)力交叉步進(jìn)試驗(yàn)確定加速應(yīng)力極限,并選取合適的應(yīng)力組合進(jìn)行老化試驗(yàn);其次,選用“小電流”正向電壓法測(cè)試LED樣品燈具在各加速應(yīng)力組合下的結(jié)溫;再次,采用多元線性回歸分析進(jìn)行艾林模型的參數(shù)估計(jì),并根據(jù)參數(shù)估計(jì)結(jié)果評(píng)估了樣品燈具的可靠性。結(jié)果表明,在失效概率為1%,5%,10%和63.2%時(shí),壽命值分別為5824小時(shí),8692小時(shí),10375小時(shí)和18032小時(shí),與電應(yīng)力加速試驗(yàn)對(duì)比,誤差分別為2.59%,0.93%,0.21%和2.04%。最后對(duì)樣品的顏色退化進(jìn)行分析表明,熒光粉發(fā)光效率的退化是該樣品失效的主要因素。根據(jù)燈具光通量的e指數(shù)衰減,給出了在失效概率50%時(shí),260V電壓和300V電壓下光衰速率和結(jié)溫之間的阿倫紐斯方程。研究了加速壽命測(cè)試中在線測(cè)試和非在線測(cè)試的差異。提出一種模擬電應(yīng)力加速壽命測(cè)試中在線測(cè)量和非在線測(cè)量的方法,采用與積分球內(nèi)燈具座連接的可調(diào)穩(wěn)壓電源實(shí)現(xiàn)光色度學(xué)參數(shù)在線測(cè)試和非在線測(cè)試的轉(zhuǎn)換,分析兩種測(cè)試對(duì)可靠性預(yù)測(cè)的影響。結(jié)果表明,在大部分情況下,在線測(cè)量得到的光通量衰減數(shù)據(jù)更符合e指數(shù)模型,同時(shí),在線測(cè)量時(shí)的光通量衰減總是略小于非在線測(cè)量。失效概率1%,5%,10%,時(shí),預(yù)測(cè)壽命的相對(duì)誤差分別為5.8%,4.2%,3.5%�；趖檢驗(yàn)的方法,研究了LED燈具樣本的相關(guān)色溫變化和色漂移在兩種測(cè)試中的差異,在線測(cè)試的色溫總是大于非在線測(cè)試的色溫,但是二者的色溫變化率和色漂移Du'v'沒(méi)有顯著差異。本文對(duì)LED燈具進(jìn)行了電應(yīng)力和電-熱雙應(yīng)力加速壽命測(cè)試,取得了一定的進(jìn)展,對(duì)以后其他種類LED燈具的快速壽命評(píng)估和可靠性分析具有一定的指導(dǎo)作用。
[Abstract]:Light-emitting diode (LED) is a new generation of lighting source, which has been widely used in various lighting fields. At present, the life test of LED is mainly based on the recommended standard of IES, and the testing time of LED lighting products is not less than 6000 hours. The length of the test is not suitable for the market. Loading environmental stress above the operating conditions on LED products is an effective means of shortening life test time. Led lamps are subjected to different environmental stresses in different application environments. But the thermal stress and the electric stress are the common stresses that always exist. Therefore, it is very important to study the accelerated life test method of LED lamps under the condition of temperature stress and electric stress to realize the rapid life evaluation and reliability analysis of LED lamps. This paper studies the LED lamps' electrical response based on Bayes estimation. Force accelerated life test method. Firstly, an electric stress accelerated aging test system is built. The cumulative failure probability is calculated by Bayes estimation method and median rank method, and the accuracy of parameter least square estimation of Weibull distribution is compared. The higher precision Bayes estimation method combined with the inverse power law model is used to evaluate the life and reliability of LED lamps under normal service conditions. When the failure probability is 10% and 63.2% respectively, The lifetime of the sample lamps is 5677 hours, 8612 hours, 10353 hours and 18407 hours, respectively. The output current changes during electric stress aging are analyzed. The results show that the effect of the output current on the flux change is less than 0.35, and the aging factor of the driving circuit can be ignored. The accelerated life test method of electric-thermal double stress for LED lamps is studied. First, the short period double stress intersection is adopted. The accelerated stress limit is determined by the fork step test. The appropriate stress combination is selected for aging test. Secondly, the "small current" forward voltage method is used to test the junction temperature of LED sample lamps under each accelerated stress combination. Thirdly, the parameter estimation of Arryn model is carried out by multivariate linear regression analysis. The reliability of the sample lamps is evaluated according to the results of parameter estimation. The results show that when the failure probability is 10% and 63.2%, the life expectancy is 5824 hours / 8692 hours / 10375h and 18032 hours respectively, which is compared with the electric stress accelerated test. The error is 2.590.93% and 2.044.At last, the analysis of the color degradation of the sample shows that the degradation of luminous efficiency of phosphor is the main factor of the failure of the sample. According to the e exponent attenuation of luminous flux of luminaire, The Arrhenius equation between light decay rate and junction temperature at 260V voltage and 300V voltage at 50 failure probability is given. The difference between on-line and off-line measurement in accelerated life testing is studied. A simulated electric stress acceleration is proposed. Methods of online and off-line measurement in life testing, An adjustable power supply connected with the lamp seat in the integral sphere is used to realize the conversion between on-line and off-line testing of optical chromaticity parameters, and the influence of the two tests on reliability prediction is analyzed. The results show that, in most cases, The luminous flux attenuation data obtained by on-line measurement are more in line with the e exponent model, and the flux attenuation in on-line measurement is always slightly smaller than that in the off-line measurement. The failure probability is 1 / 5 / 10, and the relative error of predicting lifetime is 5.842 / 3.5. based on the method of t test, In this paper, the difference of the color temperature variation and the color drift between the samples of LED lamps and lanterns is studied. The color temperature of on-line testing is always larger than that of off-line testing. However, there is no significant difference between the color temperature change rate and color drift Duv'. In this paper, electric stress and electric-thermal double stress accelerated life test of LED lamps have been carried out, and some progress has been made. It can be used to evaluate and analyze the reliability of other kinds of LED lamps.
【學(xué)位授予單位】：中國(guó)科學(xué)院長(zhǎng)春光學(xué)精密機(jī)械與物理研究所
【學(xué)位級(jí)別】：博士
【學(xué)位授予年份】：2017
【分類號(hào)】：TM923.34

【相似文獻(xiàn)】

相關(guān)期刊論文 前4條

1 ;LED加速壽命和可靠性試驗(yàn)[J];中國(guó)照明電器;2012年09期

2 姚靈林;王深;;LED控制裝置加速壽命評(píng)價(jià)思路[J];中國(guó)照明電器;2014年06期

3 馬志宏;李金國(guó);;高加速壽命可靠性試驗(yàn)HALT技術(shù)研究[J];環(huán)境技術(shù);2009年06期

4 ;[J];;年期

相關(guān)博士學(xué)位論文 前1條

1 王堯;LED照明燈具電—熱應(yīng)力加速壽命測(cè)試方法的研究[D];中國(guó)科學(xué)院長(zhǎng)春光學(xué)精密機(jī)械與物理研究所;2017年

，

本文編號(hào)：1679136