本文關(guān)鍵詞： 壽命模型 功率循環(huán) Weibull分布 Arrhenius廣延指數(shù)模型 IGBT　出處：《電工技術(shù)學(xué)報(bào)》2016年24期 　論文類型：期刊論文

【摘要】：以器件功率循環(huán)為基礎(chǔ),在疲勞損傷理論基礎(chǔ)上建立功率器件壽命模型,以提高變流器的運(yùn)行可靠性,為功率變流器的檢修維護(hù)提供理論基礎(chǔ)。給出了器件壽命預(yù)測(cè)模型的使用價(jià)值和意義,通過(guò)分析功率器件失效機(jī)理,設(shè)計(jì)了功率循環(huán)實(shí)驗(yàn)平臺(tái)和老化實(shí)驗(yàn)方案,闡述了老化實(shí)驗(yàn)原理并給出了老化參數(shù)提取方法。利用Weibull分布建立了器件的一維壽命模型并分析了該模型的優(yōu)缺點(diǎn),提出了改進(jìn)的器件三維壽命模型,通過(guò)對(duì)比、分析證明了該模型的準(zhǔn)確性,得到的Arrhenius廣延指數(shù)模型更能體現(xiàn)器件壽命分布。
[Abstract]:On the basis of device power cycle and fatigue damage theory, the life model of power device is established to improve the reliability of converter. This paper provides a theoretical basis for the maintenance and repair of power converters. The use value and significance of the life prediction model of power converters are given. By analyzing the failure mechanism of power devices, a power cycle experimental platform and an aging experimental scheme are designed. This paper expounds the principle of aging experiment and gives the method of extracting aging parameters. The one-dimensional lifetime model of the device is established by using Weibull distribution, the advantages and disadvantages of the model are analyzed, and the improved three-dimensional lifetime model of the device is put forward. The accuracy of the model is proved, and the Arrhenius extended exponent model can better reflect the lifetime distribution of the device.
【作者單位】： 輸配電裝備及系統(tǒng)安全與新技術(shù)國(guó)家重點(diǎn)實(shí)驗(yàn)室(重慶大學(xué));華南理工大學(xué)電力學(xué)院;
【基金】：國(guó)家自然科學(xué)基金(51477019) 國(guó)家“111”計(jì)劃(B08036) 中央高�；究蒲袠I(yè)務(wù)費(fèi)(CDJZR12150074) 國(guó)家重點(diǎn)基礎(chǔ)研究發(fā)展計(jì)劃(973計(jì)劃)(2012CB25200)資助項(xiàng)目
【分類號(hào)】：TM46

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1 方鑫;周雒維;姚丹;杜雄;孫鵬菊;吳軍科;;IGBT模塊壽命預(yù)測(cè)模型綜述[J];電源學(xué)報(bào);2014年03期

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本文編號(hào)：1551793