故障樹分析在半導體封裝與測試研發(fā)項目風險定量評價中的應用
[Abstract]:With the development of China's economy, semiconductor industry plays an increasingly important role in China. Consumer electronics, energy vehicles, semiconductor lighting, aerospace and so on can not be separated from semiconductors. According to the China Semiconductor Industry Association, sales of packaging and testing in China's integrated circuit industry increased to double digits in 2014 from a year earlier. As the end of the integrated circuit industry chain, the semiconductor packaging and testing plays an extremely important role for the entire semiconductor industry chain. The research and development of semiconductor packaging and testing plays an important role in semiconductor packaging and testing enterprises. At present, the research and development of semiconductor packaging and testing is influenced by many factors, such as design, process, raw materials, environment and so on. Therefore, the risk quantitative evaluation of semiconductor packaging and testing R & D projects is particularly critical. In this paper, the risk quantitative evaluation of semiconductor packaging and test R & D project is carried out by using the method of fault tree principle analysis and case study, taking the DFN8x8 R & D project as a case. Firstly, the basic concepts of semiconductor packaging and testing R & D project and risk and fault tree analysis are introduced. Second, the company's own business situation and problems. Then, taking the DFN8x8 R & D project as a case, the risk of DFN8x8 R & D project is evaluated quantitatively based on fault tree analysis, and comprehensive evaluation is made from the aspects of fault tree establishment, qualitative analysis, quantitative analysis and so on. The corresponding preventive measures are put forward for the risk of high probability importance. Finally, the process of implementing preventive measures with high probabilistic importance is analyzed and its effect is tested. This paper has important practical significance for DFN8x8 R & D project success rate, R & D time, economic benefit, resource waste and so on. At the same time, it can also be used for reference for semiconductor packaging and testing other R & D projects.
【學位授予單位】:華東理工大學
【學位級別】:碩士
【學位授予年份】:2017
【分類號】:F273.1;F426.6
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