本文選題：矢量方向　切入點：相位特征　出處：《聲學(xué)學(xué)報》2017年04期

【摘要】：常規(guī)矢量全聚焦成像僅利用檢測信號的幅值信息,其成像質(zhì)量受噪聲、柵瓣和旁瓣等的影響大。綜合利用檢測信號的幅值和相位信息,本文提出兩種相位加權(quán)的矢量全聚焦成像方法。首先,對全矩陣數(shù)據(jù)的相位信息進行分析,提取出兩種相位特征參數(shù):相位一致因子(Phase Coherence Factor:PCF)和極性一致因子(Sign Coherence Factor:SCF);然后,將全陣列劃分為若干子陣列,分別利用兩種相位特征參數(shù)對各個子陣列的成像幅值進行加權(quán),求取加權(quán)幅值特征向量;最后,對所有子陣列的加權(quán)特征向量進行合成,得到兩種加權(quán)的矢量全聚焦成像,并從中提取出裂紋方向及尺寸等特征信息。將三種矢量全聚焦成像方法應(yīng)用于不同缺陷檢測仿真及實驗驗證,結(jié)果表明,3種方法均可以實現(xiàn)缺陷方向識別與長度定量測量;但相位加權(quán)矢量全聚焦成像效果明顯優(yōu)于常規(guī)矢量全聚焦成像結(jié)果,其成像信噪比及分辨率更高,缺陷角度及長度測量結(jié)果更準確。本文研究工作為缺陷無損評價提供了可行的技術(shù)手段。
[Abstract]:Conventional vector full-focus imaging uses only the amplitude information of the detection signal, and its imaging quality is greatly affected by noise, gate lobe and sidelobe, etc. In this paper, two phase-weighted vector full-focus imaging methods are proposed. Firstly, the phase information of the full matrix data is analyzed, and two kinds of phase characteristic parameters are extracted: phase consistency factor (Coherence Coherence: PCF) and polarity consistency factor (sign Coherence Factor: SCF); then, The whole array is divided into several sub-arrays, and the imaging amplitudes of each sub-array are weighted by two kinds of phase characteristic parameters, and the weighted amplitude eigenvectors are obtained. Finally, the weighted Eigenvectors of all sub-arrays are synthesized. Two kinds of weighted vector full focus imaging are obtained, and the characteristic information of crack direction and size are extracted from them. The three vector full focus imaging methods are applied to different defect detection simulation and experimental verification. The results show that all of the three methods can realize defect direction recognition and length quantitative measurement, but the phase-weighted vector full-focus imaging is superior to conventional vector full-focus imaging, and its signal-to-noise ratio and resolution are higher. The results of defect angle and length measurement are more accurate.
【作者單位】： 北京工業(yè)大學(xué)機械工程與應(yīng)用電子技術(shù)學(xué)院;北京工業(yè)大學(xué)北京市精密測控技術(shù)與儀器工程技術(shù)研究中心;
【基金】：國家自然科學(xué)基金項目(11572010,11272017) 國家重點研發(fā)計劃項目(2016YFF0203002)資助
【分類號】：TB559

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