本文選題：束流剖面測量 + 非攔截式束流診斷��； 參考：《中國科學技術大學》2017年博士論文

【摘要】：束流剖面測量作為加速器束流診斷系統(tǒng)的一個重要組成部分,對加速器物理的空間電荷效應、束流橫向冷卻等研究具有重要意義。同時在加速器正常運行中,束流剖面的準確測量對加速器不同位置的束流橫向匹配、束流尺寸控制、機器參數(shù)優(yōu)化等也至關重要。束流剖面測量按對束流的阻擋程度又可以分為攔截式與非攔截式兩種測量手段,相對于傳統(tǒng)攔截式的剖面診斷工具,非攔截式測量方式可以從容應對強流剖面測量,還可以實現(xiàn)剖面實時監(jiān)測。其中,剩余氣體電離(Ionization Profile Monitor)與氣體誘導熒光(Beam Induced Fluorescence)探測器作為國際上常用的非攔截式剖面診斷設備,非常適合于質子及重離子類型同步加速器和強流傳輸線的剖面測量應用。國內關于IPM與BIF探測器的研究起步較晚,兩種探測器在國內加速器設施的剖面診斷中均未實現(xiàn)應用。為了配合蘭州重離子加速器(HIRFL)束流診斷系統(tǒng)的改造升級,應對即將到來的中國加速器驅動嬗變研究裝置(CIADS)與強流重離子加速器設施(HIAF)的強流剖面測量需求,本課題關于兩種非攔截式IPM與BIF束流剖面探測器的研制是極其迫切與必要的。非攔截式IPM與BIF束流剖面探測器都是基于束流帶電粒子與剩余氣體的電離與激發(fā)理論。IPM探測器利用束流粒子與真空管道內剩余氣體分子的電離作用,以電離產(chǎn)物的離子-電子對作為測量信號,在探測器內置靜電場框架產(chǎn)生的均勻靜電場引導與加速下,信號粒子到達微通道板進行倍增放大,放大后的電子由靜電場繼續(xù)引導至磷光屏-相機構成的光學系統(tǒng),或者陽極-電子學系統(tǒng)進行獲取。氣體誘導熒光BIF探測器是利用束流粒子使稀有氣體分子電離或激發(fā),氣體分子在隨后的退激發(fā)回到基態(tài)過程中輻射的可見光波段光子作為測量信號,微弱熒光信號通過圖像增強組件進行一系列光子轉換及增強過程,最后透過觀察窗被外置相機進行光學獲取。兩種非攔截式剖面探測器基于共同的束流粒子與剩余氣體相互作用機制,測量信號載體又略有不同各具特色,兩者共同在強流剖面測量應用中發(fā)揮著重要價值。論文介紹了國際上IPM與BIF探測器的研究背景、發(fā)展歷程和應用現(xiàn)狀,分析了兩種探測器的基本原理、工作流程以及影響因素,如靜電場非均勻性,空間電荷效應,雜散電子干擾等。論文的重點是對IPM與BIF探測器的設計制造、束流實驗和改良優(yōu)化等內容進行詳細介紹。經(jīng)過大量理論調研與工程實踐,IPM與BIF探測器均成功完成了模擬設計和離線測試,并在HIRFL不同區(qū)域進行了束流實驗。BIF探測器是應加速器驅動次臨界嬗變系統(tǒng)(ADS)直線注入器Ⅱ的強流剖面測量需求而研制,探測器研制完成后在TR2超重實驗終端進行了剖面測量實驗,實驗研究了不同工作氣壓下探測器的剖面測量結果,并加裝濾光片進行了氦氣退激光譜研究。實驗中通過與單絲剖面掃描結果對比驗證了BIF探測器具有較好的準確性與可靠性,且空間分辨率達到115 μm,可以滿足ADS以及未來CIADS強流剖面測量的應用需求。IPM探測器是應HIRFL-CSR的實時非攔截式剖面測量需求而研制,探測器建成之后在SSC-Linac進行了束流實驗,其測量結果與單絲掃描剖面測量吻合極好,實驗中還通過更改不同的電壓設置,研究了靜電場均勻性對IPM探測器的測量影響。目前IPM探測器經(jīng)過靜電場分壓方式改良后已經(jīng)安裝應用于CSRm,并成功實現(xiàn)對束流剖面的實時監(jiān)測,其空間分辨率高達55 μm,可以滿足CSRm電子冷卻后極冷、極小發(fā)射度束流的剖面測量需求。論文的最后還提出了一種全新緊湊型結構的IPM探測器設計,該設計利用一套IPM探測器能夠實現(xiàn)束流橫向水平與垂直兩個方向的剖面測量功能,從而很大節(jié)省剖面測量的空間與經(jīng)費,對于未來CIADS超導直線這類空間緊缺型加速器的剖面診斷具有重大實用價值。
[Abstract]:As an important part of the accelerator beam diagnosis system, beam profile measurement is of great significance to the study of the space charge effect of accelerator physics, beam transverse cooling and so on. At the same time, the accurate measurement of the beam profile in the normal operation of the accelerator has the transverse matching of the beam flow in the accelerator position, the beam size control, and the machine. The parameter optimization is also essential. The beam profile measurement can be divided into two kinds of interceptor and non interceptor measure. Compared with the traditional interceptor profile diagnosis tool, the non interceptor measurement method can deal with the strong current profile, and can also realize the real-time monitoring of the section. Ionization Profile Monitor and gas induced fluorescence (Beam Induced Fluorescence) detectors are widely used as non interceptor section diagnostic equipment in the world. It is very suitable for the profile measurement applications of proton and heavy ion type synchrotron and strong current transmission line. The domestic research on IPM and BIF detector started late, two kinds of exploration. In order to match the upgrading of the Lanzhou heavy ion accelerator (HIRFL) beam diagnostic system, we should meet the needs of the forthcoming China accelerator driven transmutation research device (CIADS) and the strong current heavy ion accelerator facility (HIAF), the two species of this project, in order to meet the needs of the strong current profile measurement of the forthcoming Chinese accelerator drive transmutation device (CIADS) and the strong current heavy ion accelerator facility (HIAF). The development of the non interceptor IPM and the BIF beam profile detector is extremely urgent and necessary. Both the non interceptor IPM and the BIF beam profile detector are based on the ionization and excitation theory of the beam charged particles and the remaining gases, the ionization of the beam particles and the residual gas in the vacuum pipeline, and the ions of the ionization products. The electron pair is used as a measuring signal. Under the guidance and acceleration of the uniform electrostatic field produced by the built-in electrostatic field frame of the detector, the signal particles reach the microchannel plate multiplier and magnify. The amplified electrons continue to be guided by the electrostatic field to the optical system composed of the phosphor camera or the anode electronics system. The gas induced fluorescence BIF is obtained. The detector uses the beam particles to ionize or excite the rare gas molecules. The gas molecules are radiated in the visible light band as the measurement signal during the subsequent return to the ground state, and the weak fluorescence signals are converted and enhanced through the image enhancement component. Finally, the observation window is carried out by an external camera. Optical acquisition. Two kinds of non interceptor section detectors are based on the interaction mechanism of the common beam particle and the residual gas, and the signal carrier is slightly different. Both of them play an important role in the application of the strong current profile measurement. The paper introduces the research background, the development process and the application of the IPM and BIF detectors in the world. The basic principles, work flow and influencing factors of the two kinds of detectors, such as static electric field inhomogeneity, space charge effect, and stray electronic interference, are analyzed. The emphasis is on the design and manufacture of IPM and BIF detectors, beam experiment and improvement and optimization. After a large number of theoretical research and engineering practice, IPM and BI The F detector successfully completed the simulation design and off-line testing, and carried out the beam experiment in different regions of the HIRFL. The.BIF detector was developed by the accelerator driven subcritical transmutation system (ADS) linear injector II. After the development of the detector, a section measurement experiment was carried out at the TR2 overweight experimental terminal. The results of the profile measurement of the detector at different working pressure are studied and the helium gas regression spectrum is studied with a filter. The experiment shows that the BIF detector has good accuracy and reliability, and the spatial resolution reaches 115 mu m, which can satisfy the ADS and the future CIADS strong current profile measurement. The.IPM detector is developed for the real-time non intercepting profile measurement requirement of HIRFL-CSR. After the detector is built, the beam experiment is carried out in SSC-Linac. The measurement results are in good agreement with the monofilament scanning profile measurement. In the experiment, different voltage settings are changed, and the measurement of the uniformity of the electrostatic field to the IPM detector is also studied. At present, the IPM detector has been installed and applied to CSRm after the improvement of the electrostatic field partial pressure, and has successfully realized the real-time monitoring of the beam profile. Its spatial resolution is up to 55 u m, which can meet the requirements of the CSRm electron cooling after cooling and the minimum emission beam profile measurement. Finally, a new compact junction is also proposed. The design of IPM detector is designed. This design uses a set of IPM detectors to realize the cross section horizontal and vertical two direction profile measurement functions, thus greatly saving the space and funds of the profile measurement, and is of great practical value for the future section diagnosis of the space tight accelerator like CIADS superconducting straight line.

【學位授予單位】：中國科學技術大學
【學位級別】：博士
【學位授予年份】：2017
【分類號】：TL507

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