數(shù)字微鏡哈達(dá)瑪光譜儀譜線彎曲的分析與修正
發(fā)布時(shí)間:2018-03-17 04:04
本文選題:光譜儀 切入點(diǎn):光譜修正 出處:《光譜學(xué)與光譜分析》2016年02期 論文類型:期刊論文
【摘要】:由于數(shù)字微鏡(digital micro-mirror device,DMD)哈達(dá)瑪變換光譜儀其成本低,光能利用率高及無運(yùn)動(dòng)部件等優(yōu)勢,逐漸成為光譜儀領(lǐng)域的研究重點(diǎn)。研制了一款基于DMD的哈達(dá)瑪變換光譜儀。為了解決光譜儀譜線彎曲造成的光譜分辨率下降的問題,對基于DMD的哈達(dá)瑪變換光譜儀中的譜線彎曲所引起的譜帶混疊進(jìn)行了分析。首先,導(dǎo)出了譜帶混疊與譜線彎曲的關(guān)系式。然后,提出了兩個(gè)過程來解決譜帶混疊,一是通過調(diào)整DMD編碼條紋,使DMD所編碼的譜帶最大限度地與標(biāo)準(zhǔn)譜帶重合;二是通過數(shù)據(jù)處理對譜帶混疊進(jìn)行修正。最后,通過對譜線曲率半徑為5.8×10~4,7.8×10~4和9.7×10~4μm等六種情況下譜帶混疊進(jìn)行了分析與修正,擬合出光譜混疊和修正效果與譜線曲率半徑的關(guān)系。結(jié)果表明:對于不同程度的譜線彎曲經(jīng)過這兩個(gè)過程修正后,分辨率都會改善到接近光學(xué)系統(tǒng)的分辨率,說明這兩個(gè)過程對修正譜線彎曲具有普適性、并且方法簡單、有效。
[Abstract]:Because of the advantages of digital micromirror digital micro-mirror device) Hadamard transform spectrometer with low cost, high utilization ratio of light energy and no moving parts, etc. A new type of Hadamard transform spectrometer based on DMD has been developed. In order to solve the problem of spectral resolution decline caused by spectral line bending of spectrometer, The spectral band aliasing caused by spectral line bending in Hadamard transform spectrometer based on DMD is analyzed. Firstly, the relationship between spectral band aliasing and spectral line bending is derived. Then, two processes are proposed to solve the spectral band aliasing. First, by adjusting the DMD coding stripes, the spectral bands encoded by DMD are overlapped with the standard bands to the maximum extent; secondly, the aliasing of spectral bands is corrected by data processing. Finally, The spectral band aliasing is analyzed and corrected under the six conditions of 5.8 脳 10 ~ (-1) ~ 47.8 脳 10 ~ (4) 渭 m and 9.7 脳 10 ~ (4) 渭 m. The relationship between spectral aliasing and correction effect and the curvature radius of spectral line is fitted. The results show that the resolution of different degrees of curve bending can be improved to the resolution close to that of optical system after the correction of these two processes. It is shown that these two processes are universal for correcting spectral line bending, and the method is simple and effective.
【作者單位】: 中國科學(xué)院長春光學(xué)精密機(jī)械與物理研究所;中國科學(xué)院大學(xué);
【基金】:國家自然科學(xué)基金重點(diǎn)項(xiàng)目(61137001) 國家重大科學(xué)儀器設(shè)備開發(fā)專項(xiàng)(2013YQ140517)資助
【分類號】:TH744.1
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