本文選題：散射 + 尺寸可比��； 參考：《物理學(xué)報》2017年09期

【摘要】：為實現(xiàn)利用光學(xué)方式對微納尺度粒子性質(zhì)的研究,探討了亞微米線及亞微米球?qū)怆姶挪ǖ纳⑸湫?yīng).微納米尺度粒子的光學(xué)散射,散射粒子尺寸與入射光波長尺寸可滿足米氏(Mie)散射條件.利用Matlab數(shù)值模擬的方式,將分析結(jié)果以模擬圖的形式清晰地展現(xiàn)出來.滿足尺寸條件的層狀粒子以及任意多個散射粒子存在時對電磁波的散射都可采用Mie散射分析方法,并且針對多粒子散射,分析了散射體位于不同位置時對散射造成的影響.通過分析光學(xué)散射光場相關(guān)的微分散射截面及近場散射電磁場分布,可得出散射光場隨散射角度的變化趨勢,以及散射光場受各類因素的影響,包括入射光偏振態(tài)、散射粒子尺寸、散射粒子結(jié)構(gòu)及粒子構(gòu)成層數(shù)、散射粒子數(shù)量等的影響,也包括一些隱含因素對散射光場的影響,如散射粒子與周圍介質(zhì)的相對折射率.本文的科學(xué)意義體現(xiàn)在:與入射光波長尺寸可比的亞微米尺度的粒子,可用作傳感器,對于其位移的探測可通過光學(xué)方式來實現(xiàn),而由于粒子本身特性對散射光的影響具有一定的參考價值,從而使通過光學(xué)方式對機械位移的讀出具有更高準(zhǔn)確度.研究結(jié)果對于光學(xué)方式探測亞微米線機械振動具有指導(dǎo)意義.
[Abstract]:In order to study the properties of micro- and nanoscale particles in optical mode, the scattering effects of submicron lines and submicron spheres on optical electromagnetic waves are discussed. The size of scattering particles and the length of incident light can satisfy the scattering condition of MieS. By using Matlab numerical simulation, the analysis results are clearly presented in the form of simulation diagram. The scattering of electromagnetic waves by layered particles and any number of scattering particles in the presence of the size condition can be analyzed by Mie scattering method. The effect of scattering body position on scattering is analyzed for multi-particle scattering. By analyzing the differential scattering cross section of optical scattering light field and the distribution of near-field scattering electromagnetic field, the variation trend of scattering light field with scattering angle is obtained, and the scattering light field is affected by various factors, including the polarization state of incident light. The effects of the size of scattering particles, the structure of scattered particles, the number of layers of scattered particles and the number of scattered particles on the scattering light field, such as the relative refractive index of scattering particles and surrounding media, are also included in the influence of the size of scattered particles, the number of scattered particles and the number of scattered particles. The scientific significance of this paper lies in the fact that submicron particles, comparable to the length of incident light, can be used as sensors, and their displacement can be detected by optical means. Due to the influence of particle properties on scattering light, the readout of mechanical displacement through optical mode has higher accuracy. The results are useful for the optical detection of submicron line mechanical vibration.
【作者單位】： 中國科學(xué)院強磁場科學(xué)中心;中國科學(xué)技術(shù)大學(xué);
【基金】：中國科學(xué)院強磁場科學(xué)中心薛飛研究員提供的科研環(huán)境與資金支持
【分類號】：O436.2
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本文編號：1840215