TD-LTE基站衰落自動化測試系統(tǒng)的設計與測試
[Abstract]:The second and third generation mobile communication technology has been deeply into people's life, office, entertainment, as the fourth generation of mobile communication technology, the quality and reliability of the LTE base station has been paid more and more attention, especially the fading performance of the TD-LTE base station. Because the TD-LTE base station has many testing tasks, more hardware interfaces, rapid change of requirements, various environments and many test terminals, etc. The traditional manual testing techniques and methods used by test engineers can not meet the challenge of TD-LTE base station fading test, nor can they manage the operation flow of TD-LTE base station fading test, nor can they meet the needs of base station fading test. EASYTEST, a testing platform developed and provided by Shanghai Bell Company, is a universal tool, which provides UMTS and LTE integrated test automation solution .EASYTEST test platform has been widely used in the basic function testing of TD-LTE base station. But the TD-LTE base station fading automation test is still in the exploration stage, and the requirement of the fading automation test is not unified. How to establish and perfect a TD-LTE automated test system which can be effectively automated is an urgent problem to be solved in TD-LTE base station fading test. Based on the principle of TD-LTE base station fading and EASYTEST technology, an automatic test system based on TD-LTE base station fading is designed in this paper. Firstly, this paper analyzes the requirements of TD-LTE base station fading automation test, summarizes the current problems, and then analyzes the UE automatic interference in the application server sending data packets through the use case diagram, flow chart and other methods, and selects the fading channel model. Get Hayes UE log, convert Hayes UE log into csv file, upload UE log csv file to log server, import database and reboot the business flow and requirement of base station function. Then, the system architecture of the TD-LTE base station fading automation test system is described in detail, and then the three main subsystems (downlink fading automation test subsystem, uplink fading automatic test subsystem) of the fading automation test system are introduced. The whole downlink and downlink automatic test subsystem is designed and implemented. In addition, this paper describes in detail how to start the fading model subsystem, how to obtain UE log from uplink and downlink, and how to convert UE log from uplink and downlink to csv files. And the realization method of the key technology, such as establishing the proprietary load in the whole fading test. Combining with the actual test task, this paper designs the test cases of function test, key function test and system integration test, and optimizes and adjusts the code for the problems in the system integration test. From the test results, the function and performance of the system can meet the original design indicators and requirements. At present, the system has been applied to the TD-LTE base station fading test of Shanghai Bell Company. The system results show that compared with the traditional test engineers, the degree of automation is over 90%, the correct rate of stress testing is over 99%, the efficiency of test is improved nearly 7 times, and the test speed is accelerated. Liberates the test engineer's energy and time, also provides more time convenience for the project manager.
【學位授予單位】:上海交通大學
【學位級別】:碩士
【學位授予年份】:2014
【分類號】:TN929.5
【共引文獻】
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