本文選題：并行 + EMI�。� 參考：《上海交通大學》2014年碩士論文

【摘要】：信息傳輸速率的需求隨著信息量的增加而增大,系統(tǒng)的要求越來越高,作為系統(tǒng)的子系統(tǒng),超高速模塊的誕生也成為大勢所趨,隨著技術(shù)的日漸成熟,并行模塊逐步在短距離傳輸中嶄露頭角,并行模塊成本低、易維護,是構(gòu)建未來低成本,低能耗,高擴展性的光通信系統(tǒng)的必要部件。光模塊在走向小型化,高速率,低功耗,低成本,傳輸距離遠的同時,設(shè)計難度不斷增加,測試難度和復雜度也隨之增加。本文主要介紹超高速并行光模塊的傳輸信號測試及EMI(Electromagnetic Interference)的測試。并行光模塊測試的難點主要體現(xiàn)在兩個方面。第一個方面,隨著信號速率的提升,測試的難度和復雜度迅速提升。當信號速率達到25G時,傳統(tǒng)的方法難以獲得穩(wěn)定的測試結(jié)果。本文提出了一種更加適用的方案,通過增加采集點,增加擬合次數(shù),來提高靈敏度的測試精度。我們的實驗結(jié)果表明,該測試方法不論在測試精度上還是測試時間上都有明顯的效果。第二個方面,模塊的小型化導致設(shè)計密度提高,EMI設(shè)計變得更為復雜,有效的測試對于降低設(shè)計成本,縮短設(shè)計周期尤為重要。本文提出了一種在研發(fā)階段的預測試方法。測試設(shè)計費用相對低廉,容易實現(xiàn),通過常規(guī)的設(shè)備進行簡單的搭建就可實現(xiàn),這樣也就降低了模塊研發(fā)過程中用于EMI測試的費用。不但提高了模塊EMI測試一次成功的可能性,而且在市場競爭中也搶的先機。
[Abstract]:The demand of information transmission rate increases with the increase of the amount of information, and the requirement of the system becomes higher and higher. As the subsystem of the system, the birth of ultra-high speed module has become the trend of the times, and with the development of technology, Parallel modules are gradually emerging in short distance transmission. Parallel modules are low cost and easy to maintain. They are necessary components for building low cost, low energy consumption and high scalability optical communication system in the future. As the optical module moves towards miniaturization, high speed, low power consumption, low cost and long transmission distance, the design difficulty increases continuously, and the test difficulty and complexity also increase. This paper mainly introduces the transmission signal test and EMI(Electromagnetic interference test of ultra high speed parallel optical module. The difficulties of parallel optical module testing are mainly reflected in two aspects. First, with the increase of the signal rate, the difficulty and complexity of the test increase rapidly. When the signal rate reaches 25 G, it is difficult for the traditional method to obtain stable test results. In this paper, a more suitable scheme is proposed to improve the accuracy of sensitivity measurement by increasing the sampling points and fitting times. Our experimental results show that the method has obvious effect in both accuracy and time. In the second aspect, the miniaturization of the module makes the design of EMI more complex, and the effective test is very important to reduce the design cost and shorten the design cycle. In this paper, a pre-test method in R & D phase is proposed. The cost of test design is relatively low and easy to realize, which can be realized by simple construction of conventional equipment, which reduces the cost of EMI test in the process of module development. It not only improves the possibility of a successful EMI test, but also takes the lead in market competition.
【學位授予單位】：上海交通大學
【學位級別】：碩士
【學位授予年份】：2014
【分類號】：TN929.1

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相關(guān)期刊論文 前1條

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