L0周邊Mura分析及其改善研究
發(fā)布時間:2018-02-15 23:56
本文關鍵詞: L周邊Mura 液晶屏 盒厚 輔助封框膠 出處:《液晶與顯示》2014年05期 論文類型:期刊論文
【摘要】:L0周邊Mura是TFT-LCD的一種常見缺陷。本文對L0周邊Mura發(fā)生原因進行分析,發(fā)現(xiàn)真空對盒工藝進行過程中玻璃基板表面受力不均使力學合成力較少的局部位置發(fā)生形變并引起液晶屏周邊區(qū)域盒厚波動,產(chǎn)生不良。采用輔助封框膠開環(huán)方式,主封框膠內(nèi)外兩側壓差趨于平衡,L0周邊Mura發(fā)生率大幅降低;而通過優(yōu)化輔助封框膠工藝有效地解決了周邊區(qū)域力學失衡難題,不良發(fā)生率降至0.3%,改善效果明顯。此外,周邊優(yōu)化設計方案有助于新產(chǎn)品開發(fā)階段避免該不良發(fā)生。
[Abstract]:L0 peripheral Mura is a common defect of TFT-LCD. The cause of L0 peripheral Mura is analyzed in this paper. It is found that the uneven force on the surface of the glass substrate during the process of vacuum processing causes the deformation of the local position with less mechanical synthesis force and the fluctuation of the box thickness around the liquid crystal screen. The incidence of L0 peripheral Mura was reduced significantly by the pressure difference between the inner and outer sides of the main sealing frame adhesive, and the mechanical imbalance problem of the surrounding area was effectively solved by optimizing the auxiliary sealing frame adhesive process, and the bad incidence rate was reduced to 0.3, and the improvement effect was obvious. The peripheral optimum design scheme is helpful to avoid this bad situation in the new product development stage.
【作者單位】: 北京京東方顯示技術有限公司CELLPI部;
【基金】:北京市優(yōu)秀人才培養(yǎng)基金(No.2011D001146000002)
【分類號】:TN873.93
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本文編號:1514178
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