【摘要】：NAND FLASH存儲器具有非易失性、存儲容量大和讀寫速度快等優(yōu)點,在存儲測試領域的應用越來越廣泛。由于NAND FLASH存儲器中不可避免會出現(xiàn)無效塊,傳統(tǒng)的管理方法是將無效塊映射表存放在FLASH存儲器中,可靠性低,對數(shù)據存儲速度和可靠性都會造成不利影響。針對這些問題,提出了基于外置存儲數(shù)據位的無效塊快速檢索架構,將無效塊映射表存放在可靠性高的鐵電存儲器中;引入計算機網絡中的滑動窗口原理,建立了基于滑動窗口的無效塊預匹配機制,在不影響FLASH存取速度的情況下可無時延地生成有效塊地址。經分析和論證,這種架構對NAND FLASH存儲數(shù)據的可靠性和存取速度有很大的提升,提高了存儲測試系統(tǒng)的整體性能。
[Abstract]:NAND FLASH memory has many advantages, such as non-volatile, large storage capacity and fast reading and writing speed, so it is more and more widely used in the field of storage testing. Because invalid blocks will inevitably appear in NAND FLASH memory, the traditional management method is to store invalid block mapping tables in FLASH memory with low reliability, which will adversely affect the speed and reliability of data storage. In order to solve these problems, a fast retrieval architecture of invalid blocks based on external storage data bits is proposed, and the invalid block mapping table is stored in ferroelectric memory with high reliability. Based on the principle of sliding window in computer network, an invalid block pre-matching mechanism based on sliding window is established, which can generate valid block address without delay without affecting the access speed of FLASH. Through analysis and demonstration, this architecture greatly improves the reliability and access speed of NAND FLASH storage data, and improves the overall performance of the storage test system.
【作者單位】： 中北大學儀器科學與動態(tài)測試教育部重點實驗室;
【基金】：國家自然科學基金面上項目(51575499)
【分類號】：TP333

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