【摘要】：分立器件是體現(xiàn)國家基礎(chǔ)科技實(shí)力的重要產(chǎn)業(yè)。隨著電子等相關(guān)行業(yè)的高速發(fā)展和廣泛應(yīng)用,分立器件產(chǎn)業(yè)的重要性也越發(fā)突出。而在整個(gè)產(chǎn)業(yè)鏈中,測試是貫穿整個(gè)產(chǎn)業(yè)的一部分,測試在整個(gè)分立器件行業(yè)有著極其重要的作用。因此,對分立器件測試技術(shù)及儀器的研究具有很積極的現(xiàn)實(shí)意義。嵌入式技術(shù)在越來越多的領(lǐng)域得到廣泛的應(yīng)用,其中包括電子測試行業(yè)。結(jié)合嵌入式技術(shù),測試儀器不僅功能越來越強(qiáng)大,同時(shí)在儀器性能指標(biāo)上有很大的提高。 本文先介紹了分立器件測試儀的整體體系結(jié)構(gòu),以及軟件和硬件需求。根據(jù)測試儀的需求,設(shè)計(jì)中選取集成ARM920T內(nèi)核的S3C2440A芯片作為核心控制板的CPU,同時(shí)分別選用Nor Flash作為引導(dǎo)程序的存儲(chǔ)器,選用Nand Flash作為測試程序和數(shù)據(jù)的存儲(chǔ)器。文中完成存儲(chǔ)器系統(tǒng)及驅(qū)動(dòng)設(shè)計(jì)；針對測試儀啟動(dòng)需求的特點(diǎn)專門設(shè)計(jì)引導(dǎo)程序DDT Boot,在引導(dǎo)程序中完成所需接口設(shè)備的驅(qū)動(dòng)設(shè)計(jì),實(shí)現(xiàn)與上位機(jī)通信。此外,文中詳細(xì)闡述了對測試儀總線驅(qū)動(dòng)函數(shù)的設(shè)計(jì)。基于總線驅(qū)動(dòng)函數(shù),完成了各個(gè)功能板底層功能函數(shù)的設(shè)計(jì),并進(jìn)行封裝。這為測試應(yīng)用程序的編寫提供良好的底層功能函數(shù)接口,也增加了程序的通用性。應(yīng)用封裝好的功能函數(shù),可以很好完成測試程序。配合相應(yīng)的上位機(jī)軟件,實(shí)現(xiàn)測試程序的圖形化編程,非常具有應(yīng)用價(jià)值。
[Abstract]:Discrete devices are an important industry that embodies the basic scientific and technological strength of the country. With the rapid development and wide application of electronics and other related industries, the importance of discrete device industry is becoming more and more prominent. In the whole industrial chain, testing is a part of the whole industry, and testing plays an extremely important role in the whole discrete device industry. Therefore, it is of great practical significance to study the testing technology and instruments of discrete devices. Embedded technology has been widely used in more and more fields, including electronic testing industry. Combined with embedded technology, the test instrument not only has more and more powerful function, but also has a great improvement in the performance index of the instrument. This paper first introduces the overall architecture of discrete device tester, as well as the software and hardware requirements. According to the requirements of the tester, the S3C2440A chip integrated with ARM920T kernel is selected as the CPU, of the core control board, and the Nor Flash is selected as the memory of the boot program, and the Nand Flash is selected as the memory of the test program and data. In this paper, the memory system and driver design are completed, and according to the characteristics of the starting requirement of the tester, the boot program DDT Boot, is specially designed to complete the driver design of the required interface equipment in the boot program, and to realize the communication with the upper computer. In addition, the design of bus driver function of tester is described in detail. Based on the bus driver function, the design of the bottom function of each function board is completed, and the encapsulation is carried out. This provides a good interface of the underlying function for the writing of the test application, and also increases the generality of the program. The test program can be well completed by using the packaged function. It is of great application value to realize the graphical programming of the test program with the corresponding upper computer software.
【學(xué)位授予單位】：電子科技大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2012
【分類號(hào)】：TP368.1;TP311.52

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