【摘要】：為了研究彈載存儲設(shè)備的失效模式,首先對彈載存儲設(shè)備結(jié)構(gòu)進行分析,并對其進行傾徹模擬分析,得出沖擊會使測試儀電路腔發(fā)生嚴(yán)重形變、測試儀電路受到擠壓甚至破碎。其次對其外殼進行了沖擊仿真,得出彈載存儲設(shè)備殼體高沖擊環(huán)境下的損傷主要是存儲設(shè)備的外殼因塑性變形引起的分層。最后針對該彈載記錄儀進行侵徹試驗,由此得出該彈載存儲設(shè)備在該環(huán)境下的薄弱環(huán)節(jié),該結(jié)果為提高彈載存儲設(shè)備的可靠性分析提供依據(jù)。
[Abstract]:In order to study the failure mode of the projectile storage device, the structure of the projectile storage device is analyzed firstly, and the emulation analysis of the projectile storage device is carried out. It is concluded that the impact will cause the serious deformation of the circuit cavity of the tester, and the circuit of the tester will be extruded or even broken. Secondly, the impact simulation of the shell is carried out, and it is concluded that the damage of the shell under the high impact environment is mainly caused by plastic deformation of the shell of the storage device. Finally, the penetration test of the projectile recorder is carried out, and the weak link of the projectile storage device in this environment is obtained. The results provide a basis for improving the reliability analysis of the projectile storage device.
【作者單位】： 中北大學(xué)儀器科學(xué)與動態(tài)測試教育部重點實驗室;電子測試技術(shù)國家重點實驗室中北大學(xué);北京青云航空儀表有限公司;
【基金】：國家自然科學(xué)基金(51075374) 山西省回國留學(xué)人員科研資助項目(2013-077)資助
【分類號】：TJ06;TP333

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