彈載存儲(chǔ)設(shè)備在侵徹下的失效分析
發(fā)布時(shí)間:2018-09-06 08:04
【摘要】:為了研究彈載存儲(chǔ)設(shè)備的失效模式,首先對(duì)彈載存儲(chǔ)設(shè)備結(jié)構(gòu)進(jìn)行分析,并對(duì)其進(jìn)行傾徹模擬分析,得出沖擊會(huì)使測(cè)試儀電路腔發(fā)生嚴(yán)重形變、測(cè)試儀電路受到擠壓甚至破碎。其次對(duì)其外殼進(jìn)行了沖擊仿真,得出彈載存儲(chǔ)設(shè)備殼體高沖擊環(huán)境下的損傷主要是存儲(chǔ)設(shè)備的外殼因塑性變形引起的分層。最后針對(duì)該彈載記錄儀進(jìn)行侵徹試驗(yàn),由此得出該彈載存儲(chǔ)設(shè)備在該環(huán)境下的薄弱環(huán)節(jié),該結(jié)果為提高彈載存儲(chǔ)設(shè)備的可靠性分析提供依據(jù)。
[Abstract]:In order to study the failure mode of the projectile storage device, the structure of the projectile storage device is analyzed firstly, and the emulation analysis of the projectile storage device is carried out. It is concluded that the impact will cause the serious deformation of the circuit cavity of the tester, and the circuit of the tester will be extruded or even broken. Secondly, the impact simulation of the shell is carried out, and it is concluded that the damage of the shell under the high impact environment is mainly caused by plastic deformation of the shell of the storage device. Finally, the penetration test of the projectile recorder is carried out, and the weak link of the projectile storage device in this environment is obtained. The results provide a basis for improving the reliability analysis of the projectile storage device.
【作者單位】: 中北大學(xué)儀器科學(xué)與動(dòng)態(tài)測(cè)試教育部重點(diǎn)實(shí)驗(yàn)室;電子測(cè)試技術(shù)國(guó)家重點(diǎn)實(shí)驗(yàn)室中北大學(xué);北京青云航空儀表有限公司;
【基金】:國(guó)家自然科學(xué)基金(51075374) 山西省回國(guó)留學(xué)人員科研資助項(xiàng)目(2013-077)資助
【分類號(hào)】:TJ06;TP333
本文編號(hào):2225736
[Abstract]:In order to study the failure mode of the projectile storage device, the structure of the projectile storage device is analyzed firstly, and the emulation analysis of the projectile storage device is carried out. It is concluded that the impact will cause the serious deformation of the circuit cavity of the tester, and the circuit of the tester will be extruded or even broken. Secondly, the impact simulation of the shell is carried out, and it is concluded that the damage of the shell under the high impact environment is mainly caused by plastic deformation of the shell of the storage device. Finally, the penetration test of the projectile recorder is carried out, and the weak link of the projectile storage device in this environment is obtained. The results provide a basis for improving the reliability analysis of the projectile storage device.
【作者單位】: 中北大學(xué)儀器科學(xué)與動(dòng)態(tài)測(cè)試教育部重點(diǎn)實(shí)驗(yàn)室;電子測(cè)試技術(shù)國(guó)家重點(diǎn)實(shí)驗(yàn)室中北大學(xué);北京青云航空儀表有限公司;
【基金】:國(guó)家自然科學(xué)基金(51075374) 山西省回國(guó)留學(xué)人員科研資助項(xiàng)目(2013-077)資助
【分類號(hào)】:TJ06;TP333
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