基于ARM11的MMC驗(yàn)證測(cè)試平臺(tái)設(shè)計(jì)與實(shí)現(xiàn)
發(fā)布時(shí)間：2018-09-03 07:29
【摘要】：隨著半導(dǎo)體技術(shù)的發(fā)展，非易失性存儲(chǔ)領(lǐng)域的主流從NOR結(jié)構(gòu)逐漸轉(zhuǎn)向NAND結(jié)構(gòu)閃存。而高容量NAND閃存，需要日益復(fù)雜的壞塊和糾錯(cuò)位管理系統(tǒng)，從而催生了Managed NAND閃存系統(tǒng)。針對(duì)Managed NAND閃存系統(tǒng)的主流協(xié)議MMC（Multi Media Card），大型系統(tǒng)級(jí)測(cè)試設(shè)備得到一定應(yīng)用。但這些設(shè)備成本高昂，且不支持移動(dòng)測(cè)試。因此有必要研制低成本的測(cè)試系統(tǒng)。 本文主要介紹了一種基于ARM的MMC（Multi Media Card）存儲(chǔ)芯片測(cè)試驗(yàn)證方案的實(shí)現(xiàn)。本文的測(cè)試系統(tǒng)通過(guò)ARM11的系統(tǒng)板的硬件再次開(kāi)發(fā)，以及Linux操作系統(tǒng)的移植和修改開(kāi)發(fā)后完成對(duì)于MMC存儲(chǔ)芯片的測(cè)試。測(cè)試系統(tǒng)擁有低成本、良好的可攜帶性以及便于使用的優(yōu)點(diǎn)，在工程調(diào)試階段可以達(dá)到替代大型測(cè)試儀器，在客戶支持階段滿足大型儀器無(wú)法達(dá)到的更好的可移動(dòng)支持。
[Abstract]:With the development of semiconductor technology, the mainstream of non-volatile memory is gradually changing from NOR structure to NAND structure flash memory. High capacity NAND flash memory needs more and more complex bad block and error correction management system, which leads to the emergence of Managed NAND flash memory system. The mainstream protocol of Managed NAND flash memory system, MMC (Multi Media Card), is applied to large system level test equipment. But these devices are expensive and do not support mobile testing. Therefore, it is necessary to develop a low-cost test system. This paper mainly introduces the implementation of a MMC (Multi Media Card) memory chip test verification scheme based on ARM. The test system of this paper is redeveloped by the hardware of the ARM11 system board, and the Linux operating system is transplanted and modified to complete the test of the MMC memory chip. The test system has the advantages of low cost, good portability and ease of use. It can replace the large test instrument in the engineering debugging stage and meet the better movable support that the large instrument can not achieve in the customer support stage.
【學(xué)位授予單位】：上海交通大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2013
【分類號(hào)】：TP316.81;TP333;TN407
本文編號(hào)：2219327
[Abstract]:With the development of semiconductor technology, the mainstream of non-volatile memory is gradually changing from NOR structure to NAND structure flash memory. High capacity NAND flash memory needs more and more complex bad block and error correction management system, which leads to the emergence of Managed NAND flash memory system. The mainstream protocol of Managed NAND flash memory system, MMC (Multi Media Card), is applied to large system level test equipment. But these devices are expensive and do not support mobile testing. Therefore, it is necessary to develop a low-cost test system. This paper mainly introduces the implementation of a MMC (Multi Media Card) memory chip test verification scheme based on ARM. The test system of this paper is redeveloped by the hardware of the ARM11 system board, and the Linux operating system is transplanted and modified to complete the test of the MMC memory chip. The test system has the advantages of low cost, good portability and ease of use. It can replace the large test instrument in the engineering debugging stage and meet the better movable support that the large instrument can not achieve in the customer support stage.
【學(xué)位授予單位】：上海交通大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2013
【分類號(hào)】：TP316.81;TP333;TN407
【參考文獻(xiàn)】
相關(guān)期刊論文 前4條
1 陳惠濱,陳僅星;嵌入式文件系統(tǒng)在移動(dòng)數(shù)據(jù)采集器中的實(shí)現(xiàn)[J];電子器件;2005年03期
2 金建輝;何春;;一種中文界面的簡(jiǎn)易芯片測(cè)試儀的設(shè)計(jì)與實(shí)現(xiàn)[J];昆明冶金高等�？茖W(xué)校學(xué)報(bào);2010年05期
3 韓飛,黃賢武,張慶鋒;Jffs2文件系統(tǒng)在嵌入式Linux下的應(yīng)用[J];蘇州大學(xué)學(xué)報(bào)(自然科學(xué)版);2005年02期
4 劉嵐,張凱;ARM7嵌入式系統(tǒng)的中斷設(shè)計(jì)與中斷處理優(yōu)化[J];武漢理工大學(xué)學(xué)報(bào);2004年04期
，本文編號(hào)：2219327
本文鏈接：http://sikaile.net/kejilunwen/jisuanjikexuelunwen/2219327.html
最近更新
教材專著
