【摘要】：隨著經(jīng)濟(jì)發(fā)展和技術(shù)的進(jìn)步,非易失性存儲器(NVM)的地位變得越來越重要。FLASH作為NVM的代表,廣泛應(yīng)用于各領(lǐng)域。但是受到最小工藝尺寸的限制,FLASH的發(fā)展前景不容樂觀。由于具有相當(dāng)可觀的微縮化前景,密度高和速度快等特點(diǎn),阻變存儲器(RRAM)極有可能取代FLASH,成為下一代主流NVM。目前RRAM流片后,主要使用商用測試機(jī)對其作測試。但是,商用測試機(jī)存在操作復(fù)雜,費(fèi)用昂貴,實(shí)用性差等問題,使得RRAM從設(shè)計(jì)到量產(chǎn)的周期大大延長。一般情況下,RRA。M有DMA(Direct Memory Access)模式和用戶模式兩種。DMA模式即直接存儲器訪問,是專用于測試RRAM的模式。用戶模式,即用戶實(shí)際使用RRAM進(jìn)行數(shù)據(jù)讀寫�；谏鲜隹紤],本課題開展RRAM的DMA模式的專用測試系統(tǒng)的設(shè)計(jì)工作,擬解決其測試問題。課題研制的測試系統(tǒng)具有實(shí)用性強(qiáng),操作方便,價(jià)格低廉和性能可靠等特點(diǎn),可以大大降低RRAM研究單位的測試成本,加快RRAM的研發(fā)。本文首先介紹了商用測試機(jī)的國內(nèi)外研究現(xiàn)狀,討論了 RRAM測試面臨的技術(shù)問題。其次介紹了 RRAM的基本原理,及其在DMA模式下的測試方法,在此基礎(chǔ)上定義了 ATE通信協(xié)議與測試流程,然后設(shè)計(jì)了一款針對RRAM的DMA模式的測試系統(tǒng)。本測試系統(tǒng)有30個(gè)激勵(lì)通道,1個(gè)接收通道,擁有直流參數(shù)測量模塊,可以對RRAM單元進(jìn)行forming,reset和set等基本測試。它主要由上位機(jī),FPGA,四通道參數(shù)測量單元AD5522和高精度的模數(shù)轉(zhuǎn)換器AD7685等組成。文章詳細(xì)講解了測試系統(tǒng)的核心部分——FPGA的設(shè)計(jì),在ATE通信協(xié)議與測試流程的基礎(chǔ)上,提出FPGA架構(gòu),并作詳細(xì)的模塊劃分,然后對各模塊(通信模塊、發(fā)送模塊、系統(tǒng)控制模塊、AD5522控制模塊和AD7685控制模塊)進(jìn)行詳細(xì)設(shè)計(jì)。并利用ISE和Modelsim軟件完成了各模塊的verilog代碼設(shè)計(jì)與仿真驗(yàn)證。接著,對測試系統(tǒng)的硬件進(jìn)行調(diào)試,驗(yàn)證了其測量功能。最后,對全文進(jìn)行了總結(jié),并給出了未來進(jìn)一步研究方向。
[Abstract]:With the development of economy and technology, the status of non-volatile memory (NVM) becomes more and more important. Flash, as the representative of NVM, is widely used in various fields. However, the development prospect of flash is not optimistic due to the limitation of minimum process size. Because of its considerable microshrinkage prospect, high density and high speed, resistive memory (RRAM) is likely to replace flash and become the mainstream of the next generation. At present, after RRAM streaming, commercial testing machine is mainly used to test it. However, the problems of complex operation, high cost and poor practicability of commercial test machine make the cycle of RRAM from design to mass production be extended greatly. In general, RRA.M has DMA (Direct Memory Access) mode and user mode. User mode, that is, the user actually uses RRAM to read and write data. Based on the above considerations, the design of a special test system for DMA mode of RRAM is carried out, and the test problem is solved. The test system developed in this paper has the advantages of strong practicability, convenient operation, low price and reliable performance. It can greatly reduce the testing cost of RRAM research units and speed up the research and development of RRAM. This paper first introduces the research status of commercial test machines at home and abroad, and discusses the technical problems of RRAM testing. Secondly, this paper introduces the basic principle of RRAM and its testing method in DMA mode, then defines the ATE communication protocol and test flow, and then designs a test system for DMA mode of RRAM. The system has 30 excitation channels and one receiving channel, and has DC parameter measurement module, which can be used for basic testing of RRAM unit such as formingreset and set. It is mainly composed of PC FPGA, four-channel parameter measurement unit (AD5522) and high precision A / D converter (AD7685). In this paper, the design of the core part of the test system is explained in detail. On the basis of ATE communication protocol and test flow, the FPGA architecture is put forward, and the detailed module partition is made, and then every module (communication module, sending module) is given. The system control module, AD5522 control module and AD7685 control module, are designed in detail. The verilog code design and simulation of each module are completed by using ISE and Modelsim software. Then, the hardware of the test system is debugged and its measuring function is verified. Finally, the paper summarizes the full text and gives the future research direction.
【學(xué)位授予單位】：安徽大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2017
【分類號】：TP333

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