本文選題：電火花加工機(jī)床 + CCD探頭�。� 參考：《廣東工業(yè)大學(xué)》2012年碩士論文

【摘要】：嵌入式可視檢測(cè)系統(tǒng)(英文名稱：Integrated Vision Unit,以下簡(jiǎn)稱：IVU)是一種新型光電檢測(cè)系統(tǒng),可被安裝在電火花加工機(jī)床上,并嵌入阿奇夏米爾公司的數(shù)控系統(tǒng)以用來實(shí)時(shí)觀測(cè)放大后工件形貌以及進(jìn)行精密測(cè)量。整個(gè)系統(tǒng)從初步的設(shè)計(jì)構(gòu)思到后來成形為實(shí)體己經(jīng)由瑞士阿奇夏米爾公司研發(fā)部在前期工作中完成,本文的主要工作就是提出改進(jìn)和提升該系統(tǒng)檢測(cè)精準(zhǔn)度的方案,并對(duì)其結(jié)果進(jìn)行驗(yàn)證。 IVU系統(tǒng)的硬件部分由電荷耦合陣列探測(cè)器(英文名稱：Charge Couple Device,簡(jiǎn)稱：CCD)成像器件和發(fā)光二極管組成。CCD探頭可在數(shù)控系統(tǒng)的控制下快速,精準(zhǔn)的完成各種制定任務(wù)。發(fā)光二極管提供正面和背面兩個(gè)方向的光,輔助測(cè)量。檢測(cè)時(shí)CCD探頭通過攝像的方式將工件表面情況傳送到顯示屏上,因此可以實(shí)時(shí)觀測(cè)該檢測(cè)系統(tǒng)的工作情況。 本文通過對(duì)IVU系統(tǒng)精準(zhǔn)度提高方法的研究,提出四步校準(zhǔn)方法。校準(zhǔn)后又從兩方面來驗(yàn)證校準(zhǔn)效果：一方面,我們?cè)O(shè)計(jì)了一組同樣條件下的重復(fù)測(cè)量實(shí)驗(yàn),實(shí)驗(yàn)結(jié)果主要對(duì)測(cè)量系統(tǒng)的穩(wěn)定性做了驗(yàn)證；另一方面,又組織了一系列與不同類型檢測(cè)儀器的對(duì)比實(shí)驗(yàn),從而驗(yàn)證了校準(zhǔn)后IVU的精準(zhǔn)度。 形貌掃描功能是研發(fā)后期為客戶特別設(shè)計(jì)的一項(xiàng)功能,能夠在不預(yù)先設(shè)定工件形貌的情況下對(duì)任意形狀的部件進(jìn)行掃描,并且能夠在掃描完成后顯示出與標(biāo)準(zhǔn)形貌對(duì)比分析的結(jié)果。這項(xiàng)功能提高了檢測(cè)系統(tǒng)的靈活性,在實(shí)際使用過程中對(duì)客戶會(huì)有很大幫助。為了驗(yàn)證這項(xiàng)功能的精確度和穩(wěn)定性,本文設(shè)計(jì)了兩部分實(shí)驗(yàn)：首先,將該功能與系統(tǒng)中其他功能相對(duì)比,從內(nèi)部檢驗(yàn)該功能與其他功能精準(zhǔn)度一致性；其次,再將該功能與其他儀器中的相似功能相對(duì)比,從而確定該功能的精準(zhǔn)度在實(shí)際使用中能否滿足客戶的需求。為了補(bǔ)充說明該功能在實(shí)際運(yùn)用中的效果,本文還設(shè)計(jì)了形貌掃描功能在實(shí)際工件上作用的實(shí)驗(yàn)。 本文在最后還提到了下一步研究的方向,即利用這項(xiàng)功能使得IVU不僅能觀察和測(cè)量工件,還能計(jì)算出修正電火花加工機(jī)床電極絲加工路徑的方案,進(jìn)一步提高電火花加工機(jī)床加工精度。
[Abstract]:Embedded Vision system is a new photoelectric detection system, which can be installed on EDM machine tools. The NC system of Acheshamir is embedded to observe the shape of the enlarged workpiece in real time and to carry out precise measurement. The whole system from the initial design concept to the later formation of the entity has been completed through the research and development department of Acheshamir Company in Switzerland. The main work of this paper is to propose a scheme to improve and enhance the accuracy of the system detection. The results are verified. The hardware part of the IVU system is composed of a charge Couple device and a light-emitting diode, which can accomplish all kinds of tasks quickly and accurately under the control of the numerical control system. Light-emitting diodes provide both front and back directions of light, auxiliary measurement. During the detection, the CCD probe transmits the workpiece surface condition to the display screen by the way of camera, so the working condition of the detection system can be observed in real time. In this paper, a four-step calibration method is proposed by studying the method of improving the accuracy of IVU system. After calibration, the calibration effect is verified from two aspects: on the one hand, we design a group of repeated measurement experiments under the same conditions, the results of the experiment mainly verify the stability of the measurement system; on the other hand, A series of contrast experiments with different types of testing instruments were also organized to verify the accuracy of the calibrated IVU. The morphology scanning function is a function specially designed for customers in the later stage of development. It can scan parts of any shape without pre-setting the shape of the workpiece. After scanning, the results can be compared with the standard morphologies. This function improves the flexibility of the detection system and will be of great help to customers in the actual use process. In order to verify the accuracy and stability of this function, this paper designs two parts of experiments: first, compare the function with other functions in the system, verify the consistency between the function and other functions from the inside; secondly, Then the function is compared with similar functions in other instruments to determine whether the accuracy of the function can meet the needs of customers in practical use. In order to explain the effect of this function in practical application, an experiment on the effect of topography scanning function on the actual workpiece is also designed in this paper. At the end of this paper, the direction of further research is also mentioned, that is, using this function, IVU can not only observe and measure the workpiece, but also calculate the scheme of modifying the electrode wire machining path of EDM machine tool. Further improve the machining accuracy of EDM machine tools.
【學(xué)位授予單位】：廣東工業(yè)大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2012
【分類號(hào)】：TP368.1;TP274

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本文編號(hào)：1864595