本文選題：平面度 + C8051F��； 參考：《西華大學(xué)》2012年碩士論文

【摘要】：隨著電子技術(shù)的不斷發(fā)展，平板技術(shù)已經(jīng)越來越多的應(yīng)用于電子產(chǎn)品之中，平板產(chǎn)品平面的平整度是決定平板產(chǎn)品質(zhì)量的重要因素。因而國家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局在2005年03月頒布了平板檢測相關(guān)規(guī)程，對(duì)平板工作面平面度參數(shù)進(jìn)行統(tǒng)一規(guī)范，并規(guī)定平面度最大誤差及相應(yīng)平板準(zhǔn)確度級(jí)別等。本文依據(jù)國家計(jì)量檢定規(guī)程，并結(jié)合市場實(shí)際檢測精度指標(biāo)要求，提出并實(shí)現(xiàn)了一種較為經(jīng)濟(jì)的平板平面度檢測方案，實(shí)現(xiàn)在線批量檢測。 提出了基于混合信號(hào)片上系統(tǒng)型單片機(jī)C8051F的智能平板平面度檢測系統(tǒng)設(shè)計(jì)方案。系統(tǒng)依據(jù)對(duì)角線布點(diǎn)評(píng)定法則為基準(zhǔn)，采用最小條件原則評(píng)定方法，利用SOC系統(tǒng)級(jí)MCU芯片為采集器智能核心，通過多路電渦流位移傳感器，完成對(duì)待測平板的數(shù)據(jù)采集。運(yùn)用Modbus協(xié)議組成工業(yè)級(jí)232網(wǎng)絡(luò)，完成與上位機(jī)握手通訊。上位機(jī)采用LabVIEW開發(fā)設(shè)計(jì)程控界面，結(jié)合Access數(shù)據(jù)庫技術(shù)，實(shí)現(xiàn)待檢測平板數(shù)據(jù)的采集和歷史采集信息的查詢、管理等操作。 本文的主要工作包括以下幾個(gè)方面： (1)研究平板平面度檢測相關(guān)評(píng)定準(zhǔn)則。根據(jù)實(shí)際檢測平面度允許最大誤差基準(zhǔn)，選擇電渦流位移傳感器，按照對(duì)角線布點(diǎn)評(píng)定法則布點(diǎn)測量。對(duì)待檢測平板選取合適基準(zhǔn)平面，并采用12點(diǎn)布點(diǎn)測量，計(jì)算所有測量點(diǎn)相對(duì)于理想平面的偏差，其最大值與最小值之差即為待測平板平面度。采用對(duì)角線法則進(jìn)行誤差評(píng)定后，原始測量數(shù)據(jù)轉(zhuǎn)換為相對(duì)于基準(zhǔn)平面的數(shù)據(jù)，按照最小條件原則進(jìn)行評(píng)定，驗(yàn)證平面度測量結(jié)果。 (2)提出了以高度集成的SOC系統(tǒng)級(jí)MCU芯片為核心的智能采集系統(tǒng)。系統(tǒng)采用傳感器采集平板位移信號(hào)，利用多路模擬開關(guān)切換選通模擬信號(hào)輸入，通過儀表放大電路進(jìn)行信號(hào)的前端放大。數(shù)據(jù)采集系統(tǒng)芯片內(nèi)置模/數(shù)轉(zhuǎn)換器ADC，數(shù)/模轉(zhuǎn)換器DAC，電壓比較器，可編程增益放大器，以及UART通訊接口等，實(shí)現(xiàn)單芯片智能采集設(shè)計(jì)。系統(tǒng)采用Modbus通信協(xié)議RTU傳輸模式實(shí)現(xiàn)采集板與PC機(jī)通訊，為了防止傳送過程中傳輸錯(cuò)誤，系統(tǒng)進(jìn)行CRC校驗(yàn)整個(gè)消息內(nèi)容。 (3)采用圖形化可視軟件LabVIEW開發(fā)設(shè)計(jì)平板平面度檢測系統(tǒng)上位機(jī)程控界面。選通系統(tǒng)采集通道，并采集選通通道零點(diǎn)電壓值；配置串口通訊參數(shù)，采集選通通道電壓數(shù)據(jù)，并依據(jù)采集電壓值轉(zhuǎn)換為相應(yīng)檢測值；設(shè)定平板檢測合格判據(jù)，，并判斷平板平面度合格狀態(tài)，多次采集，進(jìn)行檢測數(shù)據(jù)統(tǒng)計(jì)；調(diào)用Access數(shù)據(jù)庫，存儲(chǔ)實(shí)時(shí)檢測數(shù)據(jù)，并可查詢歷史檢測平板合格情況，查詢指定日期測試平板數(shù)據(jù)，對(duì)已測數(shù)據(jù)進(jìn)行刪除、打印等操作處理；設(shè)計(jì)用戶登錄及密碼修改界面，增強(qiáng)檢測系統(tǒng)安全性。 (4)根據(jù)平板平面度檢測系統(tǒng)需完成功能進(jìn)行測試。構(gòu)建函數(shù)發(fā)生器、六位半數(shù)字多用表、PCI-GPIB接口控制器的自動(dòng)精度校準(zhǔn)系統(tǒng)，提高了測量準(zhǔn)確度。利用Agilent33220A函數(shù)發(fā)生器模擬12路電渦流位移傳感器產(chǎn)生電位對(duì)應(yīng)電壓信號(hào)，采用本檢測系統(tǒng)采集零點(diǎn)電壓值和模擬平板檢測電壓值，驗(yàn)證檢測合格指示狀態(tài)。按要求查詢歷史檢測數(shù)據(jù)，檢測系統(tǒng)數(shù)據(jù)庫管理功能。測試過程的順利進(jìn)行，保證了整個(gè)檢測系統(tǒng)的正常工作運(yùn)行。 目前平板電子產(chǎn)品飛速發(fā)展，人們對(duì)其質(zhì)量的檢測工作也越來越為重視，介于實(shí)際檢測成本和精度的需求，本系統(tǒng)設(shè)計(jì)不僅性價(jià)比高，而且具有完善的數(shù)據(jù)庫管理等功能，目前已在平板平面度檢測線上得到成功應(yīng)用。
[Abstract]:With the development of electronic technology , flat panel technology has become more and more applicable to electronic products . The flatness of flat panel products is an important factor to determine the quality of flat panel products .

This paper presents a design scheme of the intelligent flat - plate flatness detection system based on the system - type single - chip - based on mixed signal chip . The system is based on the principle of diagonal layout . The system is based on the principle of minimum condition principle . The SOC system - level MCU chip is used as the intelligent core of the collector . By means of the Modbus protocol , the data acquisition of the flat plate is completed . By using the Modbus protocol to form the industrial - level 232 network , the communication with the upper computer is completed . The upper computer uses the LabVIEW to develop the program - controlled interface , and realizes the query , management and other operations of the data acquisition and history collection of the flat data to be detected .

The main work of this paper includes the following aspects :

( 1 ) To study the relevant evaluation criterion of flatness detection of flat plate . Based on the actual detection flatness , the maximum error criterion is selected , the electric eddy current displacement sensor is selected , and the deviation of all measuring points with respect to the ideal plane is calculated according to the difference between the maximum value and the minimum value according to the difference between the maximum value and the minimum value . After the error evaluation is performed by using the diagonal rule , the original measurement data is converted into the data relative to the reference plane , and the flatness measurement result is verified according to the minimum condition principle .

( 2 ) The intelligent acquisition system based on highly integrated SOC system level MCU chip is proposed . The system adopts the sensor to acquire the plate displacement signal , and switches the analog signal input through the multi - way analog switch , amplifies the front end of the signal through the instrument amplifying circuit . The system realizes the single chip intelligent acquisition design by using the Modbus communication protocol RTU transmission mode to realize the communication between the acquisition board and the PC . In order to prevent the transmission error during the transmission process , the system performs the CRC check of the whole message content .

( 3 ) developing the program control interface of the upper computer of the flat - plate flatness detection system by adopting a graphical visual software LabVIEW ;
configuring serial port communication parameters , collecting gated channel voltage data , and converting into corresponding detection values according to the acquired voltage values ;
setting a plate detection eligibility criterion , judging the flatness of the flat plate to be qualified , collecting repeatedly for multiple times , and performing detection data statistics ;
calling an Access database , storing the real - time detection data , and inquiring history detection plate conformity , inquiring the appointed day test plate data , deleting the measured data , printing and the like ;
The user login and password modification interface are designed to enhance the security of the detection system .

( 4 ) The function test system needs to be tested according to the flatness detection system of the flat plate . The automatic precision calibration system of the function generator , the six - bit semi - digital multi - purpose table and the PCI interface controller is constructed , and the measurement accuracy is improved . The detection system is used for simulating 12 paths of electric eddy current displacement sensors to generate potential corresponding voltage signals . The detection system collects the zero voltage value and the analog flat panel detection voltage value , and verifies the test pass indication state . According to the requirement , the history detection data is inquired , and the database management function of the system is detected .

At present , flat - plate electronic products are rapidly developing , and people pay more and more attention to the detection of their quality . The system is not only cost - effective , but also has perfect database management functions , and has been successfully applied on the flat - level detection line .

【學(xué)位授予單位】：西華大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2012
【分類號(hào)】：TP274;TP368.12

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本文編號(hào)：1734628