本文選題：平面度 + C8051F��； 參考：《西華大學(xué)》2012年碩士論文

【摘要】：隨著電子技術(shù)的不斷發(fā)展，平板技術(shù)已經(jīng)越來(lái)越多的應(yīng)用于電子產(chǎn)品之中，平板產(chǎn)品平面的平整度是決定平板產(chǎn)品質(zhì)量的重要因素。因而國(guó)家質(zhì)量監(jiān)督檢驗(yàn)檢疫總局在2005年03月頒布了平板檢測(cè)相關(guān)規(guī)程，對(duì)平板工作面平面度參數(shù)進(jìn)行統(tǒng)一規(guī)范，并規(guī)定平面度最大誤差及相應(yīng)平板準(zhǔn)確度級(jí)別等。本文依據(jù)國(guó)家計(jì)量檢定規(guī)程，并結(jié)合市場(chǎng)實(shí)際檢測(cè)精度指標(biāo)要求，提出并實(shí)現(xiàn)了一種較為經(jīng)濟(jì)的平板平面度檢測(cè)方案，實(shí)現(xiàn)在線批量檢測(cè)。 提出了基于混合信號(hào)片上系統(tǒng)型單片機(jī)C8051F的智能平板平面度檢測(cè)系統(tǒng)設(shè)計(jì)方案。系統(tǒng)依據(jù)對(duì)角線布點(diǎn)評(píng)定法則為基準(zhǔn)，采用最小條件原則評(píng)定方法，利用SOC系統(tǒng)級(jí)MCU芯片為采集器智能核心，通過(guò)多路電渦流位移傳感器，完成對(duì)待測(cè)平板的數(shù)據(jù)采集。運(yùn)用Modbus協(xié)議組成工業(yè)級(jí)232網(wǎng)絡(luò)，完成與上位機(jī)握手通訊。上位機(jī)采用LabVIEW開(kāi)發(fā)設(shè)計(jì)程控界面，結(jié)合Access數(shù)據(jù)庫(kù)技術(shù)，實(shí)現(xiàn)待檢測(cè)平板數(shù)據(jù)的采集和歷史采集信息的查詢(xún)、管理等操作。 本文的主要工作包括以下幾個(gè)方面： (1)研究平板平面度檢測(cè)相關(guān)評(píng)定準(zhǔn)則。根據(jù)實(shí)際檢測(cè)平面度允許最大誤差基準(zhǔn)，選擇電渦流位移傳感器，按照對(duì)角線布點(diǎn)評(píng)定法則布點(diǎn)測(cè)量。對(duì)待檢測(cè)平板選取合適基準(zhǔn)平面，并采用12點(diǎn)布點(diǎn)測(cè)量，計(jì)算所有測(cè)量點(diǎn)相對(duì)于理想平面的偏差，其最大值與最小值之差即為待測(cè)平板平面度。采用對(duì)角線法則進(jìn)行誤差評(píng)定后，原始測(cè)量數(shù)據(jù)轉(zhuǎn)換為相對(duì)于基準(zhǔn)平面的數(shù)據(jù)，按照最小條件原則進(jìn)行評(píng)定，驗(yàn)證平面度測(cè)量結(jié)果。 (2)提出了以高度集成的SOC系統(tǒng)級(jí)MCU芯片為核心的智能采集系統(tǒng)。系統(tǒng)采用傳感器采集平板位移信號(hào)，利用多路模擬開(kāi)關(guān)切換選通模擬信號(hào)輸入，通過(guò)儀表放大電路進(jìn)行信號(hào)的前端放大。數(shù)據(jù)采集系統(tǒng)芯片內(nèi)置模/數(shù)轉(zhuǎn)換器ADC，數(shù)/模轉(zhuǎn)換器DAC，電壓比較器，可編程增益放大器，以及UART通訊接口等，實(shí)現(xiàn)單芯片智能采集設(shè)計(jì)。系統(tǒng)采用Modbus通信協(xié)議RTU傳輸模式實(shí)現(xiàn)采集板與PC機(jī)通訊，為了防止傳送過(guò)程中傳輸錯(cuò)誤，系統(tǒng)進(jìn)行CRC校驗(yàn)整個(gè)消息內(nèi)容。 (3)采用圖形化可視軟件LabVIEW開(kāi)發(fā)設(shè)計(jì)平板平面度檢測(cè)系統(tǒng)上位機(jī)程控界面。選通系統(tǒng)采集通道，并采集選通通道零點(diǎn)電壓值；配置串口通訊參數(shù)，采集選通通道電壓數(shù)據(jù)，并依據(jù)采集電壓值轉(zhuǎn)換為相應(yīng)檢測(cè)值；設(shè)定平板檢測(cè)合格判據(jù)，，并判斷平板平面度合格狀態(tài)，多次采集，進(jìn)行檢測(cè)數(shù)據(jù)統(tǒng)計(jì)；調(diào)用Access數(shù)據(jù)庫(kù)，存儲(chǔ)實(shí)時(shí)檢測(cè)數(shù)據(jù)，并可查詢(xún)歷史檢測(cè)平板合格情況，查詢(xún)指定日期測(cè)試平板數(shù)據(jù)，對(duì)已測(cè)數(shù)據(jù)進(jìn)行刪除、打印等操作處理；設(shè)計(jì)用戶(hù)登錄及密碼修改界面，增強(qiáng)檢測(cè)系統(tǒng)安全性。 (4)根據(jù)平板平面度檢測(cè)系統(tǒng)需完成功能進(jìn)行測(cè)試。構(gòu)建函數(shù)發(fā)生器、六位半數(shù)字多用表、PCI-GPIB接口控制器的自動(dòng)精度校準(zhǔn)系統(tǒng)，提高了測(cè)量準(zhǔn)確度。利用Agilent33220A函數(shù)發(fā)生器模擬12路電渦流位移傳感器產(chǎn)生電位對(duì)應(yīng)電壓信號(hào)，采用本檢測(cè)系統(tǒng)采集零點(diǎn)電壓值和模擬平板檢測(cè)電壓值，驗(yàn)證檢測(cè)合格指示狀態(tài)。按要求查詢(xún)歷史檢測(cè)數(shù)據(jù)，檢測(cè)系統(tǒng)數(shù)據(jù)庫(kù)管理功能。測(cè)試過(guò)程的順利進(jìn)行，保證了整個(gè)檢測(cè)系統(tǒng)的正常工作運(yùn)行。 目前平板電子產(chǎn)品飛速發(fā)展，人們對(duì)其質(zhì)量的檢測(cè)工作也越來(lái)越為重視，介于實(shí)際檢測(cè)成本和精度的需求，本系統(tǒng)設(shè)計(jì)不僅性?xún)r(jià)比高，而且具有完善的數(shù)據(jù)庫(kù)管理等功能，目前已在平板平面度檢測(cè)線上得到成功應(yīng)用。
[Abstract]:With the development of electronic technology , flat panel technology has become more and more applicable to electronic products . The flatness of flat panel products is an important factor to determine the quality of flat panel products .

This paper presents a design scheme of the intelligent flat - plate flatness detection system based on the system - type single - chip - based on mixed signal chip . The system is based on the principle of diagonal layout . The system is based on the principle of minimum condition principle . The SOC system - level MCU chip is used as the intelligent core of the collector . By means of the Modbus protocol , the data acquisition of the flat plate is completed . By using the Modbus protocol to form the industrial - level 232 network , the communication with the upper computer is completed . The upper computer uses the LabVIEW to develop the program - controlled interface , and realizes the query , management and other operations of the data acquisition and history collection of the flat data to be detected .

The main work of this paper includes the following aspects :

( 1 ) To study the relevant evaluation criterion of flatness detection of flat plate . Based on the actual detection flatness , the maximum error criterion is selected , the electric eddy current displacement sensor is selected , and the deviation of all measuring points with respect to the ideal plane is calculated according to the difference between the maximum value and the minimum value according to the difference between the maximum value and the minimum value . After the error evaluation is performed by using the diagonal rule , the original measurement data is converted into the data relative to the reference plane , and the flatness measurement result is verified according to the minimum condition principle .

( 2 ) The intelligent acquisition system based on highly integrated SOC system level MCU chip is proposed . The system adopts the sensor to acquire the plate displacement signal , and switches the analog signal input through the multi - way analog switch , amplifies the front end of the signal through the instrument amplifying circuit . The system realizes the single chip intelligent acquisition design by using the Modbus communication protocol RTU transmission mode to realize the communication between the acquisition board and the PC . In order to prevent the transmission error during the transmission process , the system performs the CRC check of the whole message content .

( 3 ) developing the program control interface of the upper computer of the flat - plate flatness detection system by adopting a graphical visual software LabVIEW ;
configuring serial port communication parameters , collecting gated channel voltage data , and converting into corresponding detection values according to the acquired voltage values ;
setting a plate detection eligibility criterion , judging the flatness of the flat plate to be qualified , collecting repeatedly for multiple times , and performing detection data statistics ;
calling an Access database , storing the real - time detection data , and inquiring history detection plate conformity , inquiring the appointed day test plate data , deleting the measured data , printing and the like ;
The user login and password modification interface are designed to enhance the security of the detection system .

( 4 ) The function test system needs to be tested according to the flatness detection system of the flat plate . The automatic precision calibration system of the function generator , the six - bit semi - digital multi - purpose table and the PCI interface controller is constructed , and the measurement accuracy is improved . The detection system is used for simulating 12 paths of electric eddy current displacement sensors to generate potential corresponding voltage signals . The detection system collects the zero voltage value and the analog flat panel detection voltage value , and verifies the test pass indication state . According to the requirement , the history detection data is inquired , and the database management function of the system is detected .

At present , flat - plate electronic products are rapidly developing , and people pay more and more attention to the detection of their quality . The system is not only cost - effective , but also has perfect database management functions , and has been successfully applied on the flat - level detection line .

【學(xué)位授予單位】：西華大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2012
【分類(lèi)號(hào)】：TP274;TP368.12

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本文編號(hào)：1734628