基于USB3.0的高速讀數(shù)盒設(shè)計(jì)
發(fā)布時(shí)間:2018-01-17 23:17
本文關(guān)鍵詞:基于USB3.0的高速讀數(shù)盒設(shè)計(jì) 出處:《計(jì)算機(jī)測(cè)量與控制》2014年09期 論文類型:期刊論文
更多相關(guān)文章: USB.O Slave Fifo 固件設(shè)計(jì) EZ-USB FX
【摘要】:針對(duì)測(cè)試系統(tǒng)中USB2.O接口已不能滿足當(dāng)代測(cè)試速度需求,提出一種基于USB3.O和FPGA的高速讀數(shù)的解決方案;該方案以FPGA為核心控制器,EZ-USB FX3被配置成Slave Fifo從模式;通過(guò)對(duì)DMA通道和GPIFⅡ接口優(yōu)化設(shè)計(jì)以實(shí)現(xiàn)指令的下傳和數(shù)據(jù)的高速上傳;經(jīng)實(shí)際傳輸測(cè)試,該讀數(shù)盒能在傳輸數(shù)率高達(dá)228 MB/s時(shí)依然能保持正確無(wú)誤的高速傳輸。
[Abstract]:In view of the fact that the USB2.O interface in the test system can no longer meet the needs of modern testing speed, a solution of high speed reading based on USB3.O and FPGA is proposed. The EZ-USB FX3 is configured into Slave Fifo slave mode with FPGA as the core controller. By optimizing the design of DMA channel and GPIF 鈪,
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