基于模型的三維觀測(cè)系統(tǒng)優(yōu)化設(shè)計(jì)
發(fā)布時(shí)間：2019-04-10 12:15
【摘要】：在地震勘探中,觀測(cè)系統(tǒng)是指炮點(diǎn)與檢波點(diǎn)的相互位置關(guān)系。觀測(cè)系統(tǒng)優(yōu)化設(shè)計(jì)的最終目的是提高地震采集資料的質(zhì)量。本文從CMP面元屬性分析和CRP面元照明分析兩個(gè)方面出發(fā),分別對(duì)三維層狀水平模型和二維層狀起伏模型的觀測(cè)系統(tǒng)進(jìn)行了優(yōu)化設(shè)計(jì)。 在CMP面元屬性分析方面,首先從觀測(cè)系統(tǒng)參數(shù)統(tǒng)計(jì)出發(fā),總結(jié)了一組獨(dú)立參數(shù)。在此基礎(chǔ)上,統(tǒng)計(jì)出三維觀測(cè)系統(tǒng)CMP而元三個(gè)屬性——覆蓋次數(shù)、方位角和炮檢距分布情況,并提出了基于炮檢對(duì)密度的覆蓋次數(shù)計(jì)算方法。隨后,給出了目標(biāo)函數(shù),根據(jù)目標(biāo)函數(shù)分別對(duì)三個(gè)屬性進(jìn)行局部尋優(yōu)得到尋優(yōu)曲線。在CMP面元全局尋優(yōu)時(shí),為了克服計(jì)算量問題,筆者首先研究了約束條件,在強(qiáng)約束的條件下,實(shí)現(xiàn)了覆蓋次數(shù)屬性的全局尋優(yōu)并得到觀測(cè)系統(tǒng)尋優(yōu)參數(shù)表格,最后通過炮檢距和方位角屬性的目標(biāo)函數(shù)值進(jìn)行尋優(yōu)結(jié)果篩選,得到了一組基于CMP理論的最佳觀測(cè)系統(tǒng)參數(shù)。 在CRP面元照明分析方面,首先建立了一個(gè)目標(biāo)層起伏的二維層狀模型,并針對(duì)該模型實(shí)現(xiàn)了基于逐段迭代方法的射線追蹤。通過統(tǒng)計(jì)CRP面元的覆蓋次數(shù),得到了目的層照明曲線。為了克服觀測(cè)系統(tǒng)離散采樣造成的照明曲線高頻振蕩以及射線路徑的唯 性造成照明強(qiáng)度的極值和空白等失真現(xiàn)象,筆者從兩個(gè)方面對(duì)CRP面元照明方法進(jìn)行改善和進(jìn)化。其一,通過增加采集密度和增大面元尺寸實(shí)現(xiàn)了照明曲線的平緩過度；其二,實(shí)現(xiàn)了多路徑射線追蹤的照明分析方法,并對(duì)二維層狀起伏模型進(jìn)行了單炮排列照明分析和多炮照明分析。 本文得到若干結(jié)論和認(rèn)識(shí)。第一、筆者提出了基于炮檢對(duì)密度的覆蓋次數(shù)計(jì)算公式,與傳統(tǒng)的覆蓋次數(shù)經(jīng)驗(yàn)公式相比,該公式更加究備合理,綜合考慮觀測(cè)系統(tǒng)參數(shù)與覆蓋次數(shù)的關(guān)系；第一、筆者實(shí)現(xiàn)了CMP面元三個(gè)屬性的統(tǒng)計(jì)和局部尋優(yōu),覆蓋次數(shù)局部尋優(yōu)曲線表明,在縱測(cè)線方向上,當(dāng)排列的接收道數(shù)是滾動(dòng)道數(shù)的2N(N為正整數(shù))倍時(shí),覆蓋次數(shù)完全均勻；在橫向上較為復(fù)雜,討論結(jié)果較為復(fù)雜；第三、CMP面元全局尋優(yōu)計(jì)算量極大,筆者在強(qiáng)約束條件下,實(shí)現(xiàn)了覆蓋次數(shù)屬性全局尋優(yōu),并通過炮檢距和方位角屬性的尋優(yōu)篩選,得到了基于CMP面元屬性理論上的最佳觀測(cè)系統(tǒng)參數(shù)；第四、傳統(tǒng)CRP面元覆蓋次數(shù)照明分析射線路徑具有單一性,對(duì)于起伏模型容易出現(xiàn)照明曲線的強(qiáng)烈振蕩,增加采樣密度或者增大面元尺寸能夠改善照明結(jié)果；第五、筆者實(shí)現(xiàn)了基于多路徑射線追蹤的照明分析方法,該方法能夠顯著減小地層起伏造成照明曲線的失真現(xiàn)象,照明結(jié)果更加合理。
[Abstract]:In seismic exploration, observation system refers to the relationship between gunpoint and detection point. The final goal of optimal design of observation system is to improve the quality of seismic acquisition data. In this paper, the observation systems of three-dimensional layered horizontal model and two-dimensional layered undulating model are optimized from the aspects of CMP surface element attribute analysis and CRP surface element illumination analysis. In the aspect of CMP surface element attribute analysis, a set of independent parameters are summarized from the observation system parameter statistics. On this basis, the distribution of coverage number, azimuth and offset of the three-dimensional observation system CMP and its elements are calculated, and a method for calculating the number of coverage based on the density of gun detection is put forward. Then, the objective function is given. According to the objective function, the local optimization curve of three attributes is obtained. In order to overcome the computation problem in the global optimization of CMP surface element, the constraint condition is studied firstly. Under the condition of strong constraint, the global optimization of coverage number attribute is realized and the optimization parameter table of the observation system is obtained. Finally, a set of optimal observation system parameters based on CMP theory is obtained by screening the optimal results by the target function values of offset and azimuth attributes. In the aspect of CRP panel illumination analysis, a two-dimensional layered model of object layer fluctuation is established firstly, and the ray tracing based on step-by-step iterative method is realized. The illumination curve of the target layer is obtained by counting the covering times of the CRP surface elements. In order to overcome the distortion phenomena such as high frequency oscillation of illumination curve caused by discrete sampling of observation system and the extreme value and blank of illumination intensity caused by the only ray path, the CRP panel illumination method is improved and evolved from two aspects. First, by increasing the sampling density and increasing the size of the surface element, the lighting curve is over-smooth; Secondly, the illumination analysis method of multi-path ray tracing is realized, and the single shot arrangement illumination analysis and multi-gun illumination analysis are carried out for the two-dimensional layered undulation model. Some conclusions and understandings are obtained in this paper. Firstly, the author puts forward a formula for calculating the number of coverage based on the density of gun detection. Compared with the traditional empirical formula of covering times, the formula is more reasonable and takes into account the relationship between the parameters of observation system and the number of coverage. First, the author realizes the statistics and local optimization of the three attributes of CMP element. The local optimization curve of covering times shows that in the direction of longitudinal measurement line, when the number of received channels is 2N (N is a positive integer) times of the number of rolling channels, the number of channels arranged is 2N (N is a positive integer) of the number of rolling channels. The coverage times are completely uniform; On the horizontal side, it is more complex and the discussion result is more complex; Thirdly, the global optimization calculation of CMP surface element is very large. Under the condition of strong constraint, the global optimization of coverage number attribute is realized, and the optimal selection of offset and azimuth attributes is carried out. The optimal parameters of observation system based on the theory of CMP surface element attributes are obtained. Fourth, the ray path of the traditional CRP panel covering times illumination analysis is unitary. For the undulating model, it is easy to appear the strong oscillation of the illumination curve. Increasing the sampling density or increasing the size of the surface element can improve the lighting results. Fifthly, the author has realized the illumination analysis method based on multi-path ray tracing. This method can significantly reduce the distortion of lighting curve caused by stratum undulation, and the lighting result is more reasonable.
【學(xué)位授予單位】：西南石油大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：P631.4
本文編號(hào)：2455789
[Abstract]:In seismic exploration, observation system refers to the relationship between gunpoint and detection point. The final goal of optimal design of observation system is to improve the quality of seismic acquisition data. In this paper, the observation systems of three-dimensional layered horizontal model and two-dimensional layered undulating model are optimized from the aspects of CMP surface element attribute analysis and CRP surface element illumination analysis. In the aspect of CMP surface element attribute analysis, a set of independent parameters are summarized from the observation system parameter statistics. On this basis, the distribution of coverage number, azimuth and offset of the three-dimensional observation system CMP and its elements are calculated, and a method for calculating the number of coverage based on the density of gun detection is put forward. Then, the objective function is given. According to the objective function, the local optimization curve of three attributes is obtained. In order to overcome the computation problem in the global optimization of CMP surface element, the constraint condition is studied firstly. Under the condition of strong constraint, the global optimization of coverage number attribute is realized and the optimization parameter table of the observation system is obtained. Finally, a set of optimal observation system parameters based on CMP theory is obtained by screening the optimal results by the target function values of offset and azimuth attributes. In the aspect of CRP panel illumination analysis, a two-dimensional layered model of object layer fluctuation is established firstly, and the ray tracing based on step-by-step iterative method is realized. The illumination curve of the target layer is obtained by counting the covering times of the CRP surface elements. In order to overcome the distortion phenomena such as high frequency oscillation of illumination curve caused by discrete sampling of observation system and the extreme value and blank of illumination intensity caused by the only ray path, the CRP panel illumination method is improved and evolved from two aspects. First, by increasing the sampling density and increasing the size of the surface element, the lighting curve is over-smooth; Secondly, the illumination analysis method of multi-path ray tracing is realized, and the single shot arrangement illumination analysis and multi-gun illumination analysis are carried out for the two-dimensional layered undulation model. Some conclusions and understandings are obtained in this paper. Firstly, the author puts forward a formula for calculating the number of coverage based on the density of gun detection. Compared with the traditional empirical formula of covering times, the formula is more reasonable and takes into account the relationship between the parameters of observation system and the number of coverage. First, the author realizes the statistics and local optimization of the three attributes of CMP element. The local optimization curve of covering times shows that in the direction of longitudinal measurement line, when the number of received channels is 2N (N is a positive integer) times of the number of rolling channels, the number of channels arranged is 2N (N is a positive integer) of the number of rolling channels. The coverage times are completely uniform; On the horizontal side, it is more complex and the discussion result is more complex; Thirdly, the global optimization calculation of CMP surface element is very large. Under the condition of strong constraint, the global optimization of coverage number attribute is realized, and the optimal selection of offset and azimuth attributes is carried out. The optimal parameters of observation system based on the theory of CMP surface element attributes are obtained. Fourth, the ray path of the traditional CRP panel covering times illumination analysis is unitary. For the undulating model, it is easy to appear the strong oscillation of the illumination curve. Increasing the sampling density or increasing the size of the surface element can improve the lighting results. Fifthly, the author has realized the illumination analysis method based on multi-path ray tracing. This method can significantly reduce the distortion of lighting curve caused by stratum undulation, and the lighting result is more reasonable.
【學(xué)位授予單位】：西南石油大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：P631.4
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