基于DICE結構的抗輻射移位寄存器設計研究
發(fā)布時間：2019-06-13 23:39
【摘要】：微電子技術的迅猛發(fā)展和航天科技的進步,互補金屬氧化物半導體(Complementary Metal Oxide Semiconductor,CMOS)集成電路(Integrated Circuit,IC)在各種航天器和空間平臺中得到了廣泛地運用,無論是對設備的控制或者是對數(shù)據(jù)的存儲和處理等,都在很大程度上依賴于IC,而這些設備所運行的空間環(huán)境是一個充滿各種離子射線的輻射環(huán)境�？臻g飛行器運行在這樣的輻射環(huán)境中時,設備中的電子器件就很容易受到各種高能離子的輻射影響,引起其信息處理系統(tǒng)的功能異常甚至是電子器件的損毀,從而大大降低了空間飛行器運行的可靠性。如何提高集成電路在輻射環(huán)境下工作的可靠性,成為了一個研究的熱點。寄存器作為集成電路中非常重要的存儲單元,對輻射效應尤為敏感,對寄存器的抗輻射加固制約著數(shù)字存儲類和邏輯類集成電路的抗輻射性能。隨著航天事業(yè)的不斷發(fā)展,對集成電路的抗輻射性能要求越來越高。雙互鎖存(Dual interlocked storage cell,DICE)結構單元作為一種抗輻射加固設計方法,目前正被廣泛地研究與應用,基于DICE結構的移位寄存器的設計對驗證其抗輻射性能起著重要作用�；谏鲜霰尘�,為了驗證DICE結構加固設計方法在抗單粒子輻射方面的有效性,本文立足于0.18μm的商用工藝線,設計了基于DICE結構的1024位移位寄存器,并設計了單粒子輻射效應實驗測試系統(tǒng)。具體研究內(nèi)容包括:對空間輻射環(huán)境,集成電路中的各種輻射效應及損傷機理進行了理論分析與研究;針對存儲單元尤為敏感的單粒子效應(Single event effects,SEEs)進行了重點地分析研究,并結合PN結和具體的鎖存單元來對單粒子效應的影響進行了分析說明;對DICE結構的鎖存單元的工作原理及其抗輻射性能進行了仿真研究。分別設計了采用DICE結構加固與采用傳統(tǒng)6管結構的1024位的移位寄存器。首先利用軟件模擬仿真的方法來進行單粒子輻射效應仿真,對比研究了傳統(tǒng)結構D觸發(fā)器與DICE結構的D觸發(fā)器的抗單粒子輻射性能,并對時鐘樹等全局電路的抗輻射加固方法進行了研究。其次在D觸發(fā)器的基礎上設計1024位的移位寄存器,并對所設計的移位寄存器進行了版圖加固設計、優(yōu)化并完成了流片,對芯片功能測試的結果表明,達到了預期的設計效果。最后針對移位寄存器抗輻射實驗的需要,設計并構建了抗單粒子輻射實驗測試系統(tǒng)。本文對抗輻射存儲單元的設計具有一定的參考意義。
[Abstract]:With the rapid development of microelectronics technology and the progress of space science and technology, complementary metal oxide semiconductor (Complementary Metal Oxide Semiconductor,CMOS integrated circuit (Integrated Circuit,IC) has been widely used in various spacecraft and space platforms. Whether it is the control of equipment or the storage and processing of data, it depends to a large extent on IC,. The space environment in which these devices operate is a radiation environment full of various ion rays. When the space vehicle runs in such a radiation environment, the electronic devices in the equipment are easily affected by the radiation of all kinds of high energy ions, which leads to the abnormal function of its information processing system and even the damage of the electronic devices, thus greatly reducing the reliability of the operation of the space vehicle. How to improve the reliability of integrated circuits in radiation environment has become a hot research topic. As a very important memory unit in integrated circuits, registers are particularly sensitive to radiation effect. The anti-radiation reinforcement of registers restricts the radiation resistance of digital storage and logic integrated circuits. With the continuous development of aerospace industry, the radiation resistance of integrated circuits is required to be higher and higher. As a kind of radiation reinforcement design method, double interlocked (Dual interlocked storage cell,DICE) structural unit is being widely studied and applied. The design of shift register based on DICE structure plays an important role in verifying its radiation resistance. Based on the above background, in order to verify the effectiveness of DICE structure reinforcement design method in resisting single particle radiation, a 1024 bit shift register based on DICE structure is designed based on 0.18 渭 m commercial process line, and an experimental test system for single particle radiation effect is designed. The specific research contents include: the space radiation environment, various radiation effects and damage mechanism in integrated circuits are analyzed and studied theoretically, and the single particle effect (Single event effects,SEEs, which is particularly sensitive to memory cells, is analyzed and studied, and the influence of single particle effect is analyzed and explained in combination with PN junction and specific latch unit. The working principle and radiation resistance of latch unit with DICE structure are simulated and studied. The 1024-bit shift register with DICE structure and traditional 6-tube structure is designed respectively. Firstly, the single particle radiation effect simulation is carried out by using the software simulation method, and the anti-single particle radiation performance of the traditional D flip-flop and the DICE D flip-flop is compared and studied, and the anti-radiation reinforcement method of the clock tree and other global circuits is studied. Secondly, a 1024-bit shift register is designed on the basis of D flip-flop, and the layout reinforcement design of the designed shift register is carried out, and the chip is optimized and completed. The results of the chip function test show that the expected design effect has been achieved. Finally, aiming at the need of anti-radiation experiment of shift register, a test system of anti-single particle radiation experiment is designed and constructed. The design of anti-radiation memory cell has certain reference significance in this paper.
【學位授予單位】：電子科技大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN402
本文編號：2498913
[Abstract]:With the rapid development of microelectronics technology and the progress of space science and technology, complementary metal oxide semiconductor (Complementary Metal Oxide Semiconductor,CMOS integrated circuit (Integrated Circuit,IC) has been widely used in various spacecraft and space platforms. Whether it is the control of equipment or the storage and processing of data, it depends to a large extent on IC,. The space environment in which these devices operate is a radiation environment full of various ion rays. When the space vehicle runs in such a radiation environment, the electronic devices in the equipment are easily affected by the radiation of all kinds of high energy ions, which leads to the abnormal function of its information processing system and even the damage of the electronic devices, thus greatly reducing the reliability of the operation of the space vehicle. How to improve the reliability of integrated circuits in radiation environment has become a hot research topic. As a very important memory unit in integrated circuits, registers are particularly sensitive to radiation effect. The anti-radiation reinforcement of registers restricts the radiation resistance of digital storage and logic integrated circuits. With the continuous development of aerospace industry, the radiation resistance of integrated circuits is required to be higher and higher. As a kind of radiation reinforcement design method, double interlocked (Dual interlocked storage cell,DICE) structural unit is being widely studied and applied. The design of shift register based on DICE structure plays an important role in verifying its radiation resistance. Based on the above background, in order to verify the effectiveness of DICE structure reinforcement design method in resisting single particle radiation, a 1024 bit shift register based on DICE structure is designed based on 0.18 渭 m commercial process line, and an experimental test system for single particle radiation effect is designed. The specific research contents include: the space radiation environment, various radiation effects and damage mechanism in integrated circuits are analyzed and studied theoretically, and the single particle effect (Single event effects,SEEs, which is particularly sensitive to memory cells, is analyzed and studied, and the influence of single particle effect is analyzed and explained in combination with PN junction and specific latch unit. The working principle and radiation resistance of latch unit with DICE structure are simulated and studied. The 1024-bit shift register with DICE structure and traditional 6-tube structure is designed respectively. Firstly, the single particle radiation effect simulation is carried out by using the software simulation method, and the anti-single particle radiation performance of the traditional D flip-flop and the DICE D flip-flop is compared and studied, and the anti-radiation reinforcement method of the clock tree and other global circuits is studied. Secondly, a 1024-bit shift register is designed on the basis of D flip-flop, and the layout reinforcement design of the designed shift register is carried out, and the chip is optimized and completed. The results of the chip function test show that the expected design effect has been achieved. Finally, aiming at the need of anti-radiation experiment of shift register, a test system of anti-single particle radiation experiment is designed and constructed. The design of anti-radiation memory cell has certain reference significance in this paper.
【學位授予單位】：電子科技大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN402
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