【摘要】：為了研究行間轉(zhuǎn)移型彩色面陣CCD在毫秒脈沖激光輻照下的損傷效果,采用實驗研究的方法,測量了不同能量密度的激光作用下,CCD表面中心點溫度、受損區(qū)域面積、深度及CCD內(nèi)部復位時鐘信號和阻抗值的變化,結(jié)合CCD輸出圖像中出現(xiàn)不可恢復的焦斑及黑白雪花現(xiàn)象,對彩色面陣CCD在毫秒脈沖激光作用下的損傷效果進行了分析。結(jié)果表明,在毫秒脈沖激光的輻照作用下,行間轉(zhuǎn)移型彩色面陣CCD內(nèi)部結(jié)構(gòu)會產(chǎn)生不同程度的燒蝕,當能量密度達到23.49J/cm~2時,燒蝕深度直達基底層,致使CCD內(nèi)部信號傳輸通道斷開,漏電流增加,最終造成CCD無信號輸出,完全損壞。該研究對CCD探測器在強激光作用下的損傷效果研究是有幫助的。
[Abstract]:In order to study the damage effect of interrow transfer color array CCD irradiated by millisecond pulse laser, the temperature of the center point of CCD surface and the area of the damaged area were measured by the method of experimental study under the action of laser with different energy density. Based on the changes of depth and internal reset clock signal and impedance of CCD, combined with the irreparable focal spot and black-and-white snowflake in CCD output image, the damage effect of color area array CCD under millisecond pulse laser is analyzed. The results show that under the irradiation of millisecond pulse laser, the interior structure of the interrow transfer color array CCD will be ablated in varying degrees. When the energy density reaches 23.49J/cm~2, the ablation depth will reach the base layer directly. CCD internal signal transmission channel is disconnected, leakage current increases, resulting in CCD signal-free output, completely damaged. This study is helpful to study the damage effect of CCD detector under the action of high power laser.
【作者單位】： 長春理工大學理學院光學系;
【分類號】：TN386.5

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