【摘要】：NoC因其可靠性高和可擴(kuò)展性好等優(yōu)點(diǎn),已經(jīng)被研究的越來(lái)越多。集成電路的測(cè)試伴隨著芯片的設(shè)計(jì)、驗(yàn)證、生產(chǎn)和后期維護(hù)等整個(gè)生命周期。在NoC中,IP核通過(guò)路由器來(lái)相互通信。對(duì)于IP核的測(cè)試,一種通用的做法是復(fù)用已有的NoC通信架構(gòu)來(lái)傳輸測(cè)試數(shù)據(jù)。但是在復(fù)用NoC架構(gòu)作為測(cè)試訪問(wèn)機(jī)制對(duì)內(nèi)嵌核測(cè)試時(shí),如果有多個(gè)I/O接口并行測(cè)試時(shí)就容易發(fā)生資源的沖突。同時(shí),在很多測(cè)試方法中,測(cè)試路徑的建立以及測(cè)試響應(yīng)的收集等在網(wǎng)絡(luò)接口(NI, network interface)中實(shí)現(xiàn)。但作為NoC的重要組成部分,關(guān)于NI的可靠性研究卻往往被忽略。因此,本課題針對(duì)以上問(wèn)題,分別從并行測(cè)試調(diào)度和NI可靠性兩方面展開研究。論文主要工作如下：(1)為了解決多區(qū)域并行測(cè)試的資源沖突問(wèn)題,提出一種無(wú)鏈路沖突的測(cè)試調(diào)度方法。首先使用分區(qū)算法將網(wǎng)絡(luò)劃分多個(gè)區(qū)域,然后使用鏈路分配算法對(duì)節(jié)點(diǎn)建立路徑樹來(lái)查找可連通路徑,最后全局考慮各個(gè)區(qū)域的連通路徑來(lái)分配鏈路使所有區(qū)域都連通,從而避免資源沖突、減少測(cè)試時(shí)間、保證測(cè)試可靠性。實(shí)驗(yàn)結(jié)果表明,相對(duì)于基準(zhǔn)對(duì)象,該方法可減少測(cè)試時(shí)間14.13%～52.62%,相比于已有算法,測(cè)試時(shí)間最多減少了16.42%,是一種較優(yōu)的無(wú)沖突測(cè)試調(diào)度方法。(2)針對(duì)NI的可靠性以及可能的數(shù)據(jù)包亂序問(wèn)題。本文提出一種支持重排序的高可靠NI設(shè)計(jì)。首先通過(guò)在NI發(fā)送端和接收端都使用雙虛通道設(shè)計(jì),達(dá)到與路由器高效互連的目的,同時(shí)增加了NI可靠性。其次,設(shè)計(jì)一種新的重排序方法,對(duì)重排序buffer使用一種鏈?zhǔn)讲檎冶淼姆绞綄?shí)現(xiàn)對(duì)亂序數(shù)據(jù)包的高效重排序,同時(shí)增加了buffer的利用率。
[Abstract]:NoC has been studied more and more because of its high reliability and good scalability. Integrated circuit testing is accompanied by chip design, verification, production and post-maintenance throughout the life cycle. In NoC, the IP core communicates with each other through routers. For IP core testing, a general approach is to reuse the existing NoC communication architecture to transmit test data. However, when reusing NoC architecture as a test access mechanism, embedded kernel testing, if there are multiple I / O interfaces parallel testing, will be prone to resource conflicts. At the same time, in many test methods, the establishment of test path and the collection of test response are implemented in the network interface (NI, network interface). However, as an important part of NoC, the research on reliability of NI is often ignored. Therefore, aiming at the above problems, the parallel test scheduling and NI reliability are studied in this paper. The main work of this paper is as follows: (1) in order to solve the resource collision problem of multi-area parallel testing, a link-free test scheduling method is proposed. Firstly, the network is divided into several regions by using the partition algorithm, then the link allocation algorithm is used to establish a path tree for the nodes to find the accessible path, and finally, the connected paths of each area are considered globally to allocate the links so that all the areas are connected. So as to avoid resource conflict, reduce test time and ensure test reliability. The experimental results show that the proposed method can reduce the test time by 14.13% and 52.62%, and the test time can be reduced by up to 16.42% compared with the existing algorithms. It is an optimal conflict-free test scheduling method. (2) aiming at the reliability of NI and the possible packet disorder problem. This paper presents a highly reliable NI design that supports reordering. First, the dual virtual channel design is used in the NI transmitter and receiver to achieve the purpose of efficient interconnection with the router, and at the same time, the reliability of the NI is increased. Secondly, a new reordering method is designed, which uses a chain look-up table to realize the efficient reordering of out-of-order packets for reordering buffer, and increases the utilization of buffer at the same time.
【學(xué)位授予單位】：合肥工業(yè)大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TN407

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