【摘要】：當(dāng)基于微通道板(MCP)的光電探測器受到強(qiáng)輻射干擾時,MCP的飽和將導(dǎo)致探測器的時間分辨率和空間分辨率發(fā)生改變.本文建立了飽和工作狀態(tài)下MCP電子云運(yùn)動仿真模型,與常規(guī)的線性工作狀態(tài)的不同之處在于,該模型考慮了MCP通道壁上累積的正電荷對通道內(nèi)電子云運(yùn)動特性的影響.仿真結(jié)果表明,當(dāng)MCP工作在線性狀態(tài),電極浸入深度的不同對通道電子云能量分布有很大差異,而工作在飽和狀態(tài),通道電子云能量分布趨于一致.電子能量分布曲線與相關(guān)文獻(xiàn)的實(shí)驗(yàn)數(shù)據(jù)擬合良好,驗(yàn)證了模型的正確性.
[Abstract]:When the photodetector based on microchannel plate (MCP) is disturbed by strong radiation, the saturation of MCP will cause the temporal resolution and spatial resolution of the detector to change. In this paper, the motion simulation model of MCP electron cloud in saturated state is established. The difference between the model and the conventional linear operation state is that the model takes into account the effect of positive charge accumulated on the wall of MCP channel on the motion characteristics of electron cloud in the channel. The simulation results show that when the MCP is in linear state, the energy distribution of the channel electron cloud varies greatly when the electrode immersion depth is different, while the energy distribution of the channel electron cloud tends to be consistent in the saturated state. The electron energy distribution curve fitted well with the experimental data in the related literature, which verified the correctness of the model.
【作者單位】： 電子工程學(xué)院脈沖功率激光技術(shù)國家重點(diǎn)實(shí)驗(yàn)室;
【基金】：National Science Foundation for Young Scientists of China(No.41605015) State KeyLaboratory of Pulsed Power Laser Technology Funds(No.SKL2016ZR06)
【分類號】：TN15
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本文編號：2433949