【摘要】：提出了一種基于頻譜響應特性的集成電路故障預測技術,該技術成功實現(xiàn)了數(shù)字芯片SP3232E在故障診斷與故障預測中的應用,并驗證了其在電子元器件的故障診斷與故障預測上的可行性與有效性。實驗結果表明,該方法的故障診斷準確率高達92%以上;該數(shù)字器件延時信號經(jīng)過頻譜分析后的相位與其對應的退化率呈單指數(shù)函數(shù)關系,且隨著掃頻頻率的減小,器件的相位增加,退化率減小,退化率50%~80%對應的相位區(qū)間可定義為器件的故障診斷閾值或預警區(qū)間;在低頻下相位的變化速度更慢,故該方法在低頻下的故障預測誤差更小,故障預測精度更高。
[Abstract]:An integrated circuit fault prediction technology based on spectrum response characteristics is proposed. The application of digital chip SP3232E in fault diagnosis and fault prediction is successfully realized. Its feasibility and effectiveness in fault diagnosis and fault prediction of electronic components are verified. The experimental results show that the accuracy of fault diagnosis is over 92%. The phase of the delay signal of the digital device after spectrum analysis has a single exponential function relationship with its corresponding degradation rate. With the decrease of the sweep frequency, the phase of the device increases and the degradation rate decreases. The phase range corresponding to 80% of the degradation rate can be defined as the fault diagnosis threshold or early warning interval of the device. The speed of phase change is slower at low frequency, so the error of fault prediction is smaller and the precision of fault prediction is higher.
【作者單位】： 華南理工大學材料科學與工程學院;工業(yè)和信息化部電子第五研究所電子元器件可靠性物理及其應用技術重點實驗室;
【基金】：民機預研專項資助項目(MIZ1528010) 國家技術基礎科研項目(JSZL2014610B002)
【分類號】：TN407
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本文編號：2321036