基于XDL網(wǎng)表的SRAM型FPGA單粒子軟錯誤敏感性分析
[Abstract]:With the increasing complexity and precision of space instruments, SRAM type FPGA, which has the advantages of high performance, low cost and reconfiguration, has been used more and more in space instruments. While improving the performance of space instruments, it also leads to many problems, among which the effect of single particle effect is especially prominent, and the effect will become more and more serious with the decreasing of the feature size of integrated circuits. By analyzing the sensitivity of single particle soft error in FPGA system, we can find out the most serious effect of single particle effect in FPGA system, and grasp the weak link in the design against single particle soft error. In this way, the operation of the system in orbit can be predicted on the ground, and the system reinforcement and countermeasures can be made to ensure the normal operation of the system. At present, high-energy particle experiments and fault injection are widely used to evaluate the sensitivity of single particle soft error in devices. The former is costly and the resources are tight, while the latter has long injection time and low efficiency. The sensitivity analysis method of single particle soft error of SRAM type FPGA based on XDL net table is studied in this paper. It can analyze single particle soft error of system quickly and efficiently, and the cost is low. It is an important method to evaluate the sensitivity of single particle soft error of system in the future. Starting from the. Ncd file obtained from the Xilinx FPGA design, the paper obtains the XDL net table, and then develops a software based on Rapidsmith to extract the circuit structure information and analyze the sensitivity of the single particle soft error in the system. The main work of this paper is as follows: (1) the judgment method of sensitive points. The judgment method of sensitive points studied in this paper can locate the sensitive points to every configuration bit and have higher accuracy. The analysis software of XDL net table is developed based on Rapidsmith. The single particle soft error sensitivity analysis for XC4VSX55 FPGA systems is supported at present. (2) the analysis of FPGA resources in XDL net tables. In this paper, the FPGA resources described by the XDL net table are studied, the description of the sensitive resources in the XDL net table is interpreted, the syntax structure of the XDL net table is expounded, and the corresponding relation between the description content and the underlying circuit resources of FPGA is analyzed in detail. It strengthens people's cognition of XDL net tables and FPGA resources, and makes up for the shortcomings of unclear description of this kind of content in China. (3) parsing of FPGA resources in configuration files. This paper completes the mapping relationship between FPGA resources and configuration bits described in the XDL net table, corrects the errors of frame address arrangement of XC4VSX55 chips published on Xilinx official network, and further explores the corresponding relationship between PIPs resources and configuration bits, and analyzes the frame structure. The configuration data of XC4VSX55 chip is basically analyzed, and the research method is universal and suitable for Virtex-5 and higher series chips.
【學位授予單位】:國防科學技術大學
【學位級別】:碩士
【學位授予年份】:2015
【分類號】:V441;TN791
【參考文獻】
相關期刊論文 前9條
1 趙樹軍;王永強;張帥;;時序基準電路S344可測性設計[J];黑龍江工程學院學報;2015年02期
2 宋凝芳;秦姣梅;潘雄;江云天;;SRAM型FPGA單粒子效應逐位翻轉(zhuǎn)故障注入方法[J];北京航空航天大學學報;2012年10期
3 張森;石軍;王九龍;;衛(wèi)星在軌失效統(tǒng)計分析[J];航天器工程;2010年04期
4 薛玉雄;曹洲;楊世宇;田愷;郭剛;劉建成;;IDT6116單粒子敏感性評估試驗技術研究[J];原子能科學技術;2008年01期
5 丁義剛;;空間輻射環(huán)境單粒子效應研究[J];航天器環(huán)境工程;2007年05期
6 邢克飛;楊俊;王躍科;肖爭鳴;周永彬;;Xilinx SRAM型FPGA抗輻射設計技術研究[J];宇航學報;2007年01期
7 張艷紅;陳朝陽;;測試基準電路ITC’02剖析及其應用現(xiàn)狀[J];計算機測量與控制;2006年07期
8 侯明東,馬峰,劉杰;宇航器件中的單粒子效應及其加速器地面模擬[J];核物理動態(tài);1996年01期
9 侯明東;重離子加速器地面模擬單粒子效應[J];輻射防護通訊;1994年04期
相關博士學位論文 前3條
1 王忠明;SRAM型FPGA的單粒子效應評估技術研究[D];清華大學;2011年
2 繩偉光;數(shù)字集成電路軟錯誤敏感性分析與可靠性優(yōu)化技術研究[D];哈爾濱工業(yè)大學;2009年
3 邢克飛;星載信號處理平臺單粒子效應檢測與加固技術研究[D];國防科學技術大學;2007年
相關碩士學位論文 前4條
1 楊道寧;SRAM型FPGA單粒子效應故障注入測試方法關鍵技術研究[D];國防科學技術大學;2013年
2 何偉;SRAM型FPGA單粒子故障傳播特性與測試方法研究[D];國防科學技術大學;2011年
3 吳圣陶;SRAM型FPGA單粒子翻轉(zhuǎn)效應的故障注入系統(tǒng)研究[D];西安電子科技大學;2011年
4 林金茂;SDR平臺抗SEU性能評價關鍵技術研究[D];國防科學技術大學;2009年
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