【摘要】：為解決復(fù)雜芯片的測試與調(diào)試問題,提出支持IEEE 1149.7標(biāo)準(zhǔn)的邊界掃描控制器。在對IEEE 1149.7標(biāo)準(zhǔn)和邊界掃描測試技術(shù)進(jìn)行深入研究的基礎(chǔ)上,利用上位機(jī)進(jìn)行軟件編程,通過QuartusⅡ平臺進(jìn)行IP核的開發(fā),成功設(shè)計(jì)出了支持IEEE 1149.7標(biāo)準(zhǔn)的邊界掃描測試控制器。實(shí)驗(yàn)結(jié)果表明,控制器能夠產(chǎn)生符合IEEE 1149.7標(biāo)準(zhǔn)的兩線星型信號和四線輸出信號。
[Abstract]:In order to solve the problem of testing and debugging complex chips, a boundary scan controller supporting IEEE 1149.7 is proposed. On the basis of deep research on IEEE 1149.7 standard and boundary scan test technology, a boundary scan test controller supporting IEEE 1149.7 standard is successfully designed by using upper computer to program software and developing IP core through Quartus 鈪，

本文編號：2284337