基于過零檢測技術(shù)的Pipelined ADC研究
[Abstract]:Digitization is a topic frequently mentioned nowadays. The progress of technology makes the integration of digital system more and more high and the speed of data processing faster and faster. Great performance advantage makes many analog signal processing work replaced by digital technology. However, the signals produced by nature, such as sound, light, temperature, pressure and so on, are changed in a simulated way. As the interface between analog domain and digital domain, A / D converter is still irreplaceable, but the speed of ADC is greatly improved. At the same time, the popularity of portable devices and smart devices makes the industry pay more attention to the low power design of the system. In this context, universities and companies at home and abroad have proposed many high-speed low-power A-D converter structures. The pipelined A / D converter based on zero crossing detection technology not only retains the advantages of high speed and high precision in the system architecture, but also has the advantages of high speed and high precision. Moreover, the low power zero crossing detector and controlled current source are used to replace the high power operational amplifier in the single stage circuit, which greatly reduces the power consumption of the system. Because there is no feedback loop, the problem of system stability is solved, the design is simplified, and the influence of process change on the system is alleviated. In this paper, a pipelined analog-to-digital converter based on zero-crossing detection technology is designed based on 55nm CMOS technology, which has a power supply voltage of 2.5 V, a resolution of 10 bits and a sampling rate of 50 MSPS. The whole system consists of 10 stages, of which one stage sampling and holding module is 8 stage 1.5 bit sub A / D converter and 1 stage 2 bit parallel A / D converter. In order to improve the dynamic range and linearity, the system adopts a fully differential structure. The function of zero-crossing detection mainly depends on a five-transistor operational amplifier, and the delay adjustment unit is added to the zero-crossing detector to correct the delay caused by the process and temperature. An improved common gate current mirror is used to reduce the charge injection at the output end when the current mirror is turned off. Using the improved zero-crossing detector as the comparator of the parallel analog-to-digital converter, the quantization and coding of the input signal can be completed in the sampling phase, and the residual amplification time of the MDAC in the holding phase is increased. Using the combination of misalignment error foreground correction and offset error background correction to correct the system non-ideal factor and introducing the offset error can effectively reduce the static energy in the output dynamic performance of the analog-to-digital converter. Under the simulation condition that the sampling frequency is 50m SPS and the input signal is 16.89 MHz chord wave signal, the performance of A / D conversion system is about 59 dB, the non-spurious dynamic range is about 67 dB, and the effective bit number is about 9.5 bits. The core power consumption of ADC is about 27.5 MW.
【學(xué)位授予單位】:電子科技大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2016
【分類號(hào)】:TN792
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