【摘要】：放大變換電路測(cè)試系統(tǒng)是放大變換電路板生產(chǎn)、驗(yàn)收環(huán)節(jié)中的重要組成部分,其在放大變換電路板的驗(yàn)收環(huán)節(jié)中起著至關(guān)重要的作用。本課題是與國(guó)內(nèi)某研究院相互合作,為其生產(chǎn)研制一種可以進(jìn)行放大變換電路測(cè)試的設(shè)備。要求設(shè)備具有在一定溫度范圍內(nèi),對(duì)放大變換電路板輸出的電信號(hào)能進(jìn)行準(zhǔn)確測(cè)量的功能,并且滿足其調(diào)試與測(cè)試放大變換電路板要求。在放大變換電路中對(duì)電路板輸入一定的電流信號(hào),在輸出端可以接收到相應(yīng)頻率的脈沖信號(hào),因此放大變換電路也被叫做“I/F變換電路”。該電路已被廣泛的應(yīng)用于各種軍工設(shè)備中,如導(dǎo)彈、雷達(dá)、火箭等。在對(duì)放大變換電路測(cè)試系統(tǒng)的研究方法中,傳統(tǒng)的測(cè)試方法在一個(gè)溫度循環(huán)時(shí)間里只能測(cè)試一發(fā)放大變換電路板,當(dāng)需要測(cè)試多發(fā)放大變換電路板時(shí),需要反復(fù)持續(xù)操作多個(gè)溫度循環(huán)的過(guò)程,不但增加了操作者的工作量,而且消耗了大量的時(shí)間,降低了工作的效率。針對(duì)傳統(tǒng)測(cè)試方法效率低的這一特點(diǎn),本文提出了一種網(wǎng)絡(luò)化的放大變換電路測(cè)試系統(tǒng),與以往傳統(tǒng)測(cè)試方法相比,它不但能在一個(gè)溫度循環(huán)時(shí)間里測(cè)試五發(fā)放大變換電路板,大大的縮短的測(cè)試的時(shí)間,減小里操作者的工作量,提高了測(cè)試的效率,而且可以通過(guò)局域網(wǎng)實(shí)現(xiàn)對(duì)產(chǎn)品指令的下達(dá),通過(guò)數(shù)據(jù)庫(kù)進(jìn)行數(shù)據(jù)上傳,保證了被測(cè)產(chǎn)品信息采集的實(shí)時(shí)性以及被采集數(shù)據(jù)的精準(zhǔn)性。本文根據(jù)實(shí)際被測(cè)產(chǎn)品的性能指標(biāo)和應(yīng)用需求,生產(chǎn)并研制了一臺(tái)基于網(wǎng)絡(luò)化的放大變換電路測(cè)試系統(tǒng)。測(cè)試系統(tǒng)主要由研華工控機(jī)、NI計(jì)算器板卡PCI-6602、NI多功能板卡PCI-6221、放大變換電路測(cè)試箱、橫河恒流源GS200以及高低溫箱等組成。測(cè)試過(guò)程中將放大變換電路板置于高低溫箱內(nèi),等溫箱達(dá)到設(shè)定溫度時(shí),通過(guò)恒流源給電路板提供相應(yīng)的電流信號(hào),當(dāng)電流信號(hào)進(jìn)過(guò)放大變換測(cè)試箱時(shí),將相應(yīng)的電流信號(hào)轉(zhuǎn)換為頻率信息,此時(shí)通過(guò)LabVIEW軟件采集生成的頻率信號(hào),并將其保存到相應(yīng)的數(shù)據(jù)庫(kù)中。當(dāng)生產(chǎn)廠家對(duì)被測(cè)電路板下達(dá)測(cè)試指令時(shí),可以直接通過(guò)局域網(wǎng)下達(dá)測(cè)試指令,操作者就根據(jù)生產(chǎn)廠家的指令對(duì)被測(cè)產(chǎn)品進(jìn)行操作；當(dāng)生產(chǎn)廠家要對(duì)被測(cè)產(chǎn)品數(shù)據(jù)進(jìn)行查閱時(shí),可以直接通過(guò)局域網(wǎng)調(diào)出存儲(chǔ)在數(shù)據(jù)庫(kù)中的被測(cè)產(chǎn)品的信息,極大的提高的測(cè)試信息的實(shí)時(shí)性,同時(shí)減少了因?yàn)槿斯げ僮鞯氖д`而造成的損失。本文通過(guò)結(jié)合制造執(zhí)行系統(tǒng)(MES),建立局域網(wǎng),實(shí)現(xiàn)對(duì)被測(cè)系統(tǒng)信息實(shí)時(shí)化的遠(yuǎn)程監(jiān)控。
[Abstract]:Amplifier transform circuit testing system is an important part of the circuit board production and acceptance, which plays an important role in the acceptance of the amplifier conversion circuit board. This project is to cooperate with a domestic research institute to develop a kind of equipment which can be used for amplifying and converting circuit testing. It is required that the device can accurately measure the electrical signal output from the amplifier and transform circuit board within a certain temperature range, and meet the requirements of debugging and testing the amplifier conversion circuit board. In the amplifier converter circuit, a certain current signal is input to the circuit board, and the pulse signal of the corresponding frequency can be received at the output end. Therefore, the amplifier conversion circuit is also called the "I / F conversion circuit". The circuit has been widely used in various military equipment, such as missiles, radar, rockets and so on. In the research method of amplifying conversion circuit test system, the traditional test method can only test one amplifier transform circuit board in one temperature cycle time, when the multiple amplification conversion circuit board needs to be tested, The process of repeated and continuous operation of multiple temperature cycles not only increases the workload of the operator but also consumes a lot of time and reduces the working efficiency. In view of the low efficiency of the traditional test methods, this paper presents a networked test system for amplifying and transforming circuits. Compared with the traditional test methods, it can not only test the circuit board with five radiations in a temperature cycle time. Greatly shorten the test time, reduce the workload of the operator, improve the efficiency of the test, and through the LAN to achieve the delivery of product instructions, through the database for data upload, It ensures the real-time and the accuracy of the collected data. In this paper, according to the performance index and application requirement of the product under test, a network based test system of amplifier and transform circuit is developed. The test system is mainly composed of PCI-6602NI multi-function board card PCI-6602NI, amplifying and converting circuit test box, transriver constant current source GS200 and high and low temperature box. In the process of testing, the circuit board is placed in a high and low temperature box. When the isothermal box reaches the set temperature, the current signal is supplied to the circuit board through a constant current source. When the current signal enters the test box, The corresponding current signal is converted into frequency information, and the frequency signal is collected by LabVIEW software and stored in the corresponding database. When the manufacturer issues the test instruction to the circuit board under test, it can send the test instruction directly through the local area network. The operator operates the product under the instruction of the manufacturer, and when the manufacturer wants to consult the data of the product under test, The information of the tested products stored in the database can be directly transferred through the LAN, which greatly improves the real-time performance of the test information and reduces the loss caused by human error. In this paper, a local area network (LAN) is established by combining the manufacturing execution system (MES),) to realize the remote monitoring of the real-time information of the system under test.
【學(xué)位授予單位】：西安工業(yè)大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TN722;TP274

【參考文獻(xiàn)】

相關(guān)期刊論文 前4條

1 李文輝;;制造執(zhí)行系統(tǒng)(MES)的應(yīng)用與發(fā)展[J];蘭州理工大學(xué)學(xué)報(bào);2006年02期

2 陳少平;陳卓寧;徐同明;周力;;基于MES的航天軍工離散機(jī)加車間工時(shí)管理研究[J];制造業(yè)自動(dòng)化;2014年08期

3 何瑾;;智能制造裝備業(yè),萬(wàn)億市場(chǎng)藍(lán)圖初現(xiàn)[J];科技智囊;2013年08期

4 杜品圣;;智能工廠——德國(guó)推進(jìn)工業(yè)4.0戰(zhàn)略的第一步(上)[J];自動(dòng)化博覽;2014年01期

相關(guān)碩士學(xué)位論文 前1條

1 鄒蓉;基于LabVIEW平臺(tái)數(shù)字示波儀的設(shè)計(jì)與研究[D];新疆大學(xué);2009年

，

本文編號(hào)：2171441