基于改進(jìn)二分查找的VRC快速故障定位技術(shù)
[Abstract]:In view of the difficulties of fault location in virtual reconfigurable circuit (VRC) and the large test times of traditional fault location methods, a fast fault location technique for VRC based on improved binary search is proposed. When the VRC size is not greater than two rows (or two columns), locate the failure directly row by row (column by column). When the VRC size is larger than two rows and two columns, first perform a row test and a column test to determine the suspect area for the programmable elements PE; then compare the number of rows / columns in the suspect area. In the end, the circuit is configured according to the line / column test principle, and the "and" operation is performed to locate the fault according to the output result. When the suspected fault area cannot be dichotomized, all failure PEs can be located. The analysis of fault location performance shows that compared with the conventional VRC fault location technology, the proposed VRC fast fault location technique can quickly detect and isolate continuously distributed VRC, and reduce the test area quickly. The probability of maximum test times is much lower than that of the former, and the average number of times of single and double fault location is reduced by more than 50 times. The feasibility and validity of the VRC fast fault location technology based on improved binary search is verified, which has a certain generality and engineering application value.
【作者單位】: 軍械工程學(xué)院電子與光學(xué)工程系;中國空氣動力研究與發(fā)展中心超高速空氣動力研究所;
【基金】:國家自然科學(xué)基金(61372039,61601495)
【分類號】:TN70
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