本文選題：模擬電路 + 參數(shù)測量　； 參考：《西北師范大學》2015年碩士論文

【摘要】：目前對模擬電路而言,研究者們大都關(guān)注于它在實際電路中的應(yīng)用,而對模擬電路自身參數(shù)的研究卻比較少。但是模擬電路的自身參數(shù)在實際應(yīng)用中也很重要�，F(xiàn)在對模擬電路參數(shù)的分析和測量主要有硬件和軟件兩種方法。硬件測量方法基本是采用如掃頻儀等的電子設(shè)備對模擬電路進行測量。而軟件測量方法主要是采用仿真軟件或虛擬儀器對模擬電路進行測量。由于現(xiàn)有的電子儀器大都比較復雜和昂貴,應(yīng)用并不方便;而現(xiàn)有的仿真軟件首先是元件庫不完整,還有就是虛擬元件和實際元件畢竟存在著誤差,所以經(jīng)過分析后本論文提出了基于ARM的模擬電路多參數(shù)測量方法。并且完成和做出了對應(yīng)的測量系統(tǒng)。本系統(tǒng)使用STM32系列的ARM芯片作為控制部分,通過軟、硬件結(jié)合的方法,實現(xiàn)了對模擬電路多參數(shù)的測量。本文主要工作概括如下:(1)介紹了模擬電路參數(shù)測量的發(fā)展現(xiàn)狀、研究背景和研究意義。對現(xiàn)有的測量方法進行了總結(jié),并將這些方法與本系統(tǒng)的方法做了相應(yīng)的對比分析。(2)實現(xiàn)了ARM的整體設(shè)計,包括控制DDS信號源產(chǎn)生信號、對信號的采集、對數(shù)據(jù)的處理和計算、控制液晶顯示測試結(jié)果等。介紹了所用的信號源AD9854的工作原理和它與ARM之間的連接以及控制流程。(3)硬件檢測電路的設(shè)計與實現(xiàn)是本文的重點,檢測電路主要包括阻抗/電壓轉(zhuǎn)換電路、頻率特性測量電路、乘法器電路和濾波電路等部分。阻抗/電壓轉(zhuǎn)換電路和頻率特性測量電路實現(xiàn)對模擬電路信號的提取,乘法器電路實現(xiàn)對信號的加工,濾波電路實現(xiàn)對信號的處理。(4)本系統(tǒng)對模擬電路測量的參數(shù)主要包括:幅頻特性、相頻特性和阻抗特性。經(jīng)過對基于ARM的模擬電路多參數(shù)測量系統(tǒng)的測試和驗證,結(jié)果表明該系統(tǒng)測量自動化程度較高、測試結(jié)果誤差較小、抗干擾能力較強。
[Abstract]:At present, researchers mostly pay attention to the application of analog circuits in practical circuits, but the research on the parameters of analog circuits is less. However, the parameters of analog circuits are also very important in practical applications. There are two methods for analyzing and measuring analog circuit parameters: hardware and software. The hardware measurement method is to measure analog circuit with electronic devices such as frequency sweep instrument. The software measurement method mainly uses simulation software or virtual instrument to measure the analog circuit. Because most of the existing electronic instruments are complex and expensive, it is not convenient to use them. However, the existing simulation software first is the incomplete component library, and there are also errors in the virtual components and the actual components after all. After analysis, this paper puts forward a multi-parameter measurement method of analog circuit based on arm. And completed and made the corresponding measurement system. This system uses the arm chip of STM32 series as the control part, through the method of combining software and hardware, realizes the measurement of the analog circuit multi-parameter. The main work of this paper is summarized as follows: (1) the development status, research background and significance of analog circuit parameter measurement are introduced. The existing measurement methods are summarized and compared with the methods of this system. (2) the whole design of arm is realized, including the control of DDS signal source to generate signal, the acquisition of signal, the processing and calculation of data. Control liquid crystal display test results and so on. This paper introduces the working principle of the signal source AD9854, the connection between AD9854 and arm and the control flow. (3) the design and implementation of the hardware detection circuit is the focus of this paper. The detection circuit mainly includes impedance / voltage conversion circuit and frequency characteristic measuring circuit. Multiplier circuit and filter circuit. The impedance / voltage conversion circuit and the frequency characteristic measuring circuit can extract the analog circuit signal, and the multiplier circuit can process the signal. The filter circuit can process the signal. (4) the parameters of this system mainly include: amplitude frequency characteristic, phase frequency characteristic and impedance characteristic. Through the test and verification of the arm based analog circuit multi-parameter measurement system, the results show that the measurement automation degree of the system is high, the test result error is small, and the anti-interference ability is stronger.
【學位授予單位】：西北師范大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN710

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