本文選題：光信號(hào)處理 + 紅外接收　； 參考：《電子與封裝》2016年12期

【摘要】：介紹了一種光信號(hào)處理芯片的測(cè)試技術(shù),該芯片通常用于紅外接收系統(tǒng)中,對(duì)接收到的光信號(hào)進(jìn)行處理后發(fā)送到系統(tǒng)的數(shù)字芯片中。測(cè)試時(shí)需要輸入ASK調(diào)制信號(hào),文中通過(guò)單片機(jī)產(chǎn)生測(cè)試信號(hào)以取代信號(hào)發(fā)生器,有效節(jié)約了成本。該芯片內(nèi)部有放大器、帶通濾波器、比較器等部分,重點(diǎn)介紹了功能部分和帶通濾波器參數(shù)的測(cè)試,包括產(chǎn)生測(cè)試信號(hào)的方法,如何對(duì)單片機(jī)產(chǎn)生的信號(hào)進(jìn)行處理,以及帶通濾波器中心頻率的測(cè)試和修調(diào)方法。
[Abstract]:This paper introduces a testing technique of optical signal processing chip. The chip is usually used in infrared receiving system. The received optical signal is processed and sent to the digital chip of the system. It is necessary to input ask modulation signal when testing. In this paper, the test signal is generated by single chip computer to replace the signal generator, and the cost is saved effectively. There are amplifiers, bandpass filters, comparators and so on in the chip. This paper mainly introduces the function part and the testing of the band-pass filter parameters, including the method of generating the test signal, and how to process the signal generated by the single-chip computer. And the measurement and modification of the center frequency of the band-pass filter.
【作者單位】： 中國(guó)電子科技集團(tuán)公司第58研究所;
【分類(lèi)號(hào)】：TN407
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本文編號(hào)：2077806