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微片激光回饋干涉儀的穩(wěn)頻及材料熱膨脹測(cè)量應(yīng)用研究

發(fā)布時(shí)間:2018-06-23 17:39

  本文選題:微片激光器 + 穩(wěn)頻; 參考:《北京化工大學(xué)》2015年碩士論文


【摘要】:微片激光回饋干涉儀采用了移頻光回饋原理和外差式相位測(cè)量技術(shù),具有高靈敏度、納米級(jí)分辨率的優(yōu)點(diǎn),可以實(shí)現(xiàn)表面反射率低于10書的被測(cè)物體的完全非接觸式測(cè)量。因此,其在高精度測(cè)量領(lǐng)域具有廣闊的應(yīng)用前景。微片激光回饋干涉儀的穩(wěn)頻及其在材料熱膨脹測(cè)量中的應(yīng)用是本論文的研究?jī)?nèi)容。微片激光回饋干涉測(cè)量系統(tǒng)實(shí)現(xiàn)精確測(cè)量的基礎(chǔ)取決于光源輸出波長(zhǎng)的準(zhǔn)確度和穩(wěn)定程度,以及弛豫振蕩的穩(wěn)定程度。因此,本論文研制了端面泵浦溫度控制穩(wěn)頻Nd:YVO4微片激光器,其特征在于:半導(dǎo)體泵浦源和Nd:YVO4微片晶體分立溫度控制穩(wěn)頻。經(jīng)驗(yàn)證,完成指標(biāo)如:較易調(diào)節(jié)獲得單縱模、線偏振激光輸出;長(zhǎng)時(shí)間頻率穩(wěn)定度優(yōu)于1.5×10-;頻率重復(fù)性優(yōu)于5×10-7:弛豫振蕩長(zhǎng)時(shí)間穩(wěn)定。最后,通過(guò)反復(fù)的實(shí)驗(yàn)分析,指出了造成穩(wěn)頻激光器頻率不穩(wěn)定的因素,為后續(xù)微片激光器穩(wěn)頻精度的突破打下了基礎(chǔ)。高靈敏度、完全非接觸測(cè)量技術(shù)為大溫度范圍、高精度的材料線膨脹系數(shù)的測(cè)定研究提供了理論依據(jù)和關(guān)鍵技術(shù)。因此,利用微片激光回饋干涉儀高靈敏度的優(yōu)點(diǎn),本論文開(kāi)展了基于微片激光回饋干涉法的材料線膨脹系數(shù)的測(cè)量應(yīng)用研究。經(jīng)驗(yàn)證,設(shè)計(jì)的材料線膨脹系數(shù)測(cè)量系統(tǒng)實(shí)現(xiàn)了鋁、/15#鋼和碳纖維復(fù)合材料樣品的測(cè)量;測(cè)量溫度范圍為298K-748K;特別是,本文設(shè)計(jì)的補(bǔ)償光路很好的消除了高溫爐膛內(nèi)外的擾動(dòng),且對(duì)鋁和45#鋼樣品的測(cè)量結(jié)果表明:溫度范圍為298K-598K內(nèi)的精度優(yōu)于5×10-7 K-I,準(zhǔn)確度優(yōu)于0.4%。本項(xiàng)研究?jī)?nèi)容為基于微片激光回饋干涉法的材料線膨脹系數(shù)測(cè)量系統(tǒng)的儀器化提供了實(shí)驗(yàn)和理論基礎(chǔ)。
[Abstract]:Microchip laser feedback interferometer adopts the principle of frequency shift optical feedback and heterodyne phase measurement technology. It has the advantages of high sensitivity and nanometer resolution. It can realize the complete non-contact measurement of the measured object with the surface reflectivity of less than 10 books. Therefore, it has a broad application prospect in the high-precision measurement domain. The stable frequency of the instrument and its application in the measurement of material thermal expansion are the research contents of this paper. The basis of the precision and stability of the output wavelength of the light source and the stability of the relaxation oscillation are based on the output wavelength of the microchip laser feedback interferometry system. Therefore, the frequency stabilization Nd:YVO4 of the end pump temperature control is developed in this paper. The microchip laser is characterized by the stable frequency control of the discrete temperature of the semiconductor pump source and the Nd:YVO4 microchip. After verification, the completion index is more easily adjusted to obtain the single longitudinal mode, the linear polarization laser output; the long time frequency stability is better than 1.5 * 10-; the frequency repeatability is better than 5 * 10-7: the relaxation oscillation is stable for a long time. Finally, through repeated In the experimental analysis, the factors that cause the frequency instability of the frequency stabilized laser are pointed out, which lays the foundation for the breakthrough of the frequency stabilization of the microchip laser. The high sensitivity, the complete non-contact measurement technology provides the theoretical basis and key technology for the large temperature range and the high precision measurement of the material linear expansion coefficient. The advantages of optical feedback interferometer are high sensitivity. In this paper, the measurement application of material linear expansion coefficient based on microchip laser feedback interferometry is carried out. It is verified that the design of material linear expansion coefficient measurement system has realized the measurement of aluminum, /15# steel and carbon fiber composite samples; the measurement temperature range is 298K-748K; especially, this The compensation optical path designed in this paper eliminates the disturbance inside and outside the high temperature furnace very well, and the measurement results of aluminum and 45# steel samples show that the precision of the temperature range of 298K-598K is better than 5 x 10-7 K-I, and the accuracy is better than the 0.4%. research content for the instrument of the material line expansion coefficient measurement system based on the microstrip laser feedback interferometry. The experimental and theoretical basis is provided.
【學(xué)位授予單位】:北京化工大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2015
【分類號(hào)】:TN248

【共引文獻(xiàn)】

相關(guān)碩士學(xué)位論文 前2條

1 索勝玉;基于紅外測(cè)溫的油頁(yè)巖反應(yīng)爐溫度場(chǎng)數(shù)值仿真研究[D];東北林業(yè)大學(xué);2014年

2 張永芹;Nd:YAG微片激光回饋干涉儀的幾項(xiàng)關(guān)鍵技術(shù)和儀器化研究[D];南通大學(xué);2013年



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